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Phase-change materials: The view from the liquid phase and the metallicity parameter

Published online by Cambridge University Press:  05 September 2019

Shuai Wei
Affiliation:
Institute of Physics, RWTH Aachen University, Germany; swei@physik.rwth-aachen.de
Pierre Lucas
Affiliation:
Department of Materials Science and Engineering, The University of Arizona, USA; Pierre@u.arizona.edu
C. Austen Angell
Affiliation:
School of Molecular Sciences, Arizona State University, USA; caa@asu.edu

Abstract

While fast-switching rewritable nonvolatile memory units based on phase-change materials (PCMs) are already in production at major technology companies such as Intel (16–64 GB chips are currently available), an in-depth understanding of the physical factors that determine their success is still lacking. Recently, we have argued for a liquid-phase metal-to-semiconductor transition (M-SC), located not far below the melting point, Tm, as essential. The M-SC is itself a consequence of atomic rearrangements that are involved in a fragile-to-strong viscosity transition that controls both the speed of crystallization and the stabilization of the semiconducting state. Here, we review past work and introduce a new parameter, the “metallicity” (inverse of the average Pauling electronegativity of a multicomponent alloy). When Tm-scaled temperatures of known M-SCs of Group IV, V, and VI alloys are plotted against their metallicities, the curvilinear plot leads directly to the composition zone of all known PCMs and the temperature interval below Tm, where the transition should occur. The metallicity concept could provide guidance for tailoring PCMs.

Information

Type
Phase-Change Materials in Electronics and Photonics
Copyright
Copyright © Materials Research Society 2019 
Figure 0

Figure 1. (a) A schematic plot for the entropy of a typical glass-forming liquid (dot-dashed line) and a switchable phase-change material (PCM) (dashed line) in an alternative scenario with additional entropy loss, where Tg is the glass-transition temperature and Tm is the melting point). (b) The liquidus surface13 (contour) of ternary Ge-Sb-Te. The solid red dots and shadow areas indicate the common compositions of PCMs, including the GeTe-Sb2Te3 Yamada line for memory and data-storage applications.7

Figure 1

Figure 2. Liquid densities versus melting point (Tm)-scaled temperature for Group IV, V, and VI elements and their alloys. The low-temperature data points are for glassy states, and dashed lines are interpolations of the density traces in the supercooled liquid regime based on evidence from the cases of As2Te32 and As2Se319 that the density follows a negative slope with respect to temperature below the temperature of maximum density, TMD. Data for GeTe, Sb2Te3, and Ge1Sb2Te4, Ge2Sb2Te5 are from Reference 20. Data for Te, GeTe12, GeTe6 (Ge15Te85) are from Reference 21. For the glassy states, Ge1Sb2Te4: ρ = 5.88 g/cm3,22 Ge2Sb2Te5: ρ = 5.88g/cm3,23 GeTe: ρ = 5.6 g/cm3,24 As2Te3: ρ = 5.53g/cm3,25 and Ge15Te85: ρ of Ge17Te83 is available and assumed to be approximately the same 5.53 g/cm3.26

Figure 2

Figure 3. The metal-semiconductor transition (M-SC). (a) Upper plot: The Cp maximum is ∼80 K above the liquidus TL in As2Te3. Dotted line indicates the onset of melting (Tmonset). Tx is the crystallization temperature during cooling. Lower plot: the density maximum and minimum of liquid As2Te3.2 (b) Upper: Densities of liquid As2Se3 at various mild pressures. Lower: Optical bandgap (Eg) of liquid As2Se3 closes at ∼1280 K, and that of As2S3 would close at a higher temperature.19,28 (c) Electronic conductivity (σ) as a function of inverse temperature for (As2Se3)1–x(As2Te3)x alloys. σ drops from a plateau of ∼103 S cm–1 through a M-SC. The temperature at which the M-SC occurs (TM-SC) corresponds to the maximum in apparent activation energy (Ea) of σ. The arrow indicates TM-SC of liquid As2Te3.30,32

Figure 3

Figure 4. Correlations of TM-SC/Tm (= tM-SC) and TM-SC values with the metallicity parameter, MP for various alloys. (a) The tM-SC of Group IV, V, and VI alloys (red dots) and Group III, VI alloys (green diamonds). The phase-change material (PCM) compositions on the Yamada line, and (Ag, In)-doped Sb2Te (AIST) and Ge15Sb85 have metallicity ranging from MP = 0.48–0.49, marked by the shadowed pink area, which corresponds to tM-SC < 1.0. (b) The absolute TM-SC relation to metallicity MP. This shows a V-shape with respect to MP with a minimum zone (shadowed pink zone), where all known PCMs are located. Data sources: As2Se3 and As2S3;33TM-SC of As2S3 is an extrapolation to optical bandgap closing; Te-Se,34 SbSe,36 Ge45As30Se25.37 The TM-SC is assigned to the temperature of maximum slope of density curve ∼750°C = 1023 K. As2Te3,2 Te,25 Ge15Te85,10,21 In-Te,27 Ge,38 Si,29 AIST and Ge15Sb85.39

Figure 4

Figure 5. Arrhenius plots scaled by the glass-transition temperature (Tg) for the viscosity (η) of Group IV, V, and VI alloys. Phase-change materials (PCMs), which have the highest metallicity, exhibit the lowest viscosities at Tm (where Tg/Tm ∼ 0.5). On the Tg-reduced scale, they overlap the elemental Te data. Alloys of lower metallicity exhibit systematically higher viscosities, and lower m fragilities. The lowest metallicity case, As2O3, with m = 19 (according to light-scattering relaxation time data) is even stronger than the archetypal strong liquid, SiO2. Apart from this interesting case, Figure 5 contains only directly measured experimental viscosities. The crystal-growth-derived viscosities are not shown. The bold colored arrows indicate TM-SC (660 K) of AIST (purple) below Tm, and that of As2Te3 (green), Ge15T85 (red), and As2Se3 (orange) above Tm, respectively. Data sources: Ge2Sb2Te5;57Tg = 430 K,58 although the value is still under debate;8 AIST (Ag-In-doped Sb2Te),47 (its Tg = 443 K58) is also under debate;48 Te;59Tg = 350 K;11 Ge15Te85: viscosity data;60 Adam–Gibbs fitting line;10 GeTe53 assigned Tg = 470 K; As2Te3;61Tg = 375 K is the value at which calculated viscosity reaches 1012 Pa s; As2Se3;62 As2S3.45 For As2O3, relaxation times were directly measured using light scattering, from which the precise Vogel–Fulcher–Tammann (VFT) parameters were obtained. The viscosity is represented by a VFT fit in the similar temperature range of relaxation time data using the parameters in Reference 63; SiO2, and o-terphenyl (OTP);45 Si64 (the Tg of Si is unknown and here assigned as 900 K).10