Hostname: page-component-7b7567c8c-7pwfn Total loading time: 0 Render date: 2026-11-15T11:54:29.763Z Has data issue: false hasContentIssue false

Crystal structure and microwave dielectric properties of low temperature sintered MgO ceramic with LiF addition

Published online by Cambridge University Press:  06 February 2012

Akinori Kan*
Affiliation:
Department of Transportation Engineering, Meijo University, Nagoya 4688502, Japan
Hirotaka Ogawa
Affiliation:
Department of Transportation Engineering, Meijo University, Nagoya 4688502, Japan
Tohru Moriyama
Affiliation:
Department of Transportation Engineering, Meijo University, Nagoya 4688502, Japan
*
a)Address all correspondence to this author. e-mail: akan@meijo-u.ac.jp

Abstract

The (1−x)MgO–xLiF ceramics (x = 0.02–0.08) were successfully sintered when the ceramics were sintered at 950 °C for 4 h in covered crucible. From the crystal structure analysis, it was found that a small amount of Li+ cation occupied Mg2+ site in MgO ceramic; the formation of oxygen vacancy induced by Li substitution for Mg was suggested by the evaluation of the bulk conductivity and the calculation of density of state (DOS) for the (Mg13O43)−60 and (Mg11Li2O42)−58 cluster models. As for the microwave dielectric properties of the (1−x)MgO–xLiF ceramics, the dielectric constant εr and the temperature coefficient of resonant frequency values of the ceramic were independent of the lithium fluoride (LiF) content, and these values were approximately 9.5 and −62 ppm/°C. On the other hand, the quality factor $(Q \cdot f)$ values strongly depended on the LiF content. As a result, the highest $Q \cdot f$ value of 282,230 GHz was obtained at x = 0.04. From these results, it is determined that the LiF addition is effective in reducing the sintering temperature of MgO without any detrimental effect on the microwave dielectric properties of MgO ceramics.

Information

Type
Articles
Copyright
Copyright © Materials Research Society 2012
Figure 0

FIG. 1.DTA–TG curves of 0.92MgO–0.08LiF ceramics measured in covered pan.

Figure 1

TABLE I.Apparent density and microwave dielectric properties of (1−x)MgO–xLiF (x = 0.02–0.08) ceramics sintered at 950°C for 4h in covered crucible.

Figure 2

FIG. 2.XRPD patterns of MgO and (1−x)MgO–xLiF (x = 0.02–0.08) ceramics sintered at 950 °C for 4 h in covered crucible.

Figure 3

FIG. 3.Variation in lattice parameters of (1−x)MgO–xLiF (x = 0–0.08) ceramics as a function of composition x.

Figure 4

FIG. 4.Complex impedance plane plots for (a) MgO and (b) 0.96MgO–0.04LiF (x = 0.04) ceramics measured at 700 °C. (color online)

Figure 5

FIG. 5.Influence of LiF addition on bulk conductivity ($\sigma _{\rm b} $) of (1−x)MgO–xLiF (x = 0–0.08) ceramics at 700 °C.

Figure 6

FIG. 6.Schematic diagram on (Mg13O43)−60 and (Mg11Li2O42)−58 cluster models.

Figure 7

FIG. 7.Energy levels and the partial DOSs of (a) (Mg13O43)−60 and (b) (Mg11Li2O42)−58 cluster models.

Figure 8

FIG. 8.Field emission scanning electron microscopy photographs of (1−x)MgO–xLiF ceramics sintered at 950 °C for 4 h in covered crucible.

Figure 9

FIG. 9.Microwave dielectric properties of (1−x)MgO–xLiF (x = 0.02–0.08) ceramics sintered at 950 °C for 4 h in covered crucible.