Hostname: page-component-74656f9884-npj9w Total loading time: 0 Render date: 2026-11-06T22:57:16.526Z Has data issue: false hasContentIssue false

Improved bench-top X-ray diffractometer for crystalline phase analysis of cement

Published online by Cambridge University Press:  07 November 2013

Atsushi Ohbuchi*
Affiliation:
Application Laboratories, Rigaku Corporation, 3-9-12, Matsubara-cho, Akishima-shi Tokyo, Japan
Takayuki Konya
Affiliation:
Application Laboratories, Rigaku Corporation, 3-9-12, Matsubara-cho, Akishima-shi Tokyo, Japan
Go Fujinawa
Affiliation:
Application Laboratories, Rigaku Corporation, 3-9-12, Matsubara-cho, Akishima-shi Tokyo, Japan
*
a) Author to whom correspondence should be addressed. Electronic mail: a-obuchi@rigaku.co.jp

Abstract

A laboratory-scale X-ray diffractometer for obtaining high X-ray intensity data was developed. The apparatus, equipped with 600 W CuKα radiation with a Ni filter, incorporates technology that dramatically improves the quality of X-ray diffraction. The system comprises of a low-noise one-dimensional silicon strip detector, a variable slit, and a goniometer with a radius as small as 150 mm. A variable knife edge was used as a countermeasure for unwanted scattering, particularly in the low angle range. With this system, cement may be analyzed within 5 min. NIST 2686 standard reference material was analyzed using the newly developed diffractometer, and the quantitative analysis results for the major phases are in agreement with the certified values of the reference material.

Information

Type
Technical Articles
Copyright
Copyright © International Centre for Diffraction Data 2013 
Figure 0

Figure 1. Photograph in MiniFlex600 optics system.

Figure 1

Figure 2. Comparison of the reflection intensities obtained using fixed (0.625°) and variable divergence slit. (The data of variable slit was converted to the fixed slit mode.)

Figure 2

Figure 3. Comparison of reflection intensities in Si material using a one-dimensional detector (solid line) and a scintillation counter (dotted line).

Figure 3

Figure 4. Schematic diagrams of the goniometer at (a) low and (b) high 2θ (°) angles. The distance between the sample and the variable knife edge is greater in (b) than in (a).

Figure 4

Figure 5. Observed (solid line) and calculated (dotted line) diffraction patterns and the difference curve with Rietveld refinement for the NIST 2686 reference material. Hat: Hatrurite (C3S), Bel: Belite (C2S), Bro: Brownmillerite (C4AF), Alu: Aluminate (C3A), Per: Periclase (MgO).

Figure 5

Table I. Analytical results (mass%) of major components in the NIST 2686 reference material.

Figure 6

Table II. Analytical results (mass%) of the lime in the cements.

Figure 7

Figure 6. Results for the qualitative analysis of the rapidly hardening cement.

Figure 8

Figure 7. Diffraction patterns collected during the calcification of the rapidly hardening cement.