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Atom probe tomography of interfaces in ceramic films and oxide scales

Published online by Cambridge University Press:  08 January 2016

K. Stiller
Affiliation:
Department of Applied Physics, Division of Materials Microstructure, Chalmers University of Technology, Sweden; stiller@chalmers.se
M. Thuvander
Affiliation:
Department of Applied Physics, Division of Materials Microstructure, Chalmers University of Technology, Sweden; mattias.thuvander@chalmers.se
I. Povstugar
Affiliation:
Department of Microstructure Physics and Alloy Design, Max Planck Institute for Iron Research, Germany; i.povstugar@mpie.de
P.P. Choi
Affiliation:
Department of Microstructure Physics and Alloy Design, Max Planck Institute for Iron Research, Germany; p.choi@mpie.de
H.-O. Andrén
Affiliation:
Department of Applied Physics, Division of Materials Microstructure, Chalmers University of Technology, Sweden; andren@chalmers.se

Abstract

Atomic-scale characterization of interfaces in ceramic materials is needed in order to fully understand their electronic, ionic, mechanical, magnetic, and optical properties. The latest development of laser-assisted atom probe tomography (APT), as well as new specimen preparation methods, have opened the realm of ceramics for structural and chemical characterization with high sensitivity and nearly atomic spatial resolution. This article reviews recent APT investigations of interfaces in thin nitride films and thermally grown oxides: TiAlN layers and oxide scales on alumina- and chromia-formers and Zr alloys. The selected examples highlight the role of interfaces in the decomposition of films and in transport processes.

Information

Type
Research Article
Copyright
Copyright © Materials Research Society 2016 
Figure 0

Figure 1. (a) An atom probe tomography (APT) reconstruction of an oxide scale on a FeCrAl alloy showing a Cr-rich grain boundary (GB) (region 1) between two pure α-Al2O3 grains. Note Cr-rich precipitates (region 2). Box size is 60 × 60 × 60 nm3. (b) An APT reconstruction of a thin slice containing a Cr-rich GB (1) between one pure α-Al2O3 grain and one Fe-containing transient Al2O3 grain (region 3). Box size is 50 × 30 × 12 nm3. Courtesy of F. Liu.

Figure 1

Figure 2. Atom probe tomography reconstruction of grain boundaries (GBs) in zirconia, showing enrichment of (a) Fe and (b) deuterium (OD+) along the same boundary in the oxide; (c) shows segregation of Fe (purple) and Ni (green) to a sub-GB in the metal (red) that is inherited by the GB in the oxide (blue). Box sizes in (a) and (b) are 65 × 65 × 195 nm3; in (c) 140 × 140 × 330 nm3. Courtesy of G. Sundell.

Figure 2

Figure 3. (a) Elemental atom maps for TiAlN/CrN multilayer coating in (left) as-deposited and (middle and right) annealed (1 h) states. Nitrogen atoms are not shown for the sake of clarity. (b) Elemental concentration profiles for Cr, Al, and Ti for the sample annealed at 700°C for 1 h.