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An overview of interface-dominated deformation mechanisms in metallic nanocomposites elucidated using in situ straining in a TEM

Published online by Cambridge University Press:  07 March 2019

Yuchi Cui*
Affiliation:
Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109, USA
Nan Li
Affiliation:
Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA
Amit Misra
Affiliation:
Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109, USA; and Department of Mechanical Engineering, University of Michigan, Ann Arbor, Michigan 48109, USA
*
a)Address all correspondence to this author. e-mail: tedcui@umich.edu

Abstract

Nanostructured multiphase metallic materials present extraordinary properties, such as high strength, enhanced fatigue and radiation resistance, and thermal stability, compared to conventional bulk metallic materials. Previous research studies have shown that their deformation and fracture behavior are dominated by defect interactions at internal interfaces. In situ straining, including nanoindentation, compression, and tension, in a transmission electron microscope (TEM) has emerged as a powerful tool to investigate the physics of defect–interface interactions at the nano-scale and even atomic scale. The mechanistic insights gained from these experiments coupled with dislocation theory and atomistic modeling has helped develop a fundamental understanding of the mechanical properties. In this article, through some recent investigations on observing dislocation and interface activities, crack propagation, and nanopillar compression, we present current progress in utilizing in situ TEM straining to examine interface-dominated deformation mechanisms.

Figure 0

Figure 1: TEM images showing (a) continuous deformation twin across Cu/Ag interface, (b) thickening of the deformation twin in two phases, (c) generation of stacking faults in Ag with leading partials against the interface, (d) absorption of the leading and trailing partials by the interface, (e) emission of a perfect dislocation in Cu, (f) dislocation pile-up in Ag, (g) and (h) cross-slip of dislocations out of the pile-up and emission of dislocations back into Ag [41].

Figure 1

Figure 2: MD simulations showing (a) initial cube-on-cube AgCu interface, (b) partial dislocation transmitted from Ag to Cu and the twin thickened from the partial dislocation indicated by the arrowhead, (c) partial dislocation in Ag accommodated by the interface and (d) nucleation of a partial back into Ag and emission of two perfect dislocations in Cu [41].

Figure 2

Figure 3: In situ TEM study on Cu/Nb multilayer showing (a)–(c) confined layer slip and formation of new dislocations, (d, e) dislocation emission from the interfaces and (f) co-deformation of the nanolayers [45].

Figure 3

Figure 4: (a)–(c) In situ TEM study on ARB process Cu/Nb multilayer showing formation of deformation twin from twin nuclei 1 and 2 and (d) HRTEM image at the twin boundary [49].

Figure 4

Figure 5: HRTEM snapshots showing (a) two dislocation b1 and b2 separated by 2.5nm; (2) b1 and b2 approaching each other through climb; (c) annihilation of the two dislocations and (d) the interface after dislocation annihilation.

Figure 5

Figure 6: TEM images showing (a) formation of microcrack, (b) crack deviation, (c) layer necking, and (d) crack blunting of 65 nm Cu/150 nm Nb MNC [56], and snapshots from the tensile test on 63 nm Cu/Nb when the load is (e) parallel to the interface and (f) perpendicular to the interfaces [57].

Figure 6

Figure 7: (a) Displacement and load data record during the test, point b to d correspond to images b to d, (b) to (d) in situ TEM study on Cu/Nb multilayer showing shearing at the interface [58].

Figure 7

Figure 8: STEM images showing (a) 3 nm Cu/Mo multilayer nanopillars after compression test, (b) cross-section of the hierarchical Cu/Mo nanocomposite, (c) nanopillar of the hierarchical nanocomposite before and after compression test, (d) cross-section of the bicontinuous structure, and (e) nanopillar of the bicontinuous structure after compression test where the original diameter is shown by the dotted lines [13, 61].