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Anisotropic valence band dispersion of single crystal pentacene as measured by angle-resolved ultraviolet photoelectron spectroscopy

Published online by Cambridge University Press:  07 September 2018

Yasuo Nakayama*
Affiliation:
Department of Pure and Applied Chemistry, Tokyo University of Science, Noda 278-8510, Japan
Masataka Hikasa
Affiliation:
Department of Pure and Applied Chemistry, Tokyo University of Science, Noda 278-8510, Japan
Naoki Moriya
Affiliation:
Department of Pure and Applied Chemistry, Tokyo University of Science, Noda 278-8510, Japan
Matthias Meissner
Affiliation:
Institute for Molecular Science (IMS), National Institutes of Natural Sciences, and SOKENDAI, Okazaki 444-8585, Japan
Takuma Yamaguchi
Affiliation:
Institute for Molecular Science (IMS), National Institutes of Natural Sciences, and SOKENDAI, Okazaki 444-8585, Japan
Koki Yoshida
Affiliation:
Department of Pure and Applied Chemistry, Tokyo University of Science, Noda 278-8510, Japan
Mimi Murata
Affiliation:
Department of Pure and Applied Chemistry, Tokyo University of Science, Noda 278-8510, Japan
Kazuhiko Mase
Affiliation:
Institute for Materials Structure Science, High Energy Accelerator Research Organization (KEK), and SOKENDAI, Tsukuba 305-0801, Japan
Takahiro Ueba
Affiliation:
Institute for Molecular Science (IMS), National Institutes of Natural Sciences, and SOKENDAI, Okazaki 444-8585, Japan
Satoshi Kera
Affiliation:
Institute for Molecular Science (IMS), National Institutes of Natural Sciences, and SOKENDAI, Okazaki 444-8585, Japan
*
a)Address all correspondence to this author. e-mail: nkym@rs.tus.ac.jp

Abstract

Electronic structures of single crystal pentacene are of great interest for the elucidation of charge carrier transport in organic semiconductor materials. Experimental observation of valence band dispersion was recently achieved on single crystal samples of pentacene; however, its intrinsic properties are still unresolved because past experiments were performed on specimens with surface oxides formed by exposure to the ambient atmosphere. In this work, X-ray photoelectron spectroscopy (XPS) and angle-resolved ultraviolet photoelectron spectroscopy (ARUPS) were conducted on single-crystal pentacene samples prepared without ambient exposure. The XPS results confirmed the reduction of the abundance of oxide impurities on the present samples. The ARUPS measurements clearly resolved the valence band structures of the single-crystal pentacene in four symmetry directions of the surface Brillouin zone, indicating anisotropy of at least a factor of 2.4 for the intermolecular transfer integral and hole effective mass at the valence band maximum.

Information

Type
Invited Paper
Copyright
Copyright © Materials Research Society 2018 
Figure 0

FIG. 1. (a) Molecular structure of pentacene. (b) Molecular arrangement of the Pn-SC(001) surface. The surface unit cell is also shown. (c) SBZ of Pn-SC(001) surface. (d) MCP-LEED pattern of Pn-SC(001) surface (electron energy of 55 eV). Azimuthal orientations for ARUPS measurements toward four symmetry points of Pn-SC SBZ are also indicated.

Figure 1

FIG. 2. (a) and (b) O1s and C1s XPS spectra, respectively, of Pn-SC before and after exposure to air. Magnified spectra of O1s XPS are represented in the inset of (a). (c) Relative abundance of oxygen with respect to carbon plotted as a function of photoelectron probing depth of O1s at each photon energy. The orientation of marks (squares and diamonds) represents individual Pn-SC samples, and open and filled symbols indicate the results for each sample before and after exposure to air, respectively. A hexagonal mark shows the previous result.15

Figure 2

FIG. 3. (a) Normal emission UPS spectra of the Pn-SC sample before and after exposure to air. For the unexposed sample, the least-square fit curves attributed to two valence bands of Pn-SC and scattered photoelectrons are displayed as dotted and dashed lines, respectively, where an assumed background is shown as the white dashed-dotted curve. Peak positions are indicated as downward wedge marks and a cross mark. (b) UPS spectra in the secondary electron cut-off region indicating the work functions of samples. The vertical scale of (b) is normalized by the maximum height of each curve.

Figure 3

FIG. 4. ARUPS spectra of Pn-SC in (a) Γ–X, (b) Γ–Y, (c) Γ–M, and (d) Γ–M′ directions. Each spectrum is vertically offset by the photoelectron emission angle. The bottom axes are in the BE scale with respect to EF, while the measured photoelectron kinetic energies are also displayed as top axes. Dashed arrows indicate the energy positions of two valence band components at the Γ point.

Figure 4

FIG. 5. (a) Γ–M and (b) Γ–M′ ARUPS spectral images mapped on the E–K‖ plane. The band calculation results,7 the energy scales of which are extended by 16.3% with respect to those of the experimental spectra (left axis), are also plotted as circle marks on the images.

Figure 5

FIG. 6. BE positions of the spectral components of ARUPS spectra taken in the (a) Γ–M and (b) Γ–M′ directions plotted as a function of the electron wave number parallel to the surface. The components attributed to the two valence bands (H band and L band) are indicated as triangle marks (leftward and rightward, respectively), while those ascribed to some secondary factors (see text) are shown as ×, +, and * symbols. The size of each marks represents the intensity of the component.

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