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Exact sampling of determinantal point processes without eigendecomposition

Published online by Cambridge University Press:  23 November 2020

Claire Launay*
Affiliation:
Université de Paris
Bruno Galerne*
Affiliation:
Université d’Orléans
Agnès Desolneux*
Affiliation:
CNRS and ENS Paris-Saclay
*
*Postal address: Laboratoire MAP5, Université de Paris, CNRS, Paris, 75006, France. Email: claire.launay.math@gmail.com
**Postal address: Institut Denis Poisson, Université d’Orléans, Université de Tours, CNRS, Orléans, 45100, France.
***Postal address: Centre Borelli, CNRS, ENS Paris Saclay, Gif-sur-Yvette, 91190, France.
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Abstract

Determinantal point processes (DPPs) enable the modeling of repulsion: they provide diverse sets of points. The repulsion is encoded in a kernel K that can be seen, in a discrete setting, as a matrix storing the similarity between points. The main exact algorithm to sample DPPs uses the spectral decomposition of K, a computation that becomes costly when dealing with a high number of points. Here we present an alternative exact algorithm to sample in discrete spaces that avoids the eigenvalues and the eigenvectors computation. The method used here is innovative, and numerical experiments show competitive results with respect to the initial algorithm.

MSC classification

Information

Type
Research Papers
Copyright
© Applied Probability Trust 2020
Figure 0

Algorithm 1 The spectral sampling algorithm

Figure 1

Algorithm 2 Sequential sampling of a DPP with kernel K

Figure 2

Algorithm 3 Sequential thinning algorithm of a DPP with kernel K

Figure 3

Figure 1: Running times of the three studied algorithms as a function of the size of the ground set, using a patch-based kernel.

Figure 4

Figure 2: Running times in log-scale of the spectral and sequential thinning algorithms as a function of the size of the ground set $|{\mathcal{Y}}|$, using ‘classic’ DPP kernels: (a) a random kernel, (b) a Ginibre-like kernel, (c) a patch-based kernel, and (d) a projection kernel. The expectation of the number of sampled points is set to $4 \%$ of $|{\mathcal{Y}}|$.

Figure 5

Figure 3: Running times in log-scale of the spectral and sequential thinning algorithms as a function of the size of the ground set $|{\mathcal{Y}}|$, using ‘classic’ DPP kernels: (a) a random kernel, (b) a Ginibre-like kernel, (c) a patch-based kernel, and (d) a projection kernel. As $|{\mathcal{Y}}|$ grows, $\mathbb{E}(|Y|)$ is constant, equal to 20.

Figure 6

Figure 4: Running times of the spectral and sequential thinning algorithms as a function of the expected cardinality of the process, using (a) a random kernel, (b) a Ginibre-like kernel, (c) a patch-based kernel, and (d) a projection kernel. The size of the ground set is fixed to 5000 in all examples.

Figure 7

Figure 5: Behavior of the Bernoulli probabilities $q_k, \, k \in \{1,\dots, N \}$, for the kernels presented in Section 4.1, considering a ground set of $N= 5000$ elements and varying the expected cardinality of the DPP: (a) $\mathbb{E}(|Y|) = 15$, (b) $\mathbb{E}(|Y|) = 100$, (c) $\mathbb{E}(|Y|) = 1000$.

Figure 8

Table 1: Detailed running times of the sequential, spectral, and sequential thinning algorithms for varying ground sets ${\mathcal{Y}}$ with $|{\mathcal{Y}}| \in [100,5000]$ using a patch-based kernel.

Figure 9

Figure 6: Running times of the spectral and sequential thinning algorithms (Algorithms 1 and 3) as a function of $\lambda_{\text{max}}$: (a) m eigenvalues equal to $\lambda_{\text{max}}$ and $N-m$ zero eigenvalues, (b) N random eigenvalues between 0 and $\lambda_{\text{max}}$. The size of the Bernoulli process X is also displayed in light grey (right axis). Here $|{\mathcal{Y}}| = 5000$ and $\mathbb{E}(|Y|) = 15$.

Figure 10

Figure 7: Reconstruction of lighthouse image. (a) Original and reconstructions with uniformly sampled patches and below, the corresponding selected patches. (b) Reconstructions with patches sampled according to a DPP and below, the corresponding selected patches.

Figure 11

Figure 8: Reconstruction of pool image. (a) Original and reconstructions with uniformly sampled patches and below, the corresponding selected patches. (b) Reconstructions with patches sampled according to a DPP and below, the corresponding selected patches.