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An autofocusing method for imaging the targets for TWI radar systems with correction of thickness and dielectric constant of wall

Published online by Cambridge University Press:  09 November 2018

Sandeep Kaushal
Affiliation:
Department of Electronics and Communication Engineering, ACET, Amritsar, India
Bambam Kumar
Affiliation:
Department of Electronics and Communication Engineering, Indian Institute of Technology Roorkee, Roorkee, Uttarakhand, India
Dharmendra Singh*
Affiliation:
Department of Electronics and Communication Engineering, Indian Institute of Technology Roorkee, Roorkee, Uttarakhand, India
*
Author for correspondence: Dharmendra Singh, E-mail: dharmfec@gmail.com
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Abstract

In through the wall imaging systems, wall parameters like its thickness and dielectric constant play an important role in the true and correct image formation of an object behind the wall made of various materials like brick cement, wood, plastic, etc. Incorrect estimation of these parameters leads to dislocation of the object and smearing or blurriness of the image too. A new autofocusing technique for a stepped frequency continuous wave -based radar at the frequency of 1–3 Ghz has been developed that corrects the wall's parameters like its thickness and dielectric constant and provides a better focused image of the target. For this purpose, a peak signal to noise ratio -based autofocusing technique has been developed by using curve fitting and the genetic algorithm. It is observed that the proposed technique has capability to focus the image up to good extent.

Information

Type
Research Papers
Copyright
Copyright © Cambridge University Press and the European Microwave Association 2018 
Figure 0

Fig. 1. Experimental arrangement of the TWI system.

Figure 1

Fig. 2. (a) Triangular metal target and (b) rectangular metal target.

Figure 2

Table 1. System parameter values

Figure 3

Fig. 3. A-scan image of the target behind the wall.

Figure 4

Fig. 4. Real-time imaging geometry for the delay–sum algorithm.

Figure 5

Fig. 5. PSNR values at different thickness and dielectric values.

Figure 6

Fig. 6. Flowchart of the proposed method.

Figure 7

Fig. 7. C-scan image of the triangular target without the considering wall effect.

Figure 8

Fig. 8. C-scan image of the triangular target behind the wall at thickness t = 18 cm and dielectric value d = 4.

Figure 9

Fig. 9. C-scan image of the triangular target behind the wall at thickness t = 19 cm and dielectric d = 5.5.

Figure 10

Fig. 10. C-scan image of the rectangular target behind the wall at thickness t = 19 cm and dielectric d = 5.5.