Hostname: page-component-74656f9884-8r8nv Total loading time: 0 Render date: 2026-11-08T01:57:17.831Z Has data issue: false hasContentIssue false

Vacuum brazing of TC4 alloy to AlMgB14–TiB2 ceramic using AgCu filler

Published online by Cambridge University Press:  07 May 2019

Shengpeng Hu
Affiliation:
State Key Laboratory of Advanced Welding and Joining, Harbin Institute of Technology, Harbin 150001, China; and Shandong Provincial Key Laboratory of Special Welding Technology, Harbin Institute of Technology at Weihai, Weihai 264209, China
Yu Lei
Affiliation:
State Key Laboratory of Advanced Welding and Joining, Harbin Institute of Technology, Harbin 150001, China; and Shandong Provincial Key Laboratory of Special Welding Technology, Harbin Institute of Technology at Weihai, Weihai 264209, China
Xiaoguo Song*
Affiliation:
State Key Laboratory of Advanced Welding and Joining, Harbin Institute of Technology, Harbin 150001, China; and Shandong Provincial Key Laboratory of Special Welding Technology, Harbin Institute of Technology at Weihai, Weihai 264209, China
Wei Fu
Affiliation:
State Key Laboratory of Advanced Welding and Joining, Harbin Institute of Technology, Harbin 150001, China
Yun Luo
Affiliation:
Shandong Provincial Key Laboratory of Special Welding Technology, Harbin Institute of Technology at Weihai, Weihai 264209, China
Yuzhen Lei
Affiliation:
Shandong Provincial Key Laboratory of Special Welding Technology, Harbin Institute of Technology at Weihai, Weihai 264209, China
*
a)Address all correspondence to this author. e-mail: xgsong@hitwh.edu.cn

Abstract

AlMgB14–TiB2 ceramic was successfully brazed to TC4 alloy with inactive AgCu filler alloy. X-ray diffractometer, SEM, and energy-dispersive spectrometer were used to study interfacial microstructure and shear strength of the joints under different brazing temperatures. The results indicated that the typical microstructure of the TC4/AlMgB14–TiB2 joint was TC4/Ti(s.s) + Ti2Cu/Ti2Cu/TiCu/TiCu2Al/Ag(s.s) + Cu(s.s)/TiB whiskers/TiB2 reaction layer/AMBT. By increasing the brazing temperature, the thickness of the TC4 diffusion layer was improved, whereas that of the brazing seam decreased remarkably. When the brazing temperature was increased to 880 °C, the brazing seam was composed of Ti–Cu intermetallic Ag(s.s) with a few Cu(s.s), TiCu2Al distributed. Meanwhile, the formation of a continuous TiB2 reaction layer at the interface of the AMBT and brazing filler facilitated the improvement of joint shear strength. The joint with the maximum shear strength of 46.7 MPa was obtained while brazing at 880 °C for 10 min.

Information

Type
Article
Copyright
Copyright © Materials Research Society 2019 
Figure 0

Figure 1: Typical microstructure and corresponding element distribution images of the TC4/AMBT joint brazed with AgCu filler at 910 °C for 10 min: (a) microstructure; (b–g) element map distributions of Mg, Al, Ti, Ag, B, and Cu.

Figure 1

Figure 2: High magnification BSE images of the interfacial microstructure of the TC4/AMBT joint: (a) TC4–braze alloy interface; (b) braze alloy–AMBT interface.

Figure 2

TABLE I: Chemical compositions (at.%) and possible phases of each spot marked in Fig. 4.

Figure 3

Figure 3: XRD pattern of the reaction layer adjacent to AMBT.

Figure 4

Figure 4: EDS analysis of the reaction layer of the joint brazed at 880 °C: (a) microstructural morphology of the TC4/AMBT joint and line scanning result of the reaction; (b) EDS pattern of marked point H.

Figure 5

Figure 5: Elemental distribution of the enclosed rectangle region in Fig. 4(a). (a) Al; (b) Mg; (c) Al; (d) B; (e) Ti; (f) Cu.

Figure 6

Figure 6: Microstructures of the TC4/AMBT joints brazed at different temperatures for 10 min: (a) 820 °C; (b) 850 °C; (c) 880 °C; and (d) 910 °C.

Figure 7

Figure 7: Effect of brazing temperature on the shear strength of TC4/AMBT joints brazed for 10 min.

Figure 8

Figure 8: Fracture morphologies of TC4/AMBT joints brazed at different temperatures for 10 min: (a) 820 °C; (b) 880 °C.

Figure 9

Figure 9: Characterization of the AMBT sample: (a) secondary electron image; (b) XRD diffraction pattern.