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Single crystallization of Ba8AlxSi46−x clathrate for improvement of thermoelectric properties

Published online by Cambridge University Press:  27 July 2011

Naoki Mugita*
Affiliation:
Department of Materials Science and Engineering, Kyushu University, Fukuoka 819-0395, Japan
Yusuke Nakakohara
Affiliation:
Department of Materials Science and Engineering, Kyushu University, Fukuoka 819-0395, Japan
Ryo Teranishi
Affiliation:
Department of Materials Science and Engineering, Kyushu University, Fukuoka 819-0395, Japan
Shinji Munetoh
Affiliation:
Department of Materials Science and Engineering, Kyushu University, Fukuoka 819-0395, Japan
*
a)Address all correspondence to this author. e-mail: mugita@zaiko14.zaiko.kyushu-u.ac.jp

Abstract

We have synthesized single- and polycrystal Ba8AlxSi46−x clathrates to compare their thermoelectric properties. Single-crystal sample was prepared by Czochralski method in an argon atmosphere. Polycrystal sample was prepared by arc melting and annealed at 850 °C for 100 h in an argon atmosphere. The Seebeck coefficients of single- and polycrystal Ba8Al12Si34 at 500 °C were 44.5 and 53.0 μV/K, respectively. The Seebeck coefficients of both samples were almost the same because the Seebeck coefficients depend on carrier concentration, which is related to aluminum content. The electrical resistivity of the single-crystal sample with 0.49 mΩcm was lower than that of the polycrystal sample with 0.95 mΩcm because of the reduction of electron scattering. Therefore, the power factor of the single-crystal sample with 4.0 × 10−4 V2/K2Ωm was higher than that of the polycrystal sample with 3.0 × 10−4 V2/K2Ωm at 500 °C. It is suggested that single crystallization is efficient for improvement of the thermoelectric property in the Ba8AlxSi46−x clathrate.

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Type
Articles
Copyright
Copyright © Materials Research Society 2011
Figure 0

FIG. 1. Schematic of Czochralski (CZ) method.

Figure 1

FIG. 2. Typical photograph of an ingot using CZ method.

Figure 2

FIG. 3. Powder x-ray diffraction patterns of (a) polycrystal, (b) CZ sample, and (c) simulation.

Figure 3

FIG. 4. Orientation imaging microscopy images of (a) polycrystal and (b) CZ sample.

Figure 4

FIG. 5. Backscattered electron image of polycrystal sample.

Figure 5

FIG. 6. Seebeck coefficients of single-crystal and polycrystal samples.

Figure 6

FIG. 7. Electrical resistivity of single-crystal and polycrystal samples.

Figure 7

TABLE I. Chemical compositions of Czochralski (CZ) and polycrystal samples.