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Single-shot two-step phase-shift spectral interferometry for direct and accurate electric-field reconstruction of an ultrafast laser

Published online by Cambridge University Press:  10 July 2026

Jiahe Lin
Affiliation:
State Key Laboratory of Radio Frequency Heterogeneous Integration (Shenzhen University), College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, China Shenzhen Key Laboratory of Micro-Nano Photonic Information Technology, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, China Institute of Microscale Optoelectronics, Shenzhen University, Shenzhen, China
Kaipeng Wu
Affiliation:
State Key Laboratory of Radio Frequency Heterogeneous Integration (Shenzhen University), College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, China Shenzhen Key Laboratory of Micro-Nano Photonic Information Technology, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, China
Congying Wang
Affiliation:
State Key Laboratory of Radio Frequency Heterogeneous Integration (Shenzhen University), College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, China Shenzhen Key Laboratory of Micro-Nano Photonic Information Technology, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, China
Hongmei Zhong
Affiliation:
State Key Laboratory of Radio Frequency Heterogeneous Integration (Shenzhen University), College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, China Shenzhen Key Laboratory of Micro-Nano Photonic Information Technology, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, China
Xuanke Zeng
Affiliation:
State Key Laboratory of Radio Frequency Heterogeneous Integration (Shenzhen University), College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, China Shenzhen Key Laboratory of Micro-Nano Photonic Information Technology, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, China
Yi Cai*
Affiliation:
State Key Laboratory of Radio Frequency Heterogeneous Integration (Shenzhen University), College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, China Shenzhen Key Laboratory of Micro-Nano Photonic Information Technology, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, China
Changjun Min
Affiliation:
State Key Laboratory of Radio Frequency Heterogeneous Integration (Shenzhen University), College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, China Shenzhen Key Laboratory of Micro-Nano Photonic Information Technology, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, China Institute of Microscale Optoelectronics, Shenzhen University, Shenzhen, China
Xiaowei Lu
Affiliation:
State Key Laboratory of Radio Frequency Heterogeneous Integration (Shenzhen University), College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, China Shenzhen Key Laboratory of Micro-Nano Photonic Information Technology, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, China
Xianglei Liu
Affiliation:
Shenzhen Key Laboratory of Micro-Nano Photonic Information Technology, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, China
Yuexia Ai
Affiliation:
Shenzhen Key Laboratory of Micro-Nano Photonic Information Technology, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, China
Bin Hui
Affiliation:
Shenzhen Key Laboratory of Micro-Nano Photonic Information Technology, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, China
Shixiang Xu*
Affiliation:
State Key Laboratory of Radio Frequency Heterogeneous Integration (Shenzhen University), College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, China Shenzhen Key Laboratory of Micro-Nano Photonic Information Technology, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, China
*
Correspondence to: Y. Cai and S. Xu, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, China. Emails: caiyi@szu.edu.cn (Y. Cai); shxxu@szu.edu.cn (S. Xu)
Correspondence to: Y. Cai and S. Xu, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, China. Emails: caiyi@szu.edu.cn (Y. Cai); shxxu@szu.edu.cn (S. Xu)

Abstract

High-quality single-shot measurement for the complete characterization of ultrafast light fields remains challenging. This paper proposes SS-TSPS-SPIDER, a single-shot scheme combining spectral phase interferometry for direct electric-field reconstruction (SPIDER) with two-step phase-shifting (TSPS). This design uses a non-polarizing beam splitter to combine two orthogonally incident sum-frequency pulses, from whose two outputs it acquires two spectral interferograms with a π-phase shift. Our experimental results demonstrate that the setup can measure the group delay dispersion of a 3-mm-thick BK7 glass with an error of less than 14.1 mrad over a 45 THz range centered at 375 THz, corresponding to a 10 dB spectral bandwidth, exhibiting superior measurement accuracy and a higher signal-to-noise ratio compared with traditional SPIDER. Thus, SS-TSPS-SPIDER is well suited for characterizing ultra-intense, low-repetition-rate or single-shot ultrashort pulses, which are vital in strong-field physics, attosecond science and other extreme-physics frontiers .

Information

Type
Research Article
Creative Commons
Creative Common License - CCCreative Common License - BY
This is an Open Access article, distributed under the terms of the Creative Commons Attribution licence (https://creativecommons.org/licenses/by/4.0), which permits unrestricted re-use, distribution and reproduction, provided the original article is properly cited.
Copyright
© The Author(s), 2026. Published by Cambridge University Press in association with Chinese Laser Press
Figure 0

Figure 1 Schematic diagram of our single-shot TSPS-SPIDER. HWP-1, HWP-2, half-wave plates; BS, 50:50 broadband beam splitter; PS, pulse stretcher; TDL-1–TDL-3, time delay lines; M, mirror; FO, focal optics; SFG, sum-frequency generator; NPCS-1, NPCS-2, non-polarization cube splitters; SIF-1, SIF-2, spectral interferograms; SPM-1, SPM-2, spectrometers.Figure 1 long description.

Figure 1

Figure 2 Measured results by SPIDERs: (a) spectral interferograms (SIF-1 and SIF-2) by SS-TSPS-SPIDER and ZAP-SPIDER, (b) their Fourier transform and (c) the measurement noise by the ZAP and SS-TSPS methods.Figure 2 long description.

Figure 2

Figure 3 Measurement results of SS-TSPS, CTP and ZAP-SPIDERs with reference to the incident spectra (blue line). (a) The retrieved spectral phases and the corresponding theoretical curve (gray line). (b) The measured phase errors.Figure 3 long description.

Figure 3

Table 1 The comparison of SS-TSPS, CTP and ZAP-SPIDER.Table 1 long description.

Figure 4

Figure 4 Measurement results for the Kerr effect of SS-TSPS-SPIDER and ZAP-SPIDER: (a) recorded interferograms and (b) Fourier transform of the recorded interferograms.Figure 4 long description.

Figure 5

Figure 5 Reconstructed electric-field for Kerr modulation by SS-TSPS and ZAP-SPIDERs. (a) Kerr spectrum and retrieved spectral phase. (b) Temporal intensity and phase.Figure 5 long description.