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Microstructure and mechanical properties of sub-micron zinc structures

Published online by Cambridge University Press:  22 May 2012

Sumin Jin
Affiliation:
Department of Chemical Engineering, Waterloo Institute for Nanotechnology, University of Waterloo, Waterloo, Ontario, N2L 3G1, Canada
Sujing Xie
Affiliation:
CAMCOR High Resolution and Analytical Facility, Department of Chemistry, University of Oregon, Eugene, Oregon, 97403-1241
Michael J. Burek*
Affiliation:
Waterloo Institute for Nanotechnology, University of Waterloo, Waterloo, Ontario, N2L 3G1, Canada
Zeinab Jahed
Affiliation:
Department of Mechanical Engineering, Waterloo Institute for Nanotechnology, University of Waterloo, Waterloo, Ontario N2L 3G1, Canada
Ting Y. Tsui*
Affiliation:
Department of Chemical Engineering, Department of Mechanical Engineering, Waterloo Institute for Nanotechnology, University of Waterloo, Waterloo, Ontario, N2L 3G1, Canada
*
b)Address all correspondence to this author. e-mail: tttsui@uwaterloo.ca

Abstract

The mechanical properties of submicron scale columnar zinc structures, with average diameters between 130 and 1060 nm, were characterized by uniaxial microcompression tests. The zinc pillars were fabricated by electron beam lithography and electroplating and were found to be generally single crystalline, with a preferred out-of-plane orientation close to the [0001] directions. Post deformation microstructural analysis suggests that the zinc pillars maintain their single-crystalline structure, but without twin boundary formation. Interestingly, the engineering flow stress results indicate that small-scale zinc structures are insensitive to both strain rate and size.

Information

Type
Articles
Copyright
Copyright © Materials Research Society 2012
Figure 0

FIG. 1. Representative SEM micrographs of as-fabricated zinc pillars with diameters of (a) 1060 nm, (b) 550 nm, (c) 230 nm, and (d) 130 nm. All SEM images are taken at a 70° stage tilt.

Figure 1

FIG. 2. Bright-field TEM images and indexed small area electron diffraction patterns of two as-fabricated 1060-nm diameter zinc pillars. Note the electron diffraction patterns were collected from the sample area within the dashed circles.

Figure 2

FIG. 3. Representative SEM micrographs of zinc pillars after deformation with diameters of (a) 1060 nm, (b) 550 nm, (c) 230 nm, and (d) 130 nm. Note the postmortem pillars shown here are the same as those as-fabricated pillars shown in Fig. 1. All SEM images are taken at a 70° stage tilt.

Figure 3

FIG. 4. Postcompression electron microscopy analysis of a 550 nm diameter zinc pillar. SEM images of the (a) compressed pillar and (b) FIB cross-section are shown. A bright-field TEM image of the deformed and cross-sectioned pillar is shown in (c). Note that for the TEM image shown in (c), additional FIB thinning during sample preparation caused the top right corner of the pillar to be slightly milled away.

Figure 4

FIG. 5. Representative engineering stress–strain curves of 1060-nm, 550-nm, 230-nm, and 130-nm diameter zinc pillars.

Figure 5

FIG. 6. Plot of 550 nm diameter zinc pillar engineering flow stresses measured at 5.0% strain as a function of specimen aspect ratio (height/diameter).

Figure 6

FIG. 7. Plot of zinc pillar engineering flow stresses measured at 5.0% strain as a function of engineering strain rate for deformed zinc pillars.

Figure 7

FIG. 8. Plot of engineering flow stresses measured at 5.0% strain as a function of zinc pillar diameter.