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Coupling of magnetism and structural phase transitions by interfacial strain

Published online by Cambridge University Press:  18 September 2014

Thomas Saerbeck*
Affiliation:
Department of Physics and Center for Advanced Nanoscience, University of California San Diego, La Jolla, California 92093, USA
Jose de la Venta
Affiliation:
Department of Physics, Colorado State University, Fort Collins, Colorado 80523, USA
Siming Wang
Affiliation:
Materials Science and Engineering Program, University of California San Diego, La Jolla, California 92093, USA; and Department of Physics and Center for Advanced Nanoscience, University of California San Diego, La Jolla, California 92093, USA
Juan Gabriel Ramírez
Affiliation:
Department of Physics and Center for Advanced Nanoscience, University of California San Diego, La Jolla, California 92093, USA
Mikhail Erekhinsky
Affiliation:
Department of Physics and Center for Advanced Nanoscience, University of California San Diego, La Jolla, California 92093, USA
Ilya Valmianski
Affiliation:
Department of Physics and Center for Advanced Nanoscience, University of California San Diego, La Jolla, California 92093, USA
Ivan K. Schuller
Affiliation:
Department of Physics and Center for Advanced Nanoscience, University of California San Diego, La Jolla, California 92093, USA
*
a) Address all correspondence to this author. e-mail: saerbeck@ill.fr

Abstract

Proximity effects and exchange coupling across interfaces of hybrid magnetic heterostructures present unique opportunities for functional material design. In this review, we present an overview of recent experiments on magnetic hybrid materials in which magnetism was controlled by proximity to an active material. In particular, we discuss interfacial strain coupling of ferromagnetic materials in contact with a material undergoing a structural deformation. Bilayers containing VO2 and V2O3 as active materials are shown to strongly affect the magnetization and coercivity of ferromagnetic materials due to stress anisotropy caused by a temperature-dependent structural displacement in the oxide. The possibilities of tuning the system by sample morphology and materials choice are discussed in detail. In addition, we highlight a length-scale competition between magnetic and structural domains which leads to a maximum change in the coercivity in a narrow temperature window of the vanadium oxide phase transition.

Information

Type
Invited Feature Papers
Copyright
Copyright © Materials Research Society 2014 
Figure 0

FIG. 1. Sun-wheel illustration of possible magnetic hybrid structures. The lower right field of MIT/SPT stands for the class of transition-metal oxides that undergo a MIT in combination with a structural transition of the atomic arrangement.

Figure 1

FIG. 2. MIT (a) and SPT (b) of VO2/Ni and resulting coercivity enhancement of Ni deposited at 420 K (c) resulting from the SPT in VO2. Note that the change in resistance results from the MIT of VO2, which appears suppressed due to the shortening metallic layer on the oxide. The coercivity of the Ni film above the VO2 phase transition is labeled as HCA, while it is labeled as HCB below the MIT and SPT. (Parts of the figure are adapted from Ref. 60.)

Figure 2

FIG. 3. X-ray diffraction recorded along the surface normal as a function of temperature. At the SPT temperature of VO2 a change of the diffraction angle is observed as the surface plane changes from monoclinic (200) to tetragonal (101) of VO2.

Figure 3

FIG. 4. Example magnetic hysteresis loops of VO2/Ni as a function of temperature. As the temperature decreases, the hysteresis loops widen, i.e., the coercivity increases, whereas the general shape and saturation magnetization remain constant.

Figure 4

FIG. 5. Coercivity (a) and magnetization (b) of VO2 (100 nm)/Ni (10 nm) bilayer in which the Ni has been deposited on VO2 in the metallic (420 K, open symbols) or insulating (300 K, filled symbols) state. (Figure adapted from Ref. 60.)

Figure 5

FIG. 6. Coercivity enhancement in VO2/Ni bilayers as a function of Ni thickness. (Figure adapted from Ref. 60.)

Figure 6

FIG. 7. MIT (a) and SPT (b) of V2O3/Ni in both heating and cooling branches. The change in resistance results from the MIT of V2O3, which appears suppressed due to the metallic layer on the oxide. (c) Coercivity enhancement of Ni due to the SPT of V2O3. (Figure adapted from Ref. 63.)

Figure 7

FIG. 8. X-ray diffraction recorded along the surface normal as a function of temperature. At the SPT temperature of V2O3 a change of the diffraction angle is observed as the surface plane changes from monoclinic (110) to hexagonal (012) of V2O3. The data have been recorded while cooling the sample. Inset: Scan at 168 K (symbols) and Gaussian fit (thin black line) resulting from two Gaussian profiles (blue and red lines).

Figure 8

FIG. 9. Example magnetic hysteresis loops of V2O3/Ni as a function of temperature. Similar to the case of Ni/VO2, the shape and saturation magnetization of the samples is preserved at all temperatures, whereas only the coercivity changes as a function of temperature.

Figure 9

FIG. 10. Coercivity increase in a V2O3 (100 nm)/Cu(X nm)/Ni (10 nm) trilayer with varying Cu spacer layer thickness.

Figure 10

FIG. 11. MR measurements at different temperatures in V2O3 (100 nm)/Ni (15 nm). Prior to the measurements, the sample was cooled from 300 K to 4.2 K with an applied field of 1000 Oe. The inset shows the geometry used in the measurement.

Figure 11

FIG. 12. (a) Resistance versus temperature at 1 kOe. The empty circles correspond to the MR measurements shown in Fig. 11. (b) Coercivity (and exchange bias field HEB blue circles) versus temperature extracted from MR (black diamonds) and VSM (red squared) measurements.

Figure 12

FIG. 13. Coercivity behavior of V2O3/FM bilayer with FM = Ni, Co (a) and Fe (b).

Figure 13

FIG. 14. (a, b) Surface morphology obtained from AFM of samples with 3 nm (a) and 1.5 nm (b) mean surface roughness. (c, d) XRR and fits of the samples with 3 nm (c) and 1.5 nm (d) V2O3/Ni root mean square interface roughness.

Figure 14

FIG. 15. (a, b) Scattering length density profiles (SLD) obtained from the fits of the XRR data. (c) Coercivity of the samples with 3 nm and 1.5 nm interface roughness in comparison to a Ni film grown directly on the Al2O3 substrate.