Hostname: page-component-74656f9884-8r8nv Total loading time: 0 Render date: 2026-11-08T04:01:28.729Z Has data issue: false hasContentIssue false

Multi-pulse and multi-angle ultrafast X-ray imaging driven by petawatt-class ultrafast laser pulses

Published online by Cambridge University Press:  15 May 2026

Hong Zhang
Affiliation:
State Key Laboratory of Ultra-intense Laser Science and Technology, Shanghai Institute of Optics and Fine Mechanics (SIOM), Chinese Academy of Sciences (CAS), Shanghai, China Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, China
Hang Guo
Affiliation:
State Key Laboratory of Ultra-intense Laser Science and Technology, Shanghai Institute of Optics and Fine Mechanics (SIOM), Chinese Academy of Sciences (CAS), Shanghai, China Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, China
Hao Wang
Affiliation:
State Key Laboratory of Ultra-intense Laser Science and Technology, Shanghai Institute of Optics and Fine Mechanics (SIOM), Chinese Academy of Sciences (CAS), Shanghai, China
Jia Wang
Affiliation:
State Key Laboratory of Ultra-intense Laser Science and Technology, Shanghai Institute of Optics and Fine Mechanics (SIOM), Chinese Academy of Sciences (CAS), Shanghai, China
Gaojie Zeng
Affiliation:
State Key Laboratory of Ultra-intense Laser Science and Technology, Shanghai Institute of Optics and Fine Mechanics (SIOM), Chinese Academy of Sciences (CAS), Shanghai, China
Kangnan Jiang
Affiliation:
State Key Laboratory of Ultra-intense Laser Science and Technology, Shanghai Institute of Optics and Fine Mechanics (SIOM), Chinese Academy of Sciences (CAS), Shanghai, China
Song Li*
Affiliation:
State Key Laboratory of Ultra-intense Laser Science and Technology, Shanghai Institute of Optics and Fine Mechanics (SIOM), Chinese Academy of Sciences (CAS), Shanghai, China
Ke Feng
Affiliation:
State Key Laboratory of Ultra-intense Laser Science and Technology, Shanghai Institute of Optics and Fine Mechanics (SIOM), Chinese Academy of Sciences (CAS), Shanghai, China
Wentao Wang*
Affiliation:
State Key Laboratory of Ultra-intense Laser Science and Technology, Shanghai Institute of Optics and Fine Mechanics (SIOM), Chinese Academy of Sciences (CAS), Shanghai, China Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, China
Xinglong Xie
Affiliation:
Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, China National Laboratory on High Power Laser and Physics, Shanghai Institute of Optics and Fine Mechanics (SIOM), Chinese Academy of Sciences (CAS), Shanghai, China
Liming Chen
Affiliation:
State Key Laboratory of Dark Matter Physics, Key Laboratory for Laser Plasmas (MoE), School of Physics and Astronomy, Shanghai Jiao Tong University, Shanghai, China IFSA Collaborative Innovation Center, Shanghai Jiao Tong University, Shanghai, China
Yuchi Wu
Affiliation:
National Key Laboratory of Plasma Physics, Laser Fusion Research Center, China Academy of Engineering Physics (CAEP), Mianyang, China
Yuxin Leng
Affiliation:
State Key Laboratory of Ultra-intense Laser Science and Technology, Shanghai Institute of Optics and Fine Mechanics (SIOM), Chinese Academy of Sciences (CAS), Shanghai, China Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, China
Ruxin Li
Affiliation:
State Key Laboratory of Ultra-intense Laser Science and Technology, Shanghai Institute of Optics and Fine Mechanics (SIOM), Chinese Academy of Sciences (CAS), Shanghai, China Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, China School of Physical Science and Technology, ShanghaiTech University, Shanghai, China
*
Correspondence to: S. Li and W. Wang, State Key Laboratory of Ultra-intense Laser Science and Technology, Shanghai Institute of Optics and Fine Mechanics (SIOM), Chinese Academy of Sciences (CAS), Shanghai 201800, China. Emails: lisong@siom.ac.cn (S. Li); wwt1980@siom.ac.cn (W. Wang)
Correspondence to: S. Li and W. Wang, State Key Laboratory of Ultra-intense Laser Science and Technology, Shanghai Institute of Optics and Fine Mechanics (SIOM), Chinese Academy of Sciences (CAS), Shanghai 201800, China. Emails: lisong@siom.ac.cn (S. Li); wwt1980@siom.ac.cn (W. Wang)

Abstract

The study of matter under extreme conditions, particularly non-repeatable ultrafast processes such as those in high-energy-density physics and inertial confinement fusion, urgently demands innovations in ultrafast imaging diagnostics. To address this, we propose a novel multi-pulse, multi-angle imaging scheme that leverages a beam-splitting design applied to a single ultra-intense laser pulse to generate multiple, precisely delayed sub-pulse beams. This method not only achieves a tunable temporal resolution range from femtoseconds to picoseconds and spatial resolution in the micrometer scale, providing a powerful tool for capturing single-shot ultrafast dynamics, but also overcomes the low repetition rate limitation in petawatt-class laser facilities, enabling previously unattainable continuous dynamic imaging. Experimental validation is scheduled on the 1 PW/0.1 Hz laser system at the Shanghai Superintense Ultrafast Laser Facility. Feasibility of the source is verified by FBPIC simulations and combined with SynchRad for radiation calculations, while Geant4 simulations demonstrate imaging performance.

Information

Type
Research Article
Creative Commons
Creative Common License - CCCreative Common License - BYCreative Common License - NCCreative Common License - ND
This is an Open Access article, distributed under the terms of the Creative Commons Attribution-NonCommercial-NoDerivatives licence (https://creativecommons.org/licenses/by-nc-nd/4.0), which permits non-commercial re-use, distribution, and reproduction in any medium, provided that no alterations are made and the original article is properly cited. The written permission of Cambridge University Press or the rights holder(s) must be obtained prior to any commercial use and/or adaptation of the article.
Copyright
© Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, 2026. Published by Cambridge University Press in association with Chinese Laser Press
Figure 0

Table 1 Performance comparison of different X-ray imaging techniques.Table 1 long description.

Figure 1

Figure 1 Schematic diagram of the multi-pulse betatron radiation imaging system. (a) The incident laser beam is focused by an off-axis parabolic mirror and then split into seven independently controlled sub-beams by a hexagonal segmented mirror system. Each mirror unit is equipped with a piezoelectric actuator for precise adjustment of the time delay and angular deflection of the corresponding sub-beam. The sub-beams are respectively incident onto a gas nozzle array, and the generated electron beams are synchronously deflected by a dipole magnet. The resulting multiple radiation beams converge at the sample, and the imaging signals are then transmitted through an aperture on the lead wall and ultimately recorded by a detector. (b) Detailed view of the gas nozzle array structure. (c) Projection image of the gas nozzle array in the vertical laser propagation direction. (d) Schematic illustration of X-ray imaging with different angles and time delays.Figure 1 long description.

Figure 2

Figure 2 Simulated betatron radiation source characteristics using FBPIC[34] and SynchRad[35] codes. (a) Plasma density distribution in the r$r$–z$z$ plane. (b) Longitudinal phase-space distribution of the electron beam, with the gray shading representing the electron energy spectrum. (c) Traced electron trajectories and their energy evolution. (d) Spectral distribution of the betatron X-rays. (e) X-ray beam profile integrated over the spectrum.Figure 2 long description.

Figure 3

Figure 3 Geant4 simulation of imaging using multi-pulse betatron radiation. (a)–(c) Input capsule configurations at three distinct times, t1${t}_1$, t2${t}_2$ and t3${t}_3$. (d)–(f) Simulated betatron radiation phase-contrast images corresponding to (a)–(c). (g)–(i) The intensity profiles along the central axis for the pellet structure at the same three time frames, t1${t}_1$, t2${t}_2$ and t3${t}_3$, corresponding to (d)–(f).Figure 3 long description.

Figure 4

Figure 4 Variation of the photon number and critical energy of betatron radiation under different normalized laser intensities.Figure 4 long description.

Figure 5

Figure 5 Geant4-simulated imaging results at time t1${t}_1$ for different betatron radiation parameters. (a) Intensity distribution curves along the central axis for different critical energies with an input photon number of 2×109$2\times {10}^9$. (b) Corresponding imaging signal-to-noise ratio and contrast analysis at different boundary positions for the various critical energies shown in (a); error bars represent the mean and standard deviation of contrast. (c) Intensity distribution curves along the central axis for different photon numbers with a critical energy of 15 keV. (d) Corresponding imaging signal-to-noise ratio and contrast analysis at different boundary positions for the various photon numbers shown in (c).Figure 5 long description.