Hostname: page-component-6898cfcb55-cbk24 Total loading time: 0 Render date: 2026-11-11T14:31:49.197Z Has data issue: false hasContentIssue false

Femtosecond optical nonlinearities of Au/TiO2 thin films prepared by a sputtering method

Published online by Cambridge University Press:  18 February 2011

Ichiro Tanahashi*
Affiliation:
Nanomaterials Microdevices Research Center, Osaka Institute of Technology, Asahi-ku, Osaka 535-8585, Japan
Akihiro Mito
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), NMIJ, Tsukuba, Ibaraki 305-8563, Japan
*
a)Address all correspondence to this author. e-mail: tanahashi@chem.oit.ac.jp

Abstract

A multitarget sputtering method was applied to embed Au nanoparticles in TiO2 thin films (Au/TiO2 films) with a high concentration of Au particles (19–41 at%). The absolute values of imaginary part of the third-order nonlinear susceptibility, |Im [χ(3)]|, of the Au/TiO2 films, exhibited a peak around the localized surface plasmon resonance absorption peak (around 660 nm), and the maximum value was estimated to be 3.6 × 10−7 esu measured by the femtosecond Z-scan technique. The figure of merit, |Im [χ(3)]|/α, (α is the absorption coefficient of the film at the corresponding wavelength of the measurement) of the film was calculated to be 1.4 × 10−12 esu·cm, which was larger than that of the Au/SiO2 film. This is mainly due to the local field enhancement.

Information

Type
Articles
Copyright
Copyright © Materials Research Society 2011
Figure 0

FIG. 1.Cross-sectional TEM image of the as-deposited Au/TiO2 film (29.6 at% of Au) together with the electron diffraction pattern of a selected area.

Figure 1

FIG. 2.Cross-sectional TEM image of the Au/TiO2 film (29.6 at% of Au) heat-treated at 1000 °C for 1 h together with the electron diffraction pattern of a selected area.

Figure 2

FIG. 3.Particle size distribution of Au particles obtained from the analysis of TEM micrograph shown in (a) Fig. 1 and (b) Fig. 2.

Figure 3

FIG. 4.X-ray diffraction (XRD) patterns (●, Au; Δ, anatase; ●, rutile) of the as-deposited Au/TiO2 film and the film heat-treated at 600, 700, 800, 900, and 1000 °C in air for 1 h.

Figure 4

FIG. 5.Relation between the mean diameter of Au particle from the XRD shown in Fig. 4 and the heat-treatment temperature of the films.

Figure 5

FIG. 6.Au 4f electron spectrum of the as-deposited Au/TiO2 film shown in Fig. 1.

Figure 6

FIG. 7.Optical absorption spectra of the as-deposited Au/TiO2 film and the film heat-treated at 600, 700, 800, 900, and 1000 °C (shown in Fig.4) in air for 1 h.

Figure 7

FIG. 8.(a) Typical close and (b) open-aperture Z-scan normalized transmittance of the Au/TiO2 film heat-treated at 800 °C for 1 h shown in Figs. 4 and 7. The solid line indicates the theoretical fit. The wave length of the laser beam was 584 nm.

Figure 8

FIG. 9.Relation between the absolute values of the Im [χ(3)]/α and the mean particle diameter of Au particles in the Au/TiO2 films shown in Fig. 5.

Figure 9

FIG. 10.Time evolution of ΔT/T of the pump-probe delays for the Au/TiO2 film with the mean Au particle diameter of 33.7 nm.