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Study on the optimal Zernike order in the phase parameterization for global phase retrieval algorithm

Published online by Cambridge University Press:  09 June 2020

Qian Ye*
Affiliation:
School of Mechanical Engineering, Shanghai Jiao Tong University, 800 Dongchuan Road, Minhang District, Shanghai, China
Yueshu Xu
Affiliation:
School of Mechanical Engineering, Shanghai Jiao Tong University, 800 Dongchuan Road, Minhang District, Shanghai, China
Ahmad Hoorfar
Affiliation:
Antenna Research Lab, Electrical and Computer Engineering Department, Villanova University, 800 E. Lancaster Ave, Villanova, PA, USA
*
Author for correspondence: Qian Ye, E-mail: yeqian@sjtu.edu.cn
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Abstract

Phase retrieval algorithm is an effective method to reconstruct the surface distortions for reflector antennas. As the traditional Fourier iterative algorithms usually stagnate at local minima, we previously proposed a global phase retrieval algorithm, named CMAES-HIO, based on the hybridization of hybrid-input-output algorithm and covariance matrix adaptation evolution strategy. We address the problem of selection of the Zernike order used in the phase parameterization for CMAES-HIO algorithm in this paper. By introducing a hybrid evaluation parameter, which combines the algorithm accuracy and time consumption, we utilize the Monte-Carlo method to simulate the algorithm performance under different random surface distortions. Simulation results show that for an unknown surface distortion, a Zernike order of 5 or 6 is probably the optimum for the comprehensive algorithm performance with respect to time and accuracy.

Information

Type
Antenna Design, Modeling and Measurements
Copyright
Copyright © Cambridge University Press and the European Microwave Association 2020
Figure 0

Fig. 1. Diagram of different steps in CMAES-HIO algorithm.

Figure 1

Fig. 2. Plots of success rate and time cost versus Zernike orders.

Figure 2

Fig. 3. (a) Simulated aperture amplitude; (b, c, d) distributions of the 1st, 50th, and 100th simulated surface distortions; (e) plots of the parameter $P$ versus Zernike orders.