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Cryo-scanning transmission electron tomography of biological cells

Published online by Cambridge University Press:  07 July 2016

Michael Elbaum
Affiliation:
Department of Materials and Interfaces, Weizmann Institute of Science, Israel; michael.elbaum@weizmann.ac.il
Sharon G. Wolf
Affiliation:
Department of Chemical Research Support, Weizmann Institute of Science, Israel; sharon.wolf@weizmann.ac.il
Lothar Houben
Affiliation:
Department of Chemical Research Support, Weizmann Institute of Science, Israel; lothar.houben@weizmann.ac.il

Abstract

The electron microscope has made paramount contributions to understanding the structure of biological molecules, cells, and tissues. In general, the most faithful preservation of biological specimens and other soft-organic materials is achieved through cryogenic fixation. The embedding medium is the native aqueous environment itself, immobilized in vitrified form by rapid or pressurized cooling. Until recently, imaging of such vitrified thin specimens by electron cryo-microscopy has been nearly synonymous with wide-field transmission electron microscopy (TEM). Several new approaches have entered the cryo-microscopy field, including soft x-ray imaging, serial surface imaging using focused ion beam scanning electron microscopy, phase plates, and scanning TEM (STEM). In this article, we focus on the STEM method and its adaptation to biological cryo-microscopy. Cryogenic imaging of unstained specimens by STEM introduces specific challenges. Difficulties were long considered insurmountable, and the potential advantages were underappreciated. Future developments in experimental setup and detector technologies will allow for extension of the method to thicker specimens with improved resolution and analytic capabilities.

Information

Type
Research Article
Copyright
Copyright © Materials Research Society 2016 
Figure 0

Figure 1. Basic microscope layouts for transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM). In TEM, as in a conventional light microscope, the sample is illuminated by an approximately parallel beam, and the image is formed on a camera by the objective. An objective aperture provides contrast by blocking scattered electrons. Specimens in cryo-EM normally lack metal stains, so the objective aperture is opened, and contrast is produced by phase interference between the scattered (red) and unscattered (green) waves. Generating useful contrast requires an additional phase shift, which can be produced with a phase plate, or more commonly by defocus; see Figure 2. In STEM, the microscope optics focus the illumination to a small probe spot that is scanned across the sample. The convergent cone (with semi-angle α) defines a bright-field (BF) disk on a detector below, while electrons scattered outside this cone arrive at an annular dark-field (ADF) detector. In practice, the detectors may not lie in the same plane, so the outer cutoff angle of the BF (θBF) and the inner cutoff of the ADF (${\rm{\theta }}_{\rm{i}}^{{\rm{DF}}}$) are not necessarily adjacent. The art of STEM lies largely in selecting collection angles, which may be varied using the diffraction projector lens (not shown) adjusting the “camera length.” Note that no optical image is formed, so the collection is primarily incoherent.58 Note: ${\rm{\theta }}_{\rm{o}}^{{\rm{DF}}}$, ADF outer cutoff angle.

Figure 1

Figure 2. Transmission electron microscope (TEM) phase contrast and scanning transmission electron microscope (STEM) optical transfer as functions of the spatial frequency, g. (a) Bright-field TEM (BF-TEM) contrast transfer functions (CTFs) (blue and green) for a thin-phase object and (b) incoherent STEM optical transfer function (OTF, red and orange) for a thin-amplitude object for the same spherical aberration, Cs = 2.0 mm, at 200 kV. Fine lines in (a) show the transfer for an idealized fully coherent electron source, and bold lines include realistic source size broadening and partial spatial coherence (TEM: 0.2-mrad condenser half angle, 6-nm defocus spread; STEM: defocus ∆f = –81 nm, 0.5-nm geometric source full width at half maximum).79 In materials science, high-resolution images of thin samples are typically obtained with Scherzer transfer (blue and red) and large apertures. For TEM tomography of biological specimens, defocus values larger than ∆f = –1 μm (green) are used in order to obtain contrast at the relevant low spatial frequencies. For STEM tomography of thick biological samples, a smaller beam convergence (orange) is preferable for a better compromise between spatial resolution and depth of focus.

Figure 2

Figure 3. Scanning transmission electron microscope beam profiles. (a) The intensity distribution of the probe beam is shown for several semiconvergence angles α, for 200-kV acceleration and spherical aberration Cs = 2.0 mm. Resolution is limited primarily by the spot size at focus. For semiconvergence angles smaller than ∼10 mrad, the spot size is diffraction-limited and scales as the wavelength λ = 2.51 pm over the angle α. The depth of field scales as λ/α2, so a small compromise in resolution brings great advantage in tomography of thick specimens. Dynamic focusing compensates additionally for specimen tilt. (b–c) The complete diffraction pattern can be recorded on a charge-coupled device camera. (b) With the sample removed, the flux is confined to the bright-field disk, whose diameter reflects the angle α and the camera length. (c) With a sample in place, there is a significant flux outside the bright-field disk, which is masked for visibility. Fine white rings delimit scattering angles of 5, 10, 20, and 40 mrad in order from innermost to outermost rings.

Figure 3

Figure 4. Cryo-scanning transmission electron tomography of Gram-negative bacteria. (a) Central planar (XY) sections of 20-nm thickness through (left) dark and (center) bright-field tomographic reconstructions show membranes, chromatin, cytoplasmic condensations, and a large polyphosphate body (PPB) at the cell pole. (right) By comparison, contrast is poor in a central section similarly reconstructed from TEM data. Scale bars are 200 nm. (b) Line profiles show scaled intensities across the center and right panels (indicated by white arrows), and reveal the retention of contrast at low spatial frequencies in STEM, as well as the ringing effect of Fresnel fringes. Horizontal scale indicated in nm.32 (c) A series of dark-field images taken with increasing annular dark-field inner cutoff angles show elemental sensitivity (Z contrast, where Z represents the atomic number) at the PPB. Scale bar is 200 nm.73

Figure 4

Figure 5. Cryo-scanning transmission electron tomography of mammalian fibroblasts. (a) A series of sections through a bright-field tomographic reconstruction of a cultured fibroblast cell. Features include abundant membrane vesicles (Ves), cytoskeleton (Cyt), ribosomes (Rib, small dark spots), and extracellular matrix (ECM). The spacing between successive sections is 100 nm and the scale bar indicates 500 nm. (b) Because of the quantitative contrast formation, dense areas can be shown as bright in a volume representation, with sparse areas shown transparent. Thus with “x-ray vision,” objects of interest can be observed through the depth of sparse regions.58