Hostname: page-component-74656f9884-c52kr Total loading time: 0 Render date: 2026-11-09T03:31:09.589Z Has data issue: false hasContentIssue false

First-principles study of metal-induced gap states in metal/oxide interfaces and their relation with the complex band structure

Published online by Cambridge University Press:  08 November 2013

Pablo Aguado-Puente
Affiliation:
Departamento de Ciencias de la Tierra y Física de la Materia Condensada, Universidad de Cantabria, Cantabria Campus Internacional, Avenida de los Castros s/n, 39005 Santander, Spain
Javier Junquera*
Affiliation:
Departamento de Ciencias de la Tierra y Física de la Materia Condensada, Universidad de Cantabria, Cantabria Campus Internacional, Avenida de los Castros s/n, 39005 Santander, Spain
*
Address all correspondence to Javier Junquera atjavier.junquera@unican.es

Abstract

We develop a simple model to compute the energy-dependent decay factors of metal-induced gap states in metal/insulator interfaces considering the collective behavior of all the bulk complex bands in the gap of the insulator. The agreement between the penetration length obtained from the model (considering only bulk properties) and full first-principles simulations of the interface (including explicitly the interfaces) is good. The influence of the electrodes and the polarization of the insulator are analyzed. The method simplifies the process of screening materials to be used in Schootky barriers or in the design of giant tunneling electroresistance and magnetoresistance devices.

Information

Type
Research Letters
Copyright
Copyright © Materials Research Society 2013 
Figure 0

Figure 1. CBS of centrosymmetric PbTiO3 at (a) ${\bi k}_{//}=\bar{\it\Gamma} $and (b) ${\bi k}_{//}=\bar{X}$. Black lines at central panels correspond to bands with a real value of k⊥. At left and right panels, complex bands with the form k⊥ = iq and k⊥ = π/c + iq, respectively, are plotted as black lines. In red we plot complex bands with kz ≠ 0 or π/c, with the projections on the real plane plotted on the central panel and their projections on the imaginary plane on the side panels (following Ref. 22). Horizontal dashed lines delimit the band gap. In (c), we plot together the imaginary part of bands with complex values of k, with ${\bi k}_{//}=\bar{\it\Gamma} $ or $\bar{X}$. (d) DOS (in arbitrary units) with respect to the energy and the imaginary wave vector q. The density of complex bands is plotted in a red scale, where darker regions represent a larger density of bands. The black solid line represents the effective penetration length.

Figure 1

Figure 2. (a) Schematic representation of the interface region of the simulated (SrRuO3)9.5/(PbTiO3)8.5 superlattice in an unpolarized configuration (Ti atoms in green, Ru in magenta, O in blue, Sr in yellow, and Pb in gray). Only one of the two symmetric interfaces is shown. (b) Layer-by-layer PDOS on the atoms at the different layers, as denoted by the layer labeling. The plot at the top corresponds to the central atomic plane of the PbTiO3 film. Dashed lines delimit one of the energy windows used to perform the integrations in Eq. (2).

Figure 2

Figure 3. (a) Decay of the MIGS for the energy window inside the gap of the SrRuO3/PbTiO3 capacitor shown in Figure 2. (a). The solid curve is a fit to a hyperbolic cosine, from which the effective penetration δ(E) is obtained. (b) Effective imaginary wave vector qeff(E) obtained from the CBS [using only bands at $\bar{\it\Gamma} $ (blue dotted line), $\bar{\it\Gamma} $ and $\bar{X}$ (green dotted), and the full 2DBZ (red line)] and from the fit of the decay of the PDOS inside the insulating material for SrRuO3/PbTiO3 (solid black line) and Pt/PbTiO3 capacitors (dashed black line). (c) Total DOS of MIGS in the SrRuO3/PbTiO3 (solid black line) and Pt/PbTiO3 capacitors (dashed black line) obtained integrating the layer-by-layer PDOS from the interface to the center of the PbTiO3 film. In (b) and (c), the zero of energies is set to the top of the valence band and the horizontal lines indicate the Fermi level of the corresponding capacitor.

Supplementary material: PDF

Aguado-Puente Supplementary Materials

Supplementary Materials

Download Aguado-Puente Supplementary Materials(PDF)
PDF 8.4 MB