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Auto-generation of passive scalable macromodels for microwave components using scattered sequential sampling

Published online by Cambridge University Press:  19 February 2014

Krishnan Chemmangat*
Affiliation:
Ghent University – iMinds, Gaston Crommenlaan 8 Bus 201, B-9050 Gent, Belgium
Tom Dhaene
Affiliation:
Ghent University – iMinds, Gaston Crommenlaan 8 Bus 201, B-9050 Gent, Belgium
Luc Knockaert
Affiliation:
Ghent University – iMinds, Gaston Crommenlaan 8 Bus 201, B-9050 Gent, Belgium
*
Corresponding author: Krishnan Chemmangat Email: krishnan.cmc@intec.ugent.be
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Abstract

This paper presents a method for automatic construction of stable and passive scalable macromodels for parameterized frequency responses. The method requires very little prior knowledge to build the scalable macromodels thereby considerably reducing the burden on the designers. The proposed method uses an efficient scattered sequential sampling strategy with as few expensive simulations as possible to generate accurate macromodels for the system using state-of-the-art scalable macromodeling methods. The scalable macromodels can be used as a replacement model for the actual simulator in overall design processes. Pertinent numerical results validate the proposed sequential sampling strategy.

Information

Type
Research Papers
Copyright
Copyright © Cambridge University Press and the European Microwave Association 2014 
Figure 0

Fig. 1. A two dimensional design space with four root macromodels.

Figure 1

Fig. 2. Subspace division along the most difficult-to-model edge.

Figure 2

Fig. 3. Coexter's trisection of the path-simplex in ℝ3 (as in [15]).

Figure 3

Fig. 4. Comparison of Coxeter's trisection method versus incenter-based division.

Figure 4

Table 1. Comparison of different refinement strategies.

Figure 5

Fig. 5. Error estimation with two subsequent model levels: (a) Rectangular region and (b) Simplicial region.

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Fig. 6. Flow chart of the proposed sequential sampling.

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Fig. 7. Example I: Layout of the microstrip bandpass filter.

Figure 8

Fig. 8. Example I: Magnitude of S11 as a function of L1.

Figure 9

Fig. 9. Example I: Magnitude of S21 as a function of S.

Figure 10

Fig. 10. Example I: Sample distribution with the proposed algorithm.

Figure 11

Fig. 11. Example I: Verification sample distribution.

Figure 12

Fig. 12. Example I: Mean absolute error distribution for the final verification samples.

Figure 13

Fig. 13. Example I: H∞ norm for the final verification samples.

Figure 14

Table 2. Example I: Comparison of different sampling strategies.

Figure 15

Fig. 14. Example II: Layout of microstrip with two coupled vias: (a) top view, (b) cross-sectional view.

Figure 16

Fig. 15. Example II: Magnitude of S11 as a function of L.

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Fig. 16. Example II: Magnitude of S21 as a function of r.

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Fig. 17. Example II: Mean absolute error distribution for the final verification samples.

Figure 19

Fig. 18. Example II: H∞ norm for the final verification samples.

Figure 20

Table 3. Example II: Comparison of different sampling strategies.

Figure 21

Fig. 19. Example III: Layout of ring resonator bandpass filter.

Figure 22

Fig. 20. Example III: Magnitude of S11 and S21 as a function of L1.

Figure 23

Fig. 21. Example III: Magnitude of S11 and S21 as a function of L2.

Figure 24

Fig. 22. Example III: Magnitude of S11 and S21 as a function of S1.

Figure 25

Fig. 23. Example III: ADS Momentum response at the optimal solutions generated with the two macromodels.

Figure 26

Table 4. Example III: Comparison of different sampling strategies.

Figure 27

Table 5. Example III: Optimization results.