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Tunable multiport system for measurement of two-port scattering parameters

Published online by Cambridge University Press:  17 August 2015

Kamil Staszek
Affiliation:
AGH University of Science and Technology, 30-059 Cracow, Poland. Phone: +48-12 617-30-21
Slawomir Gruszczynski*
Affiliation:
AGH University of Science and Technology, 30-059 Cracow, Poland. Phone: +48-12 617-30-21
Krzysztof Wincza
Affiliation:
AGH University of Science and Technology, 30-059 Cracow, Poland. Phone: +48-12 617-30-21
*
Corresponding author: S. Gruszczynski Email: slawomir.gruszczynski@agh.edu.pl
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Abstract

A novel multiport system, allowing for measurements of scattering parameters in over-two-octave frequency range is proposed. It is composed of two directional couplers and a standard 4 × 4 Butler matrix, and does not require any isolators. The presented system features a uniform power distribution providing the high precision of measurements, which can be further enhanced by a simple adjustment of the system's parameters. A comprehensive analysis of the proposed system configurations, a fully analytical calibration for transmission coefficient measurement, and the estimation of maximum measurement error are given. The proposed measuring system has been experimentally verified in a wide frequency range 1–5 GHz, by measurements of S-parameters of exemplary components. The measurement results are very close to the values obtained with the use of a commercial vector network analyser within the 50 dB range of measured values’ magnitude.

Information

Type
Research Papers
Copyright
Copyright © Cambridge University Press and the European Microwave Association 2015 
Figure 0

Fig. 1. Schematic diagram of the proposed multiport system with a single 4 × 4 Butler matrix allowing for reflection and transmission coefficients’ measurement.

Figure 1

Table 1. Circle centers’ distributions for reflection coefficient measurement, assuming A = 0 dB, C2 = 3 dB, n, port of Butler matrix, to which switch SW2 is connected, and k, port of Butler matrix, to which attenuator is connected.

Figure 2

Table 2. Circle centers’ distributions for transmission coefficient measurement, assuming A = 0 dB, C2 = 3 dB, n, port of Butler matrix, to which switch SW2 is connected, and k, port of Butler matrix, to which attenuator is connected.

Figure 3

Fig. 2. Signal flow in the proposed multiport system for transmission coefficient measurement: graph of the entire measuring system with all imperfect parameters (a), graph of the measuring system with neglected imperfect isolations (b), graph of the measuring system with imperfect isolations and with assumed perfect impedance match of all components (c).

Figure 4

Fig. 3. Estimated maximum relative power reading error versus magnitude of the measured transmission coefficient (black lines) for four different values of isolations I compared with the 0.1 dB uncertainty of the power meter (gray line).

Figure 5

Fig. 4. Estimated maximum error of transmission coefficient measurement introduced by the utilization of simplified formula (12) for an ideally matched two-port having zero-insertion loss (S21 = S12 = 1).

Figure 6

Fig. 5. The maximum magnitude measurement error versus magnitude of measured S-parameter for the proposed multiport system with the adjustable circle centers’ distribution. The assumed power detectors uncertainty ΔPD = 0.1 dB.

Figure 7

Fig. 6. The maximum phase measurement error versus magnitude of measured S-parameter for the proposed multiport system with the adjustable circle centers’ distribution. The assumed power detectors uncertainty ΔPD = 0.1 dB.

Figure 8

Fig. 7. Photograph of the developed measuring system in configuration for reflection coefficient measurement (a) and for transmission coefficient measurement (b).

Figure 9

Table 3. Attenuations of the attenuator and corresponding theoretical magnitude of circle centers’ distributions for reflection and transmission coefficient measurements.

Figure 10

Fig. 8. Circle centers’ distribution of the proposed measuring system for reflection coefficient measurements. The results are obtained during the calibration process in the frequency range 1–5 GHz for different theoretical magnitudes of circle centers’ distributions: 1.0 (a), 0.8 (b), 0.7 (c), and 0.5 (d).

Figure 11

Fig. 9. The circle centers’ distribution of the proposed measuring system for transmission coefficient measurements. The results are obtained during the calibration process in the frequency range 1–5 GHz for different theoretical magnitudes of circle centers’ distributions: 1.0 (a), 0.8 (b), 0.7 (c), and 0.5 (d).

Figure 12

Fig. 10. Measured reflection coefficients seen at the measuring ports and the measured isolation between the measuring ports.

Figure 13

Fig. 11. Measured reflection coefficients of shorted attenuators: magnitude (a) and phase (b). Solid lines indicate the measurement results obtained with the use of the proposed system, dashed lines present the reference values obtained with Agilent N5224A VNA. Measurement accuracy of the proposed system is marked black, whereas the accuracy of VNA is marked gray.

Figure 14

Fig. 12. Measured transmission coefficients of the attenuators: magnitude (a) and phase (b). Solid lines indicate the measurement results obtained with the use of the proposed system, dashed lines present the reference values obtained with Agilent N5224A VNA. Measurement accuracy of the proposed system is marked black, whereas the accuracy of VNA is marked gray (not seen due to small values).

Figure 15

Fig. 13. Maximum magnitude (a) and phase (b) measurement error versus the magnitude of the measured reflection coefficient for different magnitudes of circle centers’ distribution. As the reference values the measurements with N5224A VNA have been used.

Figure 16

Fig. 14. Maximum magnitude (a) and phase (b) measurement error versus the magnitude of the measured transmission coefficient for different magnitudes of circle centers’ distribution. As the reference values the measurements with N5224A VNA have been used.

Figure 17

Fig. 15. Measured S-parameters of the high-pass filter. Magnitude of reflection coefficient S11 and transmission coefficient S21 (a), phase of reflection coefficient S11 (b) and phase of transmission coefficient S21 (c). Solid lines indicate the measurement results obtained with the use of the proposed system, dashed lines present the reference values obtained with Agilent N5224A VNA.