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Effect of the ligand in the crystal structure of zinc oxide: an x-ray powder diffraction, x-ray absorption near-edge structure, and an extended x-ray absorption fine structure study

Published online by Cambridge University Press:  20 April 2016

María de los A. Cepeda-Pérez
Affiliation:
Universidad Metropolitana, School of Science and Technology, Nanomaterial Science Laboratory, P.O. Box 21150, San Juan 00928-1150, Puerto Rico
Cristina M. Reyes-Marte
Affiliation:
Universidad Metropolitana, School of Science and Technology, Nanomaterial Science Laboratory, P.O. Box 21150, San Juan 00928-1150, Puerto Rico
Valerie Ann Carrasquillo
Affiliation:
Universidad Metropolitana, School of Science and Technology, Nanomaterial Science Laboratory, P.O. Box 21150, San Juan 00928-1150, Puerto Rico
William A. Muñiz
Affiliation:
Universidad Metropolitana, School of Science and Technology, Nanomaterial Science Laboratory, P.O. Box 21150, San Juan 00928-1150, Puerto Rico
Edgar J. Trujillo
Affiliation:
Universidad Metropolitana, School of Science and Technology, Nanomaterial Science Laboratory, P.O. Box 21150, San Juan 00928-1150, Puerto Rico
Rahul Singhal
Affiliation:
Department of Physics and Engineering Physics, Central Connecticut State University, New Britain, CT-06050
Harry Rivera
Affiliation:
Inter American University of Puerto Rico, Bayamón Campus, Carr 500 Dr John W. Harris, Bayamón 00957, Puerto Rico
Mitk'El B. Santiago-Berríos*
Affiliation:
Universidad Metropolitana, School of Science and Technology, Nanomaterial Science Laboratory, P.O. Box 21150, San Juan 00928-1150, Puerto Rico
*
Address all correspondence to Mitk'El B. Santiago-Berríos at msantiago326@suagm.edu

Abstract

We analyze the effect of functionalization in the surface of zinc oxide crystal structure by 3-mercaptopropionic acid. X-ray powder diffraction data and extended x-ray absorption fine structure studies confirms a wurtzite structure. However, the morphology of the surface seems to be reduced and shows a film-like surface as demonstrated by x-ray absorption near edge structure and scanning electron microscopy. As a result of surface functionalization, the energy levels of the semiconductor were shifted toward reductive potentials (by 50 mV) as determined by diffuse reflectance and cyclic voltammetry.

Information

Type
Research Letters
Copyright
Copyright © Materials Research Society 2016 
Figure 0

Figure 1. SEM micrographs of unmodified ZnO (a) and (b) ZnO-treated 3-MPA.

Figure 1

Table I. EDS quantitative results.

Figure 2

Figure 2. XRPD diffractogram of ZnO and of ZnO functionalized with MPA. The diffraction peaks correspond to the wurtzite structure of zincite database (PDF #36–1451).

Figure 3

Figure 3. XANES spectra from polycrystalline ZnO (black line) and ZnO capped with 3-MPA (red line) near the Zn K-edge.

Figure 4

Figure 4. (a) Zn-EXAFS chi-spectra weighted by k3 and (b) corresponding Fourier transforms for ZnO and ZnO with 3-MPA. The results were generated using the ATHENA software.[19]

Figure 5

Figure 5. Diffuse reflectance spectra of pure ZnO and of ZnO with 3-MPA.

Figure 6

Figure 6. Cyclic voltammogram of ZnO and of ZnO with 3-MPA-modified gold electrodes in a 0.1 M NaCl aqueous solution. Scan rate was 100 mV/s and an Ag/AgCl, NaCl 3.5 M reference electrode was used. (Inset) Energy levels of pure ZnO and of ZnO functionalized with 3-MPA as determined by cyclic voltammetry and diffuse reflectance spectroscopy. The blue line corresponds to the conduction band and the magenta line corresponds to the valence band. The error bars correspond to 5% of standard deviation of four samples.

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