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Nanoscale impedance and complex properties in energy-related systems

Published online by Cambridge University Press:  12 July 2012

Wonyoung Lee
Affiliation:
Nuclear Science and Engineering Department, Massachusetts Institute of Technology; leewy@mit.edu
Fritz B. Prinz
Affiliation:
Mechanical Engineering and Materials Science and Engineering Departments, Stanford University; fbp@cdr.stanford.edu
Xi Chen
Affiliation:
Materials Science and Engineering, University of Pennsylvania; xich@seas.upenn.edu
S. Nonnenmann
Affiliation:
Materials Science and Engineering, University of Pennsylvania; ssn@seas.upenn.edu
Dawn A. Bonnell
Affiliation:
Materials Science and Engineering, University of Pennsylvania; bonnell@lrsm.upenn.edu
Ryan P. O’Hayre
Affiliation:
Metallurgical and Materials Engineering, Colorado School of Mines; rohayre@mines.edu

Abstract

Atomic force microscopy (AFM)-based impedance spectroscopy provides localized impedance information of materials and interfaces at the nanoscale by utilizing the conductive AFM tip as a moving electrode to detect current response as a function of time and frequency under controlled environments. This capability enables AFM-based nanoscale impedance measurements to play a unique role in enhancing our understanding of many electronic and electrochemical devices. This article introduces the central concepts of AFM-based impedance measurement and reviews recent examples applying this technique to a variety of functional materials systems, in particular focusing on fuel cells, lithium-ion batteries, photoactive biomembranes, as well as other application examples.

Information

Type
Research Article
Copyright
Copyright © Materials Research Society 2012
Figure 0

Figure 1. Atomic force microscopy (AFM)-based impedance measurements. (a) Schematic example of a typical impedance spectrum. This impedance spectrum shows two distinct semicircular arcs, each of which can often be correlated to specific physical phenomena (such as an electrochemical reaction) or microstructural features (such as interfaces or grain boundaries) in the material. The inset shows the equivalent circuit of the impedance spectrum. Comparison of a (b) two-electrode impedance measurement and (c) AFM-based impedance measurement. Impedance is measured between a local probe (the AFM tip) and a bulk electrode. A significant spreading resistance at the AFM tip-sample contact point ensures local characterization, as shown by the hemispherical lines. Zimag and Zreal are the imaginary and real components, respectively, of the impedance of a system. ZΩ, ZK,I, and ZK,II are the impedances associated with the ohmic process, kinetic process I, and kinetic process II, respectively. RΩ, RK,I, RK,II, CΩ, CK,I, and CK,II are the resistors and capacitors associated with the ohmic process, kinetic process I, and kinetic process II in the equivalent circuit, respectively.

Figure 1

Figure 2. Impedance modulus (top row) and impedance phase (bottom row) images of a Nafion electrolyte membrane. The image sets on the left compare the impedance response under dry (0% relative humidity) versus ambient (30% relative humidity) conditions for a 40 × 40 μm2 area of the Nafion membrane. The image sets on the right compare the impedance response under dry versus ambient humidity conditions for a 1 × 1 μm2 area of the Nafion membrane. Images were acquired at 1 Hz with a 30 mV excitation signal and 0.4 V cathodic bias. The hydration level of the Nafion electrolyte significantly influences its H3O+ concentration and ionic conductivity, as is readily apparent from the impedance images. The distortion apparent in the 1 μm2 images, likely due to drift and tip-water meniscus formation, underscores the limitations of the technique. Reprinted with permission from Reference 10. ©2004, American Institute of Physics.

Figure 2

Figure 3. Localized ac impedance spectroscopy for oxygen reduction kinetics in the Pt/CsHSO4 system. (a) Scanning electron micrograph of a typical CsHSO4 surface acquired after electrochemical testing. (b) Topography scan of the polycrystalline CsHSO4 surface collected at ∼150°C in humidified air (∼0.03 atm H2O). Labels denote nominal positions at which electrochemical measurements were acquired. (c) Semilog plot of cyclic voltammograms (cathodic branch) for Pt/CsHSO4 at select points across the surface shown in (b). Data were acquired with a 25 mV/s scan rate at ∼150°C in humidified air with ∼0.03 atm H2O. (d) Exchange coefficient, α, and exchange current, i0, plotted as functions of position. Parameters were extracted from fitting the linear regime of each curve in (a) to the Tafel equation. In some instances, the error bars for α are smaller than the data markers. Substantial spatial variations in oxygen reduction kinetics, represented by the exchange coefficient, α, and exchange current, i0, show the impact of nanoscale surface features of the polycrystalline electrolyte on the electrochemical reaction rates in the Pt/CsHSO4 system. Reprinted with permission from Reference 24. ©2010, American Chemical Society.

Figure 3

Figure 4. Sequential surface potential maps after a positive bias application (+3 V) in air at (a) 100°C, (b) 150°C, (c) 170°C, and (d) 200°C. The dissipation rate of the features increases with the temperature. Below 100°C, the features remain almost intact, even after 20 min. (e) Profiles across the peak surface potential and Gaussian fittings for 150°C show lateral spreading. (f) Arrhenius plot of log D versus 1000/T, where D is the diffusivity and T is the temperature. Time-resolved measurements at elevated temperatures with spatial information provide a method of exploring the charge transfer rate, or diffusivity, on solid oxide surfaces. Data from References 26–28 were replotted for comparisons after conversion into diffusivity. Reprinted with permission from Reference 25. ©2009, IOP Publishing Ltd.

Figure 4

Figure 5. Nanoscale ac impedance measurements using atomic force microscopy (AFM) on polymer electrolyte films. (a) AFM images of polymer electrolyte films consisting of Li triflate dissolved in poly(ethylene) oxide (PEO) films at four different locations on the sample. (b) Corresponding impedance data for the images shown in (a). Zreal and Zimag are the real and imaginary components, respectively. (c) AFM image of a PEO coated polycarbonate membrane. The inset in the upper right corner is an image of the uncoated membrane. (d) Corresponding impedance data for images shown in (c). The plots in (d) labeled as (2) consist of data for four overlapping points probed within the area of image (c). Localized ac impedance measurements demonstrate the heterogeneity in conductivity, which may be attributed to the degree of crystallinity and inhomogeneous distribution of the conducting salt during film growth. The scan area for all images in (a) are 3.8 × 3.8 μm2. Image (c) is 6.8 × 6.8 μm2. The inset in (c) is to scale. Reprinted with permission from Reference 33. ©2003, Elsevier.

Figure 5

Figure 6. Nanoscale ion conductance measurements on a tin thin film on a copper thin film on glass. (a,c) topography and (b,d) dc current images of a 60-nm-thick tin thin film deposited on a 60-nm-thick copper thin film on glass (a,b) before lithiation and (c,d) after 24 μAhcm2 lithiation. Extracted profiles averaged over 8 pixels wide from (c) and (d) for the (e) green line and (f) yellow line. Extracted profile from the yellow lines demonstrates a current drop around the topographically protruding feature, which suggests a solid electrolyte interface (SEI) that creates a barrier to ionic current slowing the lithium insertion at these regions, while inducing lithium ions to enter the protruding regions at a higher rate. In addition, the extracted profile along the yellow line shows that topographically protruding features do not necessarily correlate with the current increase. The feature indicated by the black arrow has a similar height to the other protruding features, but the current is similar to the background, suggesting that the film growth can eventually block the tin electrode underneath, and the electrolyte loses the access to the electrode. This measurement provided a nanoscale picture of catalytic decomposition of the electrolyte where an SEI is observed to form around electrode regions that rapidly grow during lithiation. The two white arrows in (a–d) indicate the same features on the film to verify the same scan area. Reprinted with permission from Reference 38. ©2011, Wiley-VCH.

Figure 6

Figure 7. Atomic force microscopy (AFM) images on the LiMn2O4 surface taken at the bias voltage of (a) 0 V, (b) 5.5 V, (c) 6.5 V, and (d) 7.5 V. (e) Variation in area of the grains 1, 2, and 3. (f) Root-mean-squared roughness (rms) of the grains 1, 2, and 3. (g) Bias voltage dependence of the tip current measured at each point that the AFM tip passed through while scanning the 3.5 × 3.5 μm2 area on the spinel LiMn2O4 surface. The labels correspond to (b–d). The changes in morphology and current are induced by the extraction of Li+ ions from the tetrahedral sites by the tip voltage. This behavior can be ascribed to a relaxation of the Jahn–Teller phase transition. Reprinted with permission from Reference 39. ©2007, Elsevier.

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Figure 8. Experimental configuration for characterizing properties of optically active synthetic proteins. (a–b) a-helices assemble on the substrate due to amphiphilic interactions. Blue indicates hydrophilic domains; orange indicates hydrophobic domains. His refers to histadine positions on the helix. (c) Idealized protein-electrode junction device configuration. The substrate is highly oriented pyroclinic graphite. The patterned proteins are oriented perpendicular to the underlying substrate. A 425 nm LED (blue) is directed at the tip-sample junction. Atomic force microscopy images of proteins patterned on an electrode: (d) topography, (e) zoomed in area of box in (d), (f) x-component of impedance of area in (e), and (g) y-component of impedance in (e). For (f) and (g), the z-range = 125 mV; for (d), the height z-range = 90 nm; and for (e), the height z-range = 40 nm; for (d) and (e), 70 kHz, 0.5 V applied signal. Effect of optical illumination on the resistance (h) and capacitance (i) of a protein monolayer illustrated as 2D and 3D histograms of the properties. The top 3D histograms in the insets are with illumination, the bottom without illumination. Red curves in the 2D histograms are with illumination, black curves are without exposure; λ = 425 nm. The difference in the capacitance can be quantitatively related to the polarization volume, therefore, this result determines the difference in ground state and excited state polarizations on a single molecular layer. The protein retains its functionality when under ambient conditions and attached to an electrode. Reprinted with permission from Reference 42. ©2011, American Chemical Society.