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Polycrystalline Yb3+–Er3+-co-doped YAG: Fabrication, TEM-EDX characterization, spectroscopic properties, and comparison with the single crystal

Published online by Cambridge University Press:  19 August 2014

Jan Hostaša*
Affiliation:
CNR ISTEC, National Research Council of Italy, Institute of Science and Technology for Ceramics, Faenza 48018, Italy; and Department of Glass and Ceramics, Institute of Chemical Technology, Prague, 166 28 Prague 6, Czech Republic
Laura Esposito
Affiliation:
CNR ISTEC, National Research Council of Italy, Institute of Science and Technology for Ceramics, Faenza 48018, Italy
Annie Malchère
Affiliation:
University of Lyon, INSA of Lyon, MATEIS UMR CNRS 5510, Villeurbanne 69621, France
Thierry Epicier
Affiliation:
University of Lyon, INSA of Lyon, MATEIS UMR CNRS 5510, Villeurbanne 69621, France
Angela Pirri
Affiliation:
CNR IFAC, National Research Council of Italy, Institute of Applied Physics “Nello Carrara”, FI 10 50019, Italy
Matteo Vannini
Affiliation:
CNR INO, National Research Council of Italy, National Institute of Optics, Sesto Fiorentino (FI) 10 50019, Italy
Guido Toci
Affiliation:
CNR INO, National Research Council of Italy, National Institute of Optics, Sesto Fiorentino (FI) 10 50019, Italy
Enrico Cavalli
Affiliation:
Dipartimento di Chimica, Università di Parma, Parma (PR) 43121, Italy
Akira Yoshikawa
Affiliation:
Advanced Crystal Engineering, IMR, Tohoku University, Sendai 980-8577, Japan
Malgorzata Guzik
Affiliation:
Faculty of Chemistry, University of Wrocław, Wrocław PL-50-383, Poland
Guillaume Alombert-Goget
Affiliation:
Institute of Light and Matter (ILM), UMR5306 CNRS-University Lyon1, University of Lyon, Villeurbanne 69622, France
Yannick Guyot
Affiliation:
Institute of Light and Matter (ILM), UMR5306 CNRS-University Lyon1, University of Lyon, Villeurbanne 69622, France
Georges Boulon
Affiliation:
Institute of Light and Matter (ILM), UMR5306 CNRS-University Lyon1, University of Lyon, Villeurbanne 69622, France
*
a)Address all correspondence to this author. e-mail: jan.hostasa@vscht.cz

Abstract

Yttrium aluminum garnet (YAG)-based ceramics represent a valuable alternative to single crystals as active media in laser devices for specific applications. In this connection, the 1.5–1.65 µm emission channel of Er3+-doped YAG is of particular importance for the realization of diode pumped solid state lasers operating in the so-called ‘eye-safe’ region. A well-known drawback of this material is related to its small absorption cross section in correspondence to the diode pumping radiation at 940–980 nm. However, its emission performance can be significantly improved through sensitization with Yb3+ ions that can efficiently absorb the excitation radiation and transfer it to the Er3+ ions. This work deals with the fabrication of polycrystalline YAG co-doped with Er3+ and Yb3+ ions from oxide powders via solid state sintering in high vacuum conditions and its microstructural analysis by transmission electron microscopy–energy-dispersive x-ray spectroscopy to determine the dopants distribution and to assess their influence on the sintering process and on the spectroscopic properties. For this purpose, the absorption and emission spectra of the prepared material have been measured and compared with those of a single crystal having the same composition, appositely prepared by the micro-pulling down method. Suitable calculations have been finally carried out to verify the effective perspectives of application of the investigated ceramics as active lasing medium.

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Articles
Copyright
Copyright © Materials Research Society 2014 
Figure 0

FIG. 1. Energy level scheme of Er3+ and Yb3+ and the mechanism of the ET process giving rise to the Er3+ emission at 1.6 μm.

Figure 1

FIG. 2. Photographs of the tested samples: ceramic (left) and single crystal brazed on the heat sink (right).

Figure 2

FIG. 3. SEM micrographs of ceramic samples: fracture surface (a) and polished surface after thermal etching (b).

Figure 3

FIG. 4. Typical intergranular secondary phase (Y–Si–O) occasionally observed at grain boundaries (a); nanoprobe EDX analysis (here with a 3 nm probe) shows that most of the GBs exhibit Si-enrichment (but no detectable Er3+ or Yb3+ variation); HRTEM images show generally ‘blurred’ contrasts at GBs, indicating the presence of some SiO2 segregation as confirmed by EDX analysis on the right (b). Er3+ distribution was detectable with high accuracy despite its very low content (0.27 ± 0.04 at.% in the present case).

Figure 4

TABLE I. EDX chemical analysis of the Yb,Er-doped YAG ceramic (at.%). The final composition (and sample thickness defining the x-ray absorption factors in the EDX treatment) is obtained with an accuracy of 0.2 at.% by minimizing a quadratic error between experimental atomic contents and calculated ones assuming a linear combination of oxide formulae (Y,Yb,Er)3Al5O12, SiO2, and Y2O3.

Figure 5

TABLE II. EDX nanoprobe (2 nm) analysis of the central region of the Y2Si2O7 crystallite from Fig. 4(a). A treatment similar to that performed in Table II leads to an excellent agreement between experimental atomic contents and calculated ones assuming a minor contribution of the YAG matrix (7.8%).

Figure 6

FIG. 5. UV-visible (a) and NIR (b) room temperature absorption spectra of the Er3+, Yb3+:YAG samples.

Figure 7

FIG. 6. Selected absorption manifolds measured at 4 K in high resolution conditions.

Figure 8

FIG. 7. NIR emission of the investigated samples, measured upon excitation at 940 nm. The spectra are normalized with respect to the Er3+ maximum emission.

Figure 9

FIG. 8. Upconversion luminescence spectra of the Er3+ ions in the green (a) and the red region (b) measured upon excitation at 940 nm.

Figure 10

FIG. 9. Luminescence decays of the (a) Er3+4I13/2 and (b) Yb3+2F5/2 metastable states at room temperature in the single-crystal (A) and the ceramic (B).

Figure 11

TABLE III. Values of the absorption (σA) and emission (σE) cross sections used for the calculation of the small signal gain.

Figure 12

FIG. 10. Calculated population inversion needed to achieve laser threshold with assumed losses of 9% (green dashed line) for emission at 1531, 1615, 1631, and 1645 nm.