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Silica replication of the hierarchical structure of wood with nanometer precision

Published online by Cambridge University Press:  23 May 2011

Daniel Van Opdenbosch
Affiliation:
Department for Materials Science and Engineering—Glass and Ceramics, University of Erlangen-Nuremberg, D-91058 Erlangen, Germany
Gerhard Fritz-Popovski
Affiliation:
Institute of Physics, Montanuniversitaet Leoben, A-8700 Leoben, Austria
Oskar Paris
Affiliation:
Institute of Physics, Montanuniversitaet Leoben, A-8700 Leoben, Austria
Cordt Zollfrank*
Affiliation:
Department for Materials Science and Engineering—Glass and Ceramics, University of Erlangen-Nuremberg,D-91058 Erlangen, Germany
*
a)Address all correspondence to this author. e-mail: cordt.zollfrank@ww.uni-erlangen.de

Abstract

The structural features of wood were replicated in silica on all levels of hierarchy from the macroscopic to the nanoscopic level of the cellulose elementary fibrils. This was achieved by a series of processing steps on spruce wood templates. Sodium chlorite was used to partially remove the lignin matrix from the wood cell walls, exposing the cellulose fibrils. These were optionally functionalized with maleic acid anhydride to stabilize the fibrillar structure and reduce the shrinkage of the template. Repeated infiltration with tetraethyl orthosilicate in ethanol deposited silica on the fibrils. Calcination at 500 °C removed the rest of the organic template by oxidation and resulted in the fusion of the deposited material into a positive silica replica. Small-angle x-ray scattering evidenced fibrillar structures parallel to the original cellulose fibrils at length scales in the order of 10 nm, suggesting the successful nanoscopic replication of the cellulose fibrils and their orientation.

Information

Type
Articles
Copyright
Copyright © Materials Research Society 2011
Figure 0

FIG. 1. Chart of the sample preparation and names (in brackets) of the templates obtained from different processing steps.

Figure 1

FIG. 2. Porosities of the samples from different processing steps.

Figure 2

FIG. 3. Dimensional and mass changes of the samples from different processing steps.

Figure 3

FIG. 4. Thermogravimetric analysis/differential thermal analysis profiles of delig 2inf samples.

Figure 4

FIG. 5. Scanning electron micrographs of (a) extr 2inf, (b) extr 2clc, (c) delig 2inf, (d) delig 2clc, (e) MA 2inf, and (f) MA 2clc.

Figure 5

FIG. 6. Silicon and oxygen content of a delig 2inf cell wall determined by STEM–EDX linescan of a cross section (inset) to illustrate the distribution of condensed silica over an infiltrated cell-wall cross section.

Figure 6

FIG. 7. Scattering curves (left) and cross section pair distance distribution functions (right) of (a) extr, (b) delig, and (c) MA. nat (solid), inf (dotted), clc (dashed), 2inf (dash-dotted), 2clc (dash-dot-dotted). All curves shown are from earlywood.

Figure 7

FIG. 8. Radii of gyration of the cross sections from different processing steps.

Figure 8

TABLE I. Radii of gyration of the rod-like cross sections calculated from small-angle x-ray scattering measurements (nm).

Figure 9

FIG. 9. Orientation parameters from different processing steps.