Hostname: page-component-74656f9884-c52kr Total loading time: 0 Render date: 2026-11-06T23:17:45.633Z Has data issue: false hasContentIssue false

Neutron diffraction studies of a double-crystal (+n,-m) setting containing a fully asymmetric diffraction geometry (FAD) of a bent perfect crystal (BPC)

Published online by Cambridge University Press:  11 January 2017

P. Mikula*
Affiliation:
Nuclear Physics Institute ASCR, v.v.i., 25068 Řež, Czech Republic
M. Vrána
Affiliation:
Nuclear Physics Institute ASCR, v.v.i., 25068 Řež, Czech Republic
J. Šaroun
Affiliation:
Nuclear Physics Institute ASCR, v.v.i., 25068 Řež, Czech Republic
V. Em
Affiliation:
National Research Centre “Kurchatov Institute”, Moscow 123182, Russia
*
a) Author to whom correspondence should be addressed. Electronic mail: mikula@ujf.cas.cz

Abstract

In this paper, some results of neutron diffraction properties of the double-crystal Si(111) + Si(311) setting containing two bent perfect crystals, but with the second one – analyzer in the fully asymmetric diffraction geometry are presented. Both fully asymmetric diffraction geometries, with the output beam compression as well as the output beam expansion, were tested for the sake of possible applications.

Information

Type
Technical Articles
Copyright
Copyright © International Centre for Diffraction Data 2017 
Figure 0

Figure 1. (Color online) Schematic view of the experimental performances using the FAD crystals in the OBC-diffraction geometry – (a) and OBE-diffraction geometry – (b). SC; scintillation counter; IP, imaging plate.

Figure 1

Figure 2. Detail of the incident beam passing through the BPC slab.

Figure 2

Figure 3. (Color online) The related peak reflectivities vs. crystal curvature as calculated according to the formulae (1) and (3).

Figure 3

Figure 4. (Color online) Peak intensity and FWHM of the diffraction profile dependences on the FAD crystal curvature for a fixed curvature of the Si(111) one of 0.083 m−1 and for two widths of the incident beam of 10 mm – (a) and 35 mm – (b), respectively.

Figure 4

Figure 5. Diffraction profiles from the 2 mm α-Fe pin at the scattering angle of 88° and registered by IP at the distance of 45 cm for parallel – (a) and antiparallel – (b) scattering geometry and the width of the slit of 35 mm.

Figure 5

Figure 6. Diffraction profiles from the 2 mm α-Fe pin at the scattering angle of 88o and registered by the IP at the distance of 45 cm for parallel – (a) and antiparallel – (b) scattering geometry and the width of the slit of 10 mm.

Figure 6

Figure 7. (Color online) FWHMs of the diffraction profiles from the 2 mm α-Fe(211) pin as registered by IP for different curvatures of the FAD crystal slab.

Figure 7

Figure 8. An example of the image of the diffracted beam by the FAD crystal for RFAD = 12 m.

Figure 8

Figure 9. (Color online) Imaging of the refraction effects – (b) on the sample in the form of a steel comb – (a) with 4 × 4 mm2 individual teeth.

Figure 9

Figure 10. Imaging of the refraction effects on 10 mm-thick walls of the α-Fe and Si samples.

Figure 10

Figure 11. Imaging of the refraction effects on a hypodermic needle and 2 mm-thick walls of a Ni plate.

Figure 11

Figure 12. Imaging of the refraction effects on a 2 mm-thick Ti wall and a 7 mm-thick Al walls.