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Structural dynamics probed by high-coherence electron pulses

Published online by Cambridge University Press:  10 July 2018

Armin Feist
Affiliation:
University of Göttingen, Germany; armin.feist@uni-goettingen.de
Gero Storeck
Affiliation:
Department of Physics, University of Göttingen, Germany; gero.storeck@uni-goettingen.de
Sascha Schäfer
Affiliation:
University Oldenburg, Germany; sascha.schaefer@uni-oldenburg.de
Claus Ropers
Affiliation:
University of Göttingen, Germany; claus.ropers@uni-goettingen.de

Abstract

Ultrafast measurement technology provides essential contributions to our understanding of the properties and functions of solids and nanostructures. Atomic-scale vistas with ever-growing spatial and temporal resolution are offered by methods based on short pulses of x-rays and electrons. Time-resolved electron diffraction and microscopy are among the most powerful approaches to investigate nonequilibrium structural dynamics. In this article, we discuss recent advances in ultrafast electron imaging enabled by significant improvements in the coherence of pulsed electron beams. Specifically, we review the development and first application of ultrafast low-energy electron diffraction for the study of structural dynamics at surfaces, and discuss novel opportunities for ultrafast transmission electron microscopy facilitated by laser-triggered field-emission sources. These and further developments will render coherent electron beams an essential component in future ultrafast nanoscale imaging.

Information

Type
Ultrafast Imaging of Materials Dynamics
Copyright
Copyright © Materials Research Society 2018 
Figure 0

Figure 1. Ultrafast electron microscopy and diffraction using laser-triggered field emitters. Optically induced dynamics are probed (a) in transmission by ultrafast transmission electron microscopy (electron kinetic energy: 120–200 keV) and (b) at surfaces by ultrafast low-energy electron diffraction (electron kinetic energy: 10–500 V), employing low-emittance ultrashort electron pulses. (c–d) Conceptual design of ultrafast photoemission electron sources. (c) In a planar photocathode geometry, electrons are emitted from micrometer-sized areas (governed by typical laser focal spot diameters of 10–20 µm), while (d) the laser-triggered field emitter localizes electron emission to the nanoscale apex of a sharp metal tip (typical diameter of 10–100 nm), facilitating high-coherence electron pulses. Top-left corner: Illustration of occupied transverse phase space for the respective emitter geometry.49,57 Note: Δα, transverse angular beam spread; Δx, transverse spatial beam spread.

Figure 1

Figure 2. Laser-driven electron guns for ultrafast low-energy electron diffraction (ULEED). (a) Millimeter-scale electrostatic lens assembly with a nanotip field emitter (optical microscope image). Inset: Close-up of nanotip. (b) Micrometer-scale electron gun, featuring Schottky-type extractor-suppressor unit and collimation einzel lens (scanning electron micrograph). (c) Electron gun covered by a ground shield with a hole for laser excitation. Inset: Nanotip photocathode. (d) ULEED diffraction pattern from a 1T-TaS2 surface recorded with photoelectrons (room temperature, 100 eV energy, millimeter-scale gun), showing lattice Bragg peaks (some labeled) and satellite peaks from a periodic lattice distortion. (e) Zoom-in of region denoted in (d), resolving adjacent higher-order satellite peaks. (f) Temporal resolution of electron guns measured by laser-induced change in diffraction intensity. A temporal resolution down to 1.4 ps is reached.27,57

Figure 2

Figure 3. Structural phase transition and phase-ordering kinetics probed by ultrafast low-energy electron diffraction. (a) Sketches of the periodic lattice distortion in 1T-TaS2 corresponding to the charge-density wave in the domain-like “nearly commensurate” (NCP, left) and incommensurate (ICP, right) phase. White areas in the NCP denote discommensurations with weak lattice distortion. Distortions of the underlying hexagonal lattice strongly exaggerated.58 (b) Diffraction images (left) before and (right) after pump pulse; zoom-in of difference image, indicating the appearance of rotated ICP spots. (c) Delay-dependent maps of individual diffraction spots, showing NCP-to-ICP switching and the time-dependent ICP spot narrowing. (d) Delay-dependent suppression of NCP and appearance of ICP diffraction intensity. (e) Universal scaling of the phase-ordering kinetics in the ICP for different excitation fluences, evidenced by the power-law growth of the spatial correlation length (red: micrometer-sized gun; yellow to blue: millimeter-sized gun).27 Note: INC, spot intensity NCP; IIC, spot intensity ICP; ΔI, intensity difference; Δt, delay time; $I_{{\rm{NCP}}}^{{\rm{int}}}$, integrated spot intensity NCP; $I_{{\rm{NCP}}, 0}^{{\rm{int}}}$, integrated spot intensity NCP before time zero; $I_{{\rm{ICP}}}^{{\rm{int}}}$, integrated spot intensity ICP; $I_{{\rm{ICP}}, 1{\rm{ns}}}^{{\rm{int}}}$, integrated spot intensity ICP at 1 ns; LIC, correlation length; m: exponent of power law.

Figure 3

Figure 4. Experimental setup and selected electron pulse properties of the Göttingen ultrafast transmission electron microscopy (UTEM) instrument. (a) A laser-driven Schottky field-emission electron gun is integrated with a custom modified JEOL JEM-2100F electron microscope. (b) Nanoscale photocathodes facilitate the generation of ultrafast electron pulses (c–e) down to 9-Å focal spot size, 0.6-eV energy width, and 200-fs pulse duration.49

Figure 4

Figure 5. Ultrafast nanoscale diffractive probing of strain dynamics. (a) A laser-excited single-crystalline graphite thin film is probed close to its edge with a sharply focused electron beam (28-nm focal spot size). (b) Ultrafast convergent beam electron diffraction pattern. (c) Time-dependent profiles of the (422)-Bragg line recorded in (upper panel) a continuous part of the membrane and (lower panel) close to its edge (500-nm distance), displaying an oscillatory change in the average line position and pronounced modulations in the Bragg line shape. (d) Quantitative reconstruction of local deformation gradient tensor components for two probing positions, disentangling the optically excited acoustic breathing (upper panel) and shear mode (lower panel). A shear mode component is observed close to the crystal edge (red curves) and absent in the continuous part of the membrane (black curve). The insets show the Fourier transform magnitudes of the respective transients. (e–f) Spatiotemporal maps of the two distortion tensor components reveal the complex spatiotemporal strain dynamics at the crystal edge.93 Note: d, distance from edge of membrane; Δt, delay time; I, diffraction intensity; Y, Fourier amplitude of distortion tensor component at frequency f; ω, optical angular frequency; ħ, reduced Planck’s constant.