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Effect of microwave processes on the energy-storage properties of barium strontium titanate glass ceramics

Published online by Cambridge University Press:  15 January 2014

Jinwen Wang
Affiliation:
Functional Materials Research Laboratory, Tongji University, Shanghai 200092, China
Linjiang Tang
Affiliation:
Functional Materials Research Laboratory, Tongji University, Shanghai 200092, China
Bo Shen*
Affiliation:
Functional Materials Research Laboratory, Tongji University, Shanghai 200092, China
Jiwei Zhai
Affiliation:
Functional Materials Research Laboratory, Tongji University, Shanghai 200092, China
*
a)Address all correspondence to this author. e-mail: shenbo@tongji.edu.cn

Abstract

Barium strontium titanate (BST) glass-ceramics were fabricated via controlled crystallization with different crystallization routes. Effects of the microwave crystallization and microwave treatment on the microstructure and energy storage properties of the glass-ceramics were systematically investigated. Results showed that microwave crystallization can increase the dielectric constant. In addition, it was found that the microwave process had little impact on the crystallinity (about 90 wt%), but preferred the crystallization of SrAl4O7. Most importantly, the dielectric breakdown strength (BDS) of the glass ceramics was significantly improved from 561.3 to 791.4 kV/cm by the microwave crystallization. And it can be further enhanced to 900.0 kV/cm by conventional crystallization combined with microwave treatment. The corresponding energy densities of samples derived from the microwave processes were increased to 1.05 and 1.13 J/cm3, respectively, compared with the sample fabricated by the conventional crystallization route (0.47 J/cm3).

Information

Type
Articles
Copyright
Copyright © Materials Research Society 2013 
Figure 0

FIG. 1. DSC curves of BST glass.

Figure 1

FIG. 2. XRD patterns of the samples prepared via C, C-MW, and MW routes.

Figure 2

TABLE I. Refinement results of XRD data for the samples.

Figure 3

FIG. 3. Rietveld refinement of the samples prepared via C, C-MW, and MW routes.

Figure 4

FIG. 4. FE-SEM micrographs of the samples (the samples were etched by hydrofluoric acid).

Figure 5

FIG. 5. Temperature dependence of dielectric constant and dielectric loss (tanδ) of the samples (measurement frequency was 10 kHz).

Figure 6

FIG. 6. −Z″ spectroscopic plots at various temperatures for the sample MW. Inset: the complex impedance spectra measured at various temperatures.

Figure 7

FIG. 7. Relaxation time as a function of 1000/T for different samples. Ea: the activation energy. The solid lines were linear fits through the data.

Figure 8

FIG. 8. Weibull plots of dielectric BDS (Eb) of the samples. Xi = ln(Ei), Yi = ln(−ln(1 − i/(n + 1))), Ei is the specific BDS of each specimen, n is the sum of specimens of each sample, and I is the serial number of specimen.

Figure 9

TABLE II. Comparison of relevant dielectric properties and energy densities of the samples.