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Characterization of a short-pulse high-power diode operated with anode effects

Published online by Cambridge University Press:  07 January 2016

Dan Cai*
Affiliation:
College of Optoelectric Science and Engineering, National University of Defense Technology, Hunan 410073, China
Lie Liu
Affiliation:
College of Optoelectric Science and Engineering, National University of Defense Technology, Hunan 410073, China
Jinchuan Ju
Affiliation:
College of Optoelectric Science and Engineering, National University of Defense Technology, Hunan 410073, China
Xuelong Zhao
Affiliation:
College of Optoelectric Science and Engineering, National University of Defense Technology, Hunan 410073, China
Hongyu Zhou
Affiliation:
College of Optoelectric Science and Engineering, National University of Defense Technology, Hunan 410073, China
Xiao Wang
Affiliation:
The PLA Unit 78010, Chengdu 610000, China
*
Address correspondence and reprint requests to: Dan Cai, College of Optoelectric Science and Engineering, National University of Defense Technology, Hunan 410073, China. E-mail: 263277440@163.com

Abstract

Usually, the high-power microwave (HPM) devices suffer from impedance collapse and cathode material degradation or even failure. When the intense electron beam bombards the anode (or named as collector in HPM device), an anode plasma could appear under certain conditions. In this case, the impedance collapse is caused by the expansions of the cathode and anode plasmas and diode current overshot caused by the bipolar flow. In this paper, characterization of a short-pulse high-power diode operated with anode effects with a dielectric fiber (velvet) cathode is discussed. The bipolar flow (or anode plasma) is indeed evident at beam power densities ~11 MW/cm2 and the pulse durations of ~50 ns. The analysis results of the deposit dose and thermal regime of the anode show that the electron stimulated desorption played an important role in the generation of anode plasma in this case. With the effect of anode plasma, the appearance of local cathode plasma flares (or nonuniform electron emission) is particularly detrimental for the diode closure. Micro-structure and elemental surface compositions of cathode are changed by the anode splashing, which is very harmful to the performance of cathode.

Information

Type
Research Article
Copyright
Copyright © Cambridge University Press 2016 
Figure 0

Fig. 1. Schematic diagram of experimental setup.

Figure 1

Fig. 2. (a) Fresh polymer velvet cathode, (b) SEM image of polymer velvet before the interaction with pulsed electron beam, and (c) XEDS of fresh polymer velvet.

Figure 2

Fig. 3. Typical waveforms with different accelerating voltage (a) 211 kV, (b) 301 kV.

Figure 3

Fig. 4. Typical side images of the light emission from the diode with anode plasma.

Figure 4

Fig. 5. Typical phase-space picture of electrons by using particle in cell (PIC) code KARAT.

Figure 5

Fig. 6. Beam power and energy deposition density.

Figure 6

Fig. 7. The relationship between ratio Pr/Pz and radial position on the surface of anode plate R.

Figure 7

Fig. 8. Number of deposit electrons versus the deposition depth with the electron energy 301 keV and SS anode.

Figure 8

Fig. 9. Deposit energy versus the deposition depth with the electron energy 301 keV and SS anode.

Figure 9

Fig. 10. The maximum Tmax versus time.

Figure 10

Fig. 11. The distribution of temperature along the z axial at the onset of the anode plasma.

Figure 11

Fig. 12. The power of electron beam deposited on the SS plate with different diode voltage.

Figure 12

Fig. 13. The power of electron beam deposited on the SS plate with different A–K gap.

Figure 13

Fig. 14. Typical side images of the light emission from the diode. Numbered black rectangles on the current waveform indicate positions of frames with corresponding numbers.

Figure 14

Fig. 15. (a) The bias-side view of anode plasma, (b) the brass anode after 20 pulses, and (c) the velvet cathode after 20 pulses.

Figure 15

Fig. 16. SEM image of polymer velvet after the interaction with pulsed electron beam (a, b), and XEDS of damage polymer velvet (c, d).

Figure 16

Table 1. The composition analysis of velvet surface with irradiation of pulsed electron beam

Figure 17

Fig. 17. SEM image of brass anode before (a) and after the interaction with pulsed electron beam (b).

Figure 18

Table 2. The composition analysis of brass anode before and after irradiation of pulsed electron beam.