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Micrometer-scale synchrotron diffraction mapping analysis of carbide precipitation in deep cryogenically treated low carbon steel

Published online by Cambridge University Press:  18 May 2012

Ning Xu
Affiliation:
Minerals and Materials Science & Technology, Mawson Institute, University of South Australia, Mawson Lakes, South Australia, 5095, Australia
Giuseppe P. Cavallaro
Affiliation:
Minerals and Materials Science & Technology, Mawson Institute, University of South Australia, Mawson Lakes, South Australia, 5095, Australia
Andrea R. Gerson*
Affiliation:
Minerals and Materials Science & Technology, Mawson Institute, University of South Australia, Mawson Lakes, South Australia, 5095, Australia
*
a)Address all correspondence to this author. e-mail: Andrea.Gerson@unisa.edu.au

Abstract

Carbide precipitation within low carbon AISI H13 hot work tool steel that had either been quenched at 80 °C or cryogenically treated at −196 °C prior to tempering has been examined using micrometer-scale synchrotron diffraction mapping. Vanadium-rich cubic M8C7 carbide, lattice parameter of approximately 0.8610 nm, not identifiable using laboratory powder x-ray diffraction (PXRD), was found to be present in all samples. The concentration of this phase was greatest in the rapidly cooled cryogenically treated sample. However, all cryogenic treatments resulted in greater carbide concentrations than in the quenched sample. In addition rapid cryogenic cooling by immersion in liquid nitrogen (N2), as compared with slow cooling to −196 °C over a 3 h duration, results in greater order within the carbide phase subsequent to tempering, as interpreted by analysis of unit cell size variation, and the smallest stress, as interpreted by diffraction peak full width half maximum height distributions.

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Articles
Copyright
Copyright © Materials Research Society 2012
Figure 0

FIG. 1. Laboratory XRD patterns of the four samples. {110} indicates the composite peak of overlapped martensitic peaks 110 and 011; the other three composite peaks {200}, {211} and {220} composed of 200 and 002, 211 and 112, and 220 and 022 respectively. The diffraction patterns are displaced by arbitrarily in the y-axis for clarity.

Figure 1

FIG. 2. An example of a typical microdiffraction diffraction image, from Slow-24-T. Martensitic diffraction rings are indicated.

Figure 2

FIG. 3. Averaged integrated synchrotron microdiffraction x-ray powder diffraction patterns from the tempered samples: (a) Control-T, (b) Fast-24-T, (c) Slow-1-T and (d) Slow-24-T. The diffraction indices for martensite and the carbide phase, M8C7, are shown.

Figure 3

TABLE I. Lattice parameter (a) of the refined cubic unit cell and the corresponding R2 value of each fit.

Figure 4

TABLE II. Relative intensities of seven M8C7 carbide peaks for the four samples.

Figure 5

FIG. 4. $\Delta a/a_0 $ calculated from the 510 diffraction peak of the M8C7 carbide for Control-T (a), Fast-24-T (b), Slow-1-T (c) and Slow-24-T (d) over a 51 × 51 μm area. A common scale for (a) to (d) is provided.

Figure 6

FIG. 5. Distributions of the $\Delta a/a_0 $ calculated from the 332, 510 and 521 M8C7 carbide peaks for the four tempered samples.

Figure 7

FIG. 6. Distributions of the FWHM(Q)/Q values for the 332, 510 and 521 M8C7 carbide diffraction peaks for the four tempered samples.

Figure 8

TABLE III. Statistical data of $\Delta a/a_0 $ (converted from lattice spacing) for the M8C7 carbide unit cell calculated from the different Miller indices for the four tempered samples examined by synchrotron microdiffraction.

Figure 9

TABLE IV. Statistical data of FWHM(Q)/Q for the four tempered samples examined by synchrotron microdiffraction.

Figure 10

TABLE V. Measured and corrected average FWHM(Q) and average Q of the M8C7 carbide peaks for four samples.

Figure 11

FIG. 7. SEM micrograph of the thin foil for the sample Fast-24-T.

Figure 12

FIG. 8. Characteristic EDX spectrum of the carbide inclusion at point F.