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Manipulating oxygen sublattice in ultrathin cuprates: A new direction to engineer oxides

Published online by Cambridge University Press:  04 February 2015

Debakanta Samal*
Affiliation:
Inorganic Materials Science Group, MESA+ Institute for Nanotechnology, University of Twente, 7500 AE, Enschede, The Netherlands
Gertjan Koster*
Affiliation:
Inorganic Materials Science Group, MESA+ Institute for Nanotechnology, University of Twente, 7500 AE, Enschede, The Netherlands
*
a)Address all correspondence to these authors. email: deb.samal2002@gmail.com

Abstract

Atomic engineering of complex oxide thin films is now reaching a new paradigm: the possibility to control the cation coordination by oxygen anions. Here, we show two examples of stabilization of novel structural phases by manipulating the oxygen sublattices in complex Cu-based oxide thin films grown on SrTiO3: (i) epitaxial strain stabilization of a near cubic form of CuO and (ii) thickness-dependent structural transformation from bulk planar (polar) to chain-type (nonpolar) in SrCuO2 thin films that relieves the electrostatic instability. Experimental investigation on ultrathin CuO layer identifies the existence of an elongated (c/a ∼ 1.34) rocksalt-type CuO phase, pointing to metastable 6-fold coordinated Cu with the hole occupied in the 3dx2−y2 orbital. For ultrathin SrCuO2 layers, we demonstrate the possibility of moving oxygen ion from CuO2-plane to Sr-plane forming chain-type structure. X-ray absorption spectroscopy reveals preferential hole-occupation at the Cu-3d3z2−r2 orbital for chain-type structure unlike to the planar case. Our findings testify unique stabilization processes through atomic rearrangement and provide new insight into the experimental realization of novel cuprate-hybrids to look for exciting electronic properties.

Information

Type
Invited Feature Papers
Copyright
Copyright © Materials Research Society 2014 
Figure 0

FIG. 1. (a) Schematic of the octahedral in-plane rotations (ϕ) and out-of-plane tilts (θ) and (b) various modes of octahedra deformation that can occur at the heterointerface to accommodate the lattice distortion. (c) Structural model around heterointerface between the SRO thin film and GdScO3 (GSO) substrate. The termination layer of the GSO substrate is a ScO2 layer and the first layer of the SRO epitaxial thin film is a SrO layer, where ScO6 octahedra (pink squares) at the hetero-interface share oxygen atoms in the SrO layers. Blue dashed lines represent the oxygen octahedral tilt angles. Red and blue arrows represent the oxygen atomic shifts from that of the bulk SRO and GSO, respectively. The yellow box in the vicinity of the heterointerface represents the region where the tilt angle mismatch is accommodated. [Image (c) is taken from Ref. 12.]

Figure 1

FIG. 2. (a) A schematic overview of the change in unit cell symmetry from bulk monoclinic (a = 4.68373 Å, b = 3.4226 Å, c = 5.1288 Å, and β = 99.54°) to strain induced tetragonal (a = 3.91(2) Å and c = 5.25(10) Å) CuO. The green and red colored atoms represent oxygen and copper, respectively. (b) Principal superexchange interaction as a function of the Cu–O–Cu bond angle for various low-dimensional cuprates [Figure (b) is taken from Ref. 22]. (c) Néel temperatures for TMMOs. The blue dot represents the possible Néel temperature that could emerge for rocksalt type CuO assuming a linear trend.

Figure 2

FIG. 3. Schematics of the (a) planar and (b) chain-type crystal structures for tetragonal SCO. For clarity, we indicate the oxygen displacement by arrows in (a) that transforms the planar structure into chain-type [Figures (a) and (b) are taken from Ref. 48] and (c) represents stacking sequence of constituent layers with alternating net charge (ρ) for plane-type SCO layer grown on STO substrates (electric field (E) and the built in potential (φ) profiles associated with planar structure are also shown).

Figure 3

FIG. 4. (a) RHEED intensity variation during the growth of individual layers (plots are shifted vertically for clarity). Streaky 2D-like RHEED pattern observed at the end of the growth of (b) [((SCO)3/(STO)2)20] and (c) [((SCO)8/(STO)2)20] SLs, respectively.

Figure 4

FIG. 5. Evolution of the RHEED pattern [(a) → (b) → (c) → (d)] during the growth of CuO on STO that clearly shows the transition from a streaky pattern [(a) and (b)] to the onset of 3D spots [(c)] and [(d)]; (a), (b), (c), and (d) correspond to the RHEED pattern after ∼3, 4, 5, and 8 uc of CuO growth, respectively. (e) The Cu 2p core-level XPS spectrum for a CuO film indicating Cu2+ state.

Figure 5

FIG. 6. HAADF-STEM images along the [100] direction. A tetragonal structure model matching the observations is shown on the left side. [Image is taken from Ref. 20.]

Figure 6

FIG. 7. (a) ADF image showing the atomic columns of the heavy atoms along the [110] direction (Sr, Ti, and Cu). (b) The reversed ABF image acquired simultaneously with the ADF image shows the atomic columns of light elements (oxygen) together with those of heavy elements. The inset shows a reversed ABF image of a thicker CuO film on the STO substrate. It has collapsed to its ordinary monoclinic structure which is clearly different from the tetragonal structure of ultrathin CuO film. (c) Combined color map with ADF in red and reversed ABF image in green. The heavy element columns together with oxygen were combined to be yellow after color mixing while the O columns remain green. The inset is a combined color map with the ADF image in red and oxygen-enhanced ABF image in green. The Cu and O positions are illustrated with red and green disks on the left of the CuO layer. (d) Simulation of the ADF and the reversed ABF images. A tetragonal structure model along the [110] direction is shown on the left hand side. [Image is taken from Ref. 20.]

Figure 7

FIG. 8. Schematics for (a) elongated CuO6 octahedron surrounding Cu ion, (b) relevant tetragonal crystal field split energy levels with electronic occupation of d orbitals at the Cu site (dxz and dyz shown as degenerate), and (c) polarized XA spectra for a tetragonal CuO film. The inset shows the schematic for the dx2−y2 orbital where the hole at the Cu site is preferentially localized. [XAS spectra are originally from Ref. 20.]

Figure 8

FIG. 9. Average c-axis lattice parameter as a function of SCO thickness for ((SCO)m/(STO)2)20 SLs. The horizontal dashed-line marks the reported bulk c-axis lattice parameter for IL SCO. [Data taken from Ref. 48.]

Figure 9

FIG. 10. (a) Combined color map from the simultaneously acquired ADF (red) and inverted intensity ABF image (green). The yellow peaks indicate the heavy elements (Sr, Cu, and Ti) while the green peaks highlight the light elements (O). A clear structural difference is seen between the SCO3 (chain) and the SCO8 (planar) layer, which is confirmed by comparing to simulated images (insets) in the respective layers. A structural model is overlaid. (b) ABF line profile through the SrO plane (gray) and CuO plane (blue) in the (SCO)3 layer as indicated by gray and blue arrows. (c) ABF line profile through the Sr plane (gray) and CuO2 plane (blue) in the (SCO)8 layer as indicated by gray and blue arrows. The oxygen positions are marked by green dots and appear as extra peaks in the ABF signal. [Image (a) is taken from Ref. 48.]

Figure 10

FIG. 11. Polarized XA spectra for (a) ((SCO)8/(STO)2)5 and (b) ((SCO)3/(STO)2)10 SLs. The insets show schematics for the d-orbitals where the hole is preferentially localized. The left hand side shows a sketch for the XAS process for 2p → 3d transition. The right hand side schematics represent the corresponding plane and chain-type configurations for (SCO)8 and (SCO)3 layers, respectively (red and blue spheres correspond to oxygen and copper, respectively). [XAS spectra are originally from Ref. 48.]

Figure 11

FIG. 12. XPD pattern (both experiment and simulation) for 3 and 9 uc thick SCO films. θ scans are shown for (a) Cu-3p, (b) Sr-3d, and (c) O-1s. The dots are measured data points, similar colored solid lines are acquired by applying a 9-point moving average. Multiple scattering electron diffraction simulation results are shown in green. The right-hand image schematically indicates the XPD measurement geometry, where θ is a polar angle and Φ is an azimuthal angle. [Image is taken from Ref. 59.]