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Aspect ratio effect on electroconvectionin a suspended liquid crystal film with a rectangular boundary

Published online by Cambridge University Press:  31 August 2017

Xuefei Guo
Affiliation:
Department of Physics, Fudan University, Shanghai 200433, China
Yongkang Le
Affiliation:
Department of Physics, Fudan University, Shanghai 200433, China
Bochao Cao*
Affiliation:
Department of Aeronautics and Astronautics, Fudan University, Shanghai 200433, China
*
†Email address for correspondence: cbc@fudan.edu.cn

Abstract

The aspect ratio dependence of the electroconvection phenomenon in a suspended nematic liquid crystal film with a rectangular boundary is investigated. Two-dimensional global stability analysis is carried out on the coupled electrohydrodynamic system to calculate the instability boundary of the phenomenon for different aspect ratios. The calculated critical $R$ number (Rayleigh-like number) shows a rapidly decreasing trend in the low-aspect-ratio region (roughly $\unicode[STIX]{x1D6FE}<1.5$ , where $\unicode[STIX]{x1D6FE}$ is defined as the aspect ratio of the film), and then the variation becomes slow until $\unicode[STIX]{x1D6FE}\approx 2.5$ , where the critical $R$ number starts to increase slightly. Convective patterns of liquid films with different aspect ratios are also obtained from stability analysis and validated by particle image velocimetry measurement.

Information

Type
Papers
Copyright
© 2017 Cambridge University Press 
Figure 0

Figure 1.Experimental set-up.

Figure 1

Figure 2.Comparison of the analytical solution (Daya et al.1997) and the current computations for surface charge distribution.

Figure 2

Figure 3.Boundary conditions for stability analysis.

Figure 3

Figure 4.Convective patterns obtained from the PIV experiment under different aspect ratios. The left-hand side shows the flow patterns, while the right-hand side shows the patterns of the electric potential (calculated from the measured flow field): (a) $U=1012$  V, $\unicode[STIX]{x1D6FE}=0.73$; (b) $U=818$  V, $\unicode[STIX]{x1D6FE}=1.72$; (c) $U=1014$  V, $\unicode[STIX]{x1D6FE}=2.03$; (d) $U=808$  V, $\unicode[STIX]{x1D6FE}=3.28$.

Figure 4

Figure 5.Unstable eigenmodes obtained from numerical stability analysis under different aspect ratios. The left-hand side shows the flow patterns, while the right-hand side shows the patterns of the electric potential: (a) $R=R_{c}=171.1$, $\unicode[STIX]{x1D6FE}=0.73$; (b) $R=R_{c}=119.3$, $\unicode[STIX]{x1D6FE}=1.72$; (c) $R=R_{c}=119.5$, $\unicode[STIX]{x1D6FE}=2.03$; (d) $R=R_{c}=119.3$, $\unicode[STIX]{x1D6FE}=3.28$.

Figure 5

Figure 6.Variation of the critical $R$ number with respect to the film aspect ratio.

Figure 6

Figure 7.The flow pattern variation process as the film aspect ratio increases: (a) $R=R_{c}=143.75$, $\unicode[STIX]{x1D6FE}=1.25$; (b) $R=R_{c}=121.43$, $\unicode[STIX]{x1D6FE}=1.89$; (c) $R=R_{c}=121.91$, $\unicode[STIX]{x1D6FE}=1.96$; (d) $R=R_{c}=121.67$, $\unicode[STIX]{x1D6FE}=1.99$.

Figure 7

Figure 8.Unstable eigenmodes at the first and second critical $R$ numbers with an aspect ratio of $\unicode[STIX]{x1D6FE}=1.94$: (a) $R=R_{c}=121.67$, $\unicode[STIX]{x1D706}_{R}=446.76$; (b) $R=R_{c2}=124.08$, $\unicode[STIX]{x1D706}_{R}=85.02$; (c) $R=R_{c2}=124.08$, $\unicode[STIX]{x1D706}_{R}=15.98$.

Figure 8

Figure 9.The variation of $R_{c2}/R_{c}$ with respect to the film aspect ratio.

Figure 9

Figure 10.Flow patterns obtained from stability analysis for very small aspect ratios: (a) $R=R_{c}=10385.8$, $\unicode[STIX]{x1D6FE}=0.10$; (b) $R=R_{c}=4205.8$, $\unicode[STIX]{x1D6FE}=0.15$; (c) $R=R_{c}=1224.1$, $\unicode[STIX]{x1D6FE}=0.25$.