Hostname: page-component-74656f9884-npj9w Total loading time: 0 Render date: 2026-11-08T14:20:58.471Z Has data issue: false hasContentIssue false

Effect of electric-current pulses on grain-structure evolution in cryogenically rolled copper

Published online by Cambridge University Press:  03 November 2014

Tatyana Konkova
Affiliation:
Institute for Metals Superplasticity Problems, Russian Academy of Science, Ufa 450001, Russia
Irshat Valeev
Affiliation:
Institute for Metals Superplasticity Problems, Russian Academy of Science, Ufa 450001, Russia
Sergey Mironov*
Affiliation:
Institute for Metals Superplasticity Problems, Russian Academy of Science, Ufa 450001, Russia; and Department of Materials Processing, Graduate School of Engineering, Tohoku University, Sendai 980-8579, Japan
Alexander Korznikov
Affiliation:
Institute for Metals Superplasticity Problems, Russian Academy of Science, Ufa 450001, Russia; and National Research Tomsk State University, Tomsk 634050, Russia
Michail Myshlyaev
Affiliation:
Baikov Institute of Metallurgy and Material Science, Russian Academy of Science, Moscow 119991, Russia; and Institute of Solid State Physics, Russian Academy of Sciences, Chernogolovka, Moscow oblast 142432, Russia
S. Lee Semiatin
Affiliation:
Air Force Research Laboratory, Materials and Manufacturing Directorate, AFRL/RXCM, Wright-Patterson AFB, Ohio 45433-7817, USA
*
a) Address all correspondence to this author. e-mail: smironov@material.tohoku.ac.jp

Abstract

The effect of electric-current pulses on the evolution of microstructure and texture in cryogenically rolled copper was determined. The pulsed material was found to be completely recrystallized, and the recrystallization mechanism was deduced to be similar to that operating during conventional static annealing. The microstructural changes were explained simply in terms of Joule heating. A significant portion of the recrystallization process was concluded to have occurred after pulsing; i.e., during cooling to ambient temperature. The grain structure and microhardness were shown to vary noticeably in the heat-affected zone (HAZ); these observations mirrored variations of temper colors. Accordingly, the revealed microstructure heterogeneity was attributed to the inhomogeneous temperature distribution developed during pulsing. In the central part of the HAZ, the mean grain size increased with current density and this effect was associated with the temperature rise per se. This grain size was slightly smaller than that in statically recrystallized specimens.

Information

Type
Articles
Copyright
Copyright © Materials Research Society 2014 
Figure 0

FIG. 1. (a) EBSD grain-boundary map and (b) orientation distribution function illustrating the microstructure and texture, respectively, of the cryorolled material. In (a), red, black, and gray lines depict LABs, HABs, and Σ3 twin boundaries (within a 5° tolerance), respectively. For comparison purposes, several ideal rolling orientations are superimposed on the ODF in (b).

Figure 1

FIG. 2. Typical low-magnification images of specimens pulsed at (a) relatively high integral current (Kj ≥ 0.44 × 105 A2 s mm−4) and (b) relatively low integral current (Kj ≤ 0.34 × 105 A2 s mm−4). In (b), the arrows indicate the HAZ. For clarity, the location of the ECP electrodes during pulsing is superimposed on the specimens. Note: The pulsed specimens were chemically etched to reveal the microstructure.

Figure 2

FIG. 3. Microhardness maps for specimens pulsed at (a) relatively high integral current (Kj = 0.77 × 105 A2 s mm−4) and (b) relatively low integral current (Kj = 0.25 × 105 A2 s mm−4). In (b), arrows indicate the HAZ. For clarity, the location of the ECP electrodes during pulsing is superimposed on the specimens.

Figure 3

FIG. 4. (a) EBSD grain-boundary map and (b) orientation distribution function illustrating the microstructure and texture in the dead zone, respectively. In (a), red, black, and gray lines depict LABs, HABs, and Σ3 twin boundaries (within a 5° tolerance), respectively. For comparison purposes, several ideal rolling orientations are superimposed on the ODF in (b). Arrows in (b) show (50; 30; 0) orientation.

Figure 4

FIG. 5. Selected portions of EBSD grain-boundary maps showing the typical microstructure in (a) the central part of the HAZ of the pulsed material and (b) the material statically recrystallized at 300 °C for 1 h.6 In the maps, red, black, and gray lines depict LABs, HABs, and Σ3 twin boundaries (within a 5° tolerance), respectively. Note: The rolling plane is shown in both cases.

Figure 5

FIG. 6. (a) Effect of integral current on the mean grain size and (b) the fraction of LABs and Σ3 twin boundaries in the central part of the HAZ of the pulsed material. In all cases, data at Kj = 0 represent the original cryorolled material.

Figure 6

FIG. 7. Selected portions of EBSD grain-boundary maps illustrating grain structure distribution in the HAZ of the material pulsed at Kj = 0.77 × 105 A2 s mm−4. In the maps, red, black, and gray lines depict LABs, HABs, and Σ3 twin boundaries (within a 5° tolerance), respectively. Note: The rolling plane is shown.

Figure 7

TABLE I. Microstructure distribution in the HAZ.

Figure 8

TABLE II. Texture distribution in the HAZ.

Figure 9

TABLE III. Volume fraction of different texture components in statically recrystallized, cryorolled copper.6

Figure 10

FIG. 8. Orientation distribution functions showing typical texture in (a) the central part of the HAZ of the pulsed material and (b) in the material statically recrystallized at 300 °C for 1 h.6 For comparison purposes, several ideal orientations are superimposed on the ODFs. Arrows show (50; 30; 0) orientation.

Figure 11

FIG. 9. Effect of integral current on the volume fractions of (a) rolling-texture components and (b) recrystallization-texture components in the HAZ of the pulsed material. In all cases, data at Kj = 0 represent the original cryorolled material. Note: Orientations of the texture components are given in Euler angles (Bunge notation).

Figure 12

TABLE IV. The color and corresponding thickness of copper oxide films (after F.H. Constable18).

Figure 13

FIG. 10. (a) Temper colors in the specimen pulsed at Kj = 0.80 × 105 A2 s mm−4 and (b) relationship between integral current density and calculated temperature.

Figure 14

FIG. 11. (a) EBSD grain-boundary map illustrating the grain structure at the moving front of the HAZ in Fig. 2(b) and (b) orientation distribution function for recrystallized grains in the selected area in (a). In the EBSD map, red, black, and gray lines depict LABs, HABs, and Σ3 twin boundaries (within a 5° tolerance), respectively. For comparison purposes, several ideal orientations are superimposed on the ODF in (b). Arrows in (b) show (50; 30; 0) orientation.