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Observation of Basal Dislocations in Ice by Etching and Replicating

Published online by Cambridge University Press:  30 January 2017

N. K. Sinha*
Affiliation:
Division of Building Research, National Research Council, Ottawa, Ontario KIA 0R6, Canada
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Abstract

A method is described for preparing the surface of ice and for forming etch pits on the prismatic surfaces with whisker replicas that correspond to basal dislocations. The technique removes the ambiguity sometimes associated with etch pits and dislocations, and allows direct observation of dislocation glide, pile-up against barriers, and other features in deformed ice.

Résumé

Résumé

On décrit une méthode de préparation de la surface de la glace, de formation de figures d’attaque sur les faces prismatiques et répliques en “whisker” correspondent à des dislocations basales. Cette technique qui permet de supprimer l’ambiguïté qu’il y a parfois en associant une figure d’attaque à une dislocation, conduit en outre à des observations directes du glissement des dislocations de l’empilement des dislocations sur les obstacles et d’autres phénomènes dans la glace déformée.

Zusammenfassung

Zusammenfassung

Es wird ein Verfahren beschrieben für die Präparation der Eisoberfläche und die Erzeugung von Ätzgrübchen auf den prismatischen Flächen mit Hilfe von Whiskerabdrücken, die basalen Versetzungen entsprechen. Das Verfahren beseitigt die Unklarheit, die manchmal mit Ätzgrübchen und Versetzungen verbunden ist, und erlaubt Versetzungsgleiten, Aufstau vor Hindernissen und andere Merkmale in verformtem Eis unmittelbar zu beobachten.

Information

Type
Research Article
Copyright
Copyright © International Glaciological Society 1978
Figure 0

Fig. 1.Scanning electron micrograph of a forest of basal-plane dislocations represented by the corresponding whiskers on {1120} surface.

Figure 1

Fig. 2.Broken whiskers un {1110} surface and the elongated surface-level etch features parallel to <0001>.

Figure 2

Fig. 3.Scanning electron micrograph of large evaporation and minute dislocation etch pits on {1120} surface. Elongated dislocation pits are parallel to <0001> direction.

Figure 3

Fig. 4.a (left) Stress-induced glide of basal dislocations revealed by the etch tracks on {1120} surface parallel to (0001) plane. b (right) Formation of whiskers by stationary dislocations.

Figure 4

Fig. 5.Tape-like features in previously deformed ice.

Figure 5

Fig. 6.a (left) Dislocation whiskers in parallel rows of pile-ups. b (right) Centrally depressed etch pits in a pile-up.

Figure 6

Fig. 7.Scanning electron micrograph of a cross-section of deformed S-2 ice showing a jagged grain boundary, ABC; slip bands having different dislocation densities; and the stress concentration effect of the change in the direction of the grain boundary at B which generated the deeply etched slip plane.

Figure 7

Fig. 8.a (left) Pile-up against internal barrier and kinking in a slip band. b (right) General view of etch features in a favourably oriented grain of S-2 ice.

Figure 8

Fig. 9.a (left) Veining in the distribution of basal dislocations in deformed polycrystalline ice. b (right) Optical micrograph of vein structures in both basal (e.g. lower right) and non-basal (e.g. upper right) dislocation distribution and their associations with the common grain boundary and triple point. Compressive load of 2.2 MN m2 was applied in the vertical direction of the photograph; total strain was 3 × 10-4at — 10°C. c (centre) Association of vein structure BD, in the grain at the upper left-hand corner, to the pile-up EB, in the neighbouring grain, against the common grain boundary ABC.

Figure 9

Fig. 10.a (left) Migration of grain boundary under low stresses; the striations indicate the <0001> directions, b (right) Formation of small-angle till boundaries under low stresses and their association with the deformed groin boundary.

Figure 10

Fig. 11.Etching features in deformed S-2 ice at various depths and lapse of times. a (left) 3 h after the test. b (right) 16 d after and 0.5 mm below “a”. c (centre) 133 d after and 3 mm below “a”.