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Materials assurance through orthogonal materials measurements: X-ray fluorescence aspects

Published online by Cambridge University Press:  20 June 2017

Mark A. Rodriguez*
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185-1411
Mark H. Van Benthem
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185-1411
Donald F. Susan
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185-1411
James J. M. Griego
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185-1411
Pin Yang
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185-1411
Curtis D. Mowry
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185-1411
David G. Enos
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185-1411
*
a) Author to whom correspondence should be addressed. Electronic mail: marodri@sandia.gov

Abstract

X-ray fluorescence (XRF) has been employed as one of several orthogonal means of screening materials to prevent counterfeit and adulterated products from entering the product stream. We document the use of principal component analysis (PCA) of XRF data on compositionally similar and dissimilar stainless steels for the purpose of testing the feasibility of employing XRF spectra to parse and bin these alloys as the same or significantly different alloy materials. The results indicate that XRF spectra can separate and assign alloys via PCA, but that important corrections for detector drift and scaling must be performed in order to achieve valid results.

Information

Type
Technical Articles
Copyright
Copyright © International Centre for Diffraction Data 2017 
Figure 0

Figure 1. Appearance of different form factors for small (S) ¼″ diameter rod, medium (M) ½″ diameter rod, and large (L) 1.25″ diameter puck.

Figure 1

Table I. Alloys used in XRF analysis (balance of composition is Fe).

Figure 2

Figure 2. Quantitative Fe content (wt.%) derived from Sample A over the course of time with differing form factors. See text for details.

Figure 3

Figure 3. XRF spectra from Sample A (Sets 1–7) showing peak shift along the energy axis. All spectra have been normalized to have identical Fe Kα intensity.

Figure 4

Figure 4. XRF spectra for Sample A (Sets 1–7) after correction for detector drift. All spectra are now superimposed and located in the proper location for their respective emission lines.

Figure 5

Figure 5. Eigenvalues derived from PCA of Sample A data.

Figure 6

Figure 6. Varimax rotation results for Factor 1 depicting the Fe spectrum (bottom plot) and this Factor's relative abundance (top plot).

Figure 7

Figure 7. Varimax rotation results for Factor 3 showing a diffraction artifact peak at 6.81 keV (bottom plot) and this Factor's relative abundance (top plot).

Figure 8

Figure 8. Varimax rotation results for Factor 6 showing the Si Kα emission line (bottom plot) and Si relative abundance (top plot).

Figure 9

Figure 9. Factor 1 for PCA analysis on the full set of XRF spectra (samples A–R) without scaling and energy axis corrections applied (without correction – w/oC) and without application of varimax rotation.

Figure 10

Figure 10. Factor 1 for PCA analysis on the full set of XRF spectra (samples A–R) with both scaling and energy axis corrections applied (with correction – wC), and without application of varimax rotation.