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High-energy synchrotron X-ray diffraction measurements of simple bending of pseudoelastic NiTi shape memory alloy wires

Published online by Cambridge University Press:  23 May 2016

Baozhuo Zhang*
Affiliation:
Department of Materials Science and Engineering, University of North Texas, Denton, Texas 76207
Marcus L. Young
Affiliation:
Department of Materials Science and Engineering, University of North Texas, Denton, Texas 76207
*
a) Author to whom correspondence should be addressed. Electronic mail: zhangbaozhuo123@gmail.com

Abstract

Many technological applications of austenitic shape memory alloys (SMAs) involve cyclical mechanical loading and unloading in order to take advantage of pseudoelasticity. In this paper, we investigated the effect of mechanical bending of pseudoelastic NiTi SMA wires using high-energy synchrotron radiation X-ray diffraction (SR-XRD). Differential scanning calorimetry was performed to identify the phase transformation temperatures. Scanning electron microscopy images show that micro-cracks in compressive regions of the wire propagate with increasing bend angle, while tensile regions tend not to exhibit crack propagation. SR-XRD patterns were analyzed to study the phase transformation and investigate micromechanical properties. By observing the various diffraction peaks such as the austenite (200) and the martensite ( ${\bar 1}12$ ), ( ${\bar 1}03$ ), ( ${\bar 1}11$ ), and (101) planes, intensities and residual strain values exhibit strong anisotropy, depending upon whether the sample is in compression or tension during bending.

Information

Type
Technical Articles
Copyright
Copyright © International Centre for Diffraction Data 2016 
Figure 0

Figure 1. (Color online) Schematic image of 1-ID-C SR-XRD.

Figure 1

Figure 2. (Color online) (a) Optical image of NiTi SMA wire in 12% bending strain and (b) SEM image of a detailed view with points where SR-XRD measurements (red boxes) were collected. Red boxes with A, B, and C show regions of martensite in tension, austenite (neutral loading), and martensite in compression, respectively.

Figure 2

Figure 3. (Color online) DSC curve for the heat treated NiTi SMA wire. The dashed line indicates room temperature (23 °C).

Figure 3

Figure 4. (Color online) SEM images of the outer region (tensile side; blue box) and inner region (compression side; red box) of the bent region of the heat treated NiTi SMA wire in simple bending at 0, 12, and 30% strain, respectively.

Figure 4

Figure 5. (Color online) Representative SR-XRD patterns (quarter of image plate) at the (a) outer region (tension; martensite), (b) center region (neutral load; austenite and R-phase), and (c) inner region (compression; martensite) of a NiTi SMA wire in 12% bending strain. All of the diffraction rings were identified as either austenite, martensite, or R-phase. Lighter pixels indicate higher diffracted intensity.

Figure 5

Figure 6. (Color online) Normalized intensity vs. d-spacing for the NiTi SMA wire illustrating anisotropic deformation behavior of martensite between the (a) inner region (compression) and (b) outer region (tension).

Figure 6

Figure 7. (Color online) Lattice strain maps for a heat-treated NiTi SMA wire in the (a) bending and (b) transverse to bending directions correspond to the same points in Figure 2(b). X-and Y-axes show the distance between each SR-XRD measurement. The color bar shows the amount of elastic lattice strain present. The top row (outer region of the bent wire) and bottom row (inner region of the bent wire) show the strains only for the martensite (101) plane, while the middle row (middle region of the bent wire) shows the strains only for the austenite (200) plane.