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Probing local electrochemical activity within yttria-stabilized-zirconia via in situ high-temperature atomic force microscopy

Published online by Cambridge University Press:  20 October 2014

Jiaxin Zhu
Affiliation:
Department of Mechanical and Industrial Engineering, University of Massachusetts, Amherst, Engineering Lab I, Amherst, Massachusetts 01003, United States
Carlos R. Pérez
Affiliation:
Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States
Tae-Sik Oh
Affiliation:
Department of Chemical and Biomolecular Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States
Rainer Küngas
Affiliation:
Department of Chemical and Biomolecular Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States
John M. Vohs
Affiliation:
Department of Chemical and Biomolecular Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States
Dawn A. Bonnell
Affiliation:
Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States
Stephen S. Nonnenmann*
Affiliation:
Department of Mechanical and Industrial Engineering, University of Massachusetts, Amherst, Engineering Lab I, Amherst, Massachusetts 01003, United States
*
a)Address all correspondence to this author. e-mail: ssn@engin.umass.edu

Abstract

Considerable interest in understanding interfacial phenomena occurring across nanostructured solid oxide fuel cell (SOFC) membrane electrode assemblies has increased demand for in situ characterization techniques with higher resolution. We briefly outline recent advancements in atomic force microscopy (AFM) instrumentation and subsystems in realizing real time imaging at high temperatures and ambient pressures, and the use of these in situ, multi-stimuli probes in collecting local information related to physical and fundamental processes. Here we demonstrate direct probing of local surface potential gradients related to the ionic conductivity of yttria-stabilized zirconia (YSZ) within symmetric SOFCs under intermediate operating temperatures (500–600 °C) via variable temperature scanning surface potential microscopy (VT-SSPM). The conductivity values obtained at different temperatures are then used to estimate the activation energy. These locally collected conductivity and activation energy values are subsequently compared to macroscopic electrochemical impedance results and bulk literature values, thus supporting the validity of the approach.

Information

Type
Invited Paper
Copyright
Copyright © Materials Research Society 2014 
Figure 0

FIG. 1. (a) A schematic illustration of the miniature environmental chamber, shown complete with various gaseous inlet/outlets, electrical feedthroughs, thermocouple, and button heater; inset: schematic illustration of the chamber while in operation, shown with tip approaching the access port to resolve electrochemical phenomena in a cross-sectional geometry. (b) Digital photograph of the chamber, under operation, as integrated with a commercial (Asylum Research MFP-3D) AFM scan head; inset: digital photograph of the chamber with the scan head removed. (c) An illustrated overview of in situ, multi-stimuli probes to collect localized information of properties ranging from morphological (top) and physical (electric potential perturbations; middle) to fundamental parameters such as activation energy (ΔG; bottom). Figures (a) and (b) are reproduced with permission from S.S. Nonnenmann and D.A. Bonnell: Miniature environmental chamber enabling in situ SPM within reactive environments. Rev. Sci. Instrum. 84, 073707. Copyright 2013, AIP Publishing LLC (http://dx.doi.org/10.1063/1.4813317).

Figure 1

FIG. 2. A cross-sectional view scanning electron microscopy image of a fabricated LSF–YSZ symmetrical SOFC, shown here with a dense, 80 μm thick YSZ electrolyte layer sandwiched between two, 50 μm LSF–YSZ porous composite electrodes.

Figure 2

FIG. 3. (Top) A schematic illustration of symmetric SOFC operation, shown with half-reactions; (bottom) the electric potential distribution profile across the SOFC cross-section, under bias.

Figure 3

FIG. 4. (a, d, g) Topography images of dense YSZ and corresponding (b, e, h) surface potential images collected under 500, 550, 600 °C; Δ1V bias applied. (c, f, i) Black lines are surface potential profiles average over 20 lines between the red dotted lines in (b, e, h); the red lines are linear fitting results. (j–l) Topography and surface potential images as well as the surface potential profiles of the dense YSZ measured under 550 °C; Δ0V bias applied.

Figure 4

FIG. 5. (a) Current density versus sample temperature. (b) Arrhenius plot of YSZ conductivity versus temperatures. □ is the data collected by our group; ○ (Ref. 6), ☆ (Ref. 28), Δ (Ref. 29) are data from literature; activation energies Ea based on the slope of the plots are listed in the image.

Figure 5

TABLE I. Values of E, J, and σ under various temperatures.

Figure 6

FIG. 6. (a) (Top) Example Nyquist plot of a typical (red) and idealized SOFC (green). (Bottom) Equivalent circuit modeling for a SOFC. (b) Nyquist plot of a (LSF)/YSZ/LSF symmetric cell collected at 600 °C.