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Revealing deformation mechanisms in Mg–Y alloy by in situ deformation of nano-pillars with mediated lateral stiffness

Published online by Cambridge University Press:  15 May 2019

Dalong Zhang
Affiliation:
Department of Chemical Engineering and Materials Science, University of California-Irvine, Irvine, California 92697-2575, USA
Lin Jiang
Affiliation:
Department of Chemical Engineering and Materials Science, University of California-Irvine, Irvine, California 92697-2575, USA
Xin Wang
Affiliation:
Department of Chemical Engineering and Materials Science, University of California-Irvine, Irvine, California 92697-2575, USA
Irene J. Beyerlein
Affiliation:
Mechanical Engineering Department, Materials Department, University of California-Santa Barbara, Santa Barbara, California 93106, USA
Andrew M. Minor
Affiliation:
Department of Materials Science and Engineering, University of California-Berkeley, and National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA
Julie M. Schoenung
Affiliation:
Department of Chemical Engineering and Materials Science, University of California-Irvine, Irvine, California 92697-2575, USA
Subhash Mahajan
Affiliation:
Department of Chemical Engineering and Materials Science, University of California-Davis, Davis, California 95616, USA
Enrique J. Lavernia*
Affiliation:
Department of Chemical Engineering and Materials Science, University of California-Irvine, Irvine, California 92697-2575, USA
*
a)Address all correspondence to this author. e-mail: lavernia@uci.edu

Abstract

In our previous study, we observed a lack of $\left\{ {10\bar{1}2} \right\}$ twinning in a deformed Mg–Y alloy, which contributed to the observed yield “symmetry.” However, the effects of texture and grain size on polycrystalline deformation made it difficult to fully understand why twinning was not active. Therefore, we report herein in-depth study by in situ transmission electron microscopy, i.e., in situ TEM. The in situ deformation of nano-sized Mg–Y pillars revealed that prismatic slip was favored over twinning, namely, the critical stress required to activate prismatic slip was lower than that for twinning. This finding diametrically differs from that reported in other nano/micro-pillar deformation studies, where twinning is always the dominant deformation mechanism. By measuring the critical stresses for basal, prismatic, and pyramidal slip systems, this in situ TEM study also sheds light on the effects of the alloying element Y on reducing the intrinsic plastic anisotropy in the Mg matrix.

Figure 0

Figure 1: (a)–(l) In situ deformation process of Pillar X1. (m) Corresponding engineering stress–strain curve for Pillar X1.

Figure 1

Figure 2: Schematic illustration of the “pillar-on-pillar” design. (a) The dark blue nano-pillar sits on the light blue micro-pillar, with the black indenter on top and the base bulk material at the bottom (also dark). The small and large yellow dashed boxes mark the initial positions of the nano- and micro-pillars, respectively, whereas the red dashed line represents the loading axis. (b) As indentation progresses and shear event occurs (see the red arrow beside the nano-pillar), the top of the nano-pillar remains attached to the indenter due to LS. Meanwhile, the bottom of the nano-pillar is able to move to the right due to the slightly elastic “wiggling” of the micro-pillar (see the red arrow beside the micro-pillar), thus compensating the lateral movement necessitated by the shear. (c) After the shear event and the unloading of the indenter, the micro-pillar elastically wiggles back to its initial position (i.e., large yellow dashed box), enabling the bottom part of the nano-pillar to also return to its initial position (i.e., small yellow dashed box), whereas the top part has been sheared to the left (see the red arrow).

Figure 2

TABLE I: Summary for X-type pillars.

Figure 3

Figure 3: (a)–(f) In situ deformation process of Pillar Y1. (g) Corresponding engineering stress–strain curve for Pillar Y1.

Figure 4

TABLE II: Summary for Y-type pillars.

Figure 5

Figure 4: (a)–(i) In situ deformation process of Pillar Z. (j) Corresponding engineering stress–strain curve for Pillar Z.

Figure 6

TABLE III: Summary for pillar Z.

Figure 7

Figure 5: (a) Schematic illustration for preparation of cross-section. (b) macroscopic SEM view of ion polished cross-section. (c) Enlarged SEM view of a selected area with deposited W as markers. (d) EBSD map corresponds to (c), showing examples of target grains in white boxes. (e) Examples of W markers/protection layers deposited on target grains.

Figure 8

Figure 6: SEM (a) and TEM (b) views of a typical pillar.

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