Hostname: page-component-74656f9884-c52kr Total loading time: 0 Render date: 2026-11-09T03:30:39.397Z Has data issue: false hasContentIssue false

Automated self-assembly and electrical characterization of nanostructured films

Published online by Cambridge University Press:  02 April 2018

Rafael C. Hensel
Affiliation:
Department of Applied Physics, “Gleb Wataghin” Institute of Physics, University of Campinas––UNICAMP, 13083-970, Campinas, SP, Brazil
Kevin L. Rodrigues
Affiliation:
Department of Applied Physics, “Gleb Wataghin” Institute of Physics, University of Campinas––UNICAMP, 13083-970, Campinas, SP, Brazil
Vinicius do L. Pimentel
Affiliation:
Information Technology Center Renato Archer, 13069-901, Campinas, SP, Brazil
Antonio Riul Jr.
Affiliation:
Department of Applied Physics, “Gleb Wataghin” Institute of Physics, University of Campinas––UNICAMP, 13083-970, Campinas, SP, Brazil
Varlei Rodrigues*
Affiliation:
Department of Applied Physics, “Gleb Wataghin” Institute of Physics, University of Campinas––UNICAMP, 13083-970, Campinas, SP, Brazil
*
Address all correspondence to Varlei Rodrigues at varlei@ifi.unicamp.br

Abstract

Significant progress in nanoscience was achieved through the development of methods and instruments to better comprehend nanoscale properties. We present here a methodology and automated setup to measure layer-by-layer films capacitance in the air immediately after polyelectrolytes adsorption. It presents high accuracy (~0.01 pF) to check the capacitance stabilization during spontaneous drying process in the air, with sensitivity to show electrical signal alternation accordingly to the outermost polyelectrolyte layer. Besides, a linear trend in capacitance was observed similar to UV–vis measurements. This method allows analyzing films electrical properties, affording better choice of materials, thickness, and molecular architecture.

Information

Type
Research Letters
Copyright
Copyright © Materials Research Society 2018 
Figure 0

Figure 1. Automated dipping LbL films growth system: (a) side view scheme for immersion and emersion movement; (b) top view scheme for polyelectrolytes switch; (c) home-made built setup.

Figure 1

Figure 2. (a) Capacitance meter's circuit composed by two IV converters on the left and a comparator circuit on the right. The variable capacitor CV compensates a parasitic capacitance in CP, minimizing the output voltage Vout. Associating the device of interest Ci in parallel to CP, its capacitance can be obtained measuring the output voltage amplitude A and phase shift between Vin and Vout; (b) experimental capacitance measured using the capacitance meter on commercial capacitors to verify the circuit performance.

Figure 2

Figure 3. Capacitance variation as a function of time to illustrate the method developed to evaluate the capacitance stabilization and increase the measurements accuracy.

Figure 3

Figure 4. (a) Comparison between capacitance and absorbance as a function of the number of bilayers deposited on IDE (left side) and quartz (right side): linear increase with the number of adsorbed bilayers for both techniques; (b) capacitance measurement with the number of layers deposited on IDE: linear increase with the number of bilayers with a zig-zag-like behavior due to charge overcompensation of the outermost layer; inset: zoom-in to show the zig-zag-like behavior.