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Noise performance comparison between two different types of time-domain systems for microwave detection

Published online by Cambridge University Press:  27 April 2016

Xuezhi Zeng*
Affiliation:
Department of Signals and Systems, Chalmers University of Technology, 412 96 Gothenburg, Sweden. Phone: +46 031 772 1613
Albert Monteith
Affiliation:
Department of Earth and Space Sciences, Chalmers University of Technology, 412 96 Gothenburg, Sweden
Andreas Fhager
Affiliation:
Department of Signals and Systems, Chalmers University of Technology, 412 96 Gothenburg, Sweden. Phone: +46 031 772 1613
Mikael Persson
Affiliation:
Department of Signals and Systems, Chalmers University of Technology, 412 96 Gothenburg, Sweden. Phone: +46 031 772 1613
Herbert Zirath
Affiliation:
Department of Microtechnology and Nanoscience, Chalmers University of Technology, 412 96 Gothenburg, Sweden
*
Corresponding author:X. Zeng, Email: xuezhi@chalmers.se
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Abstract

This paper compares the noise performance of two different types of time-domain microwave detection systems: a pulsed system and a pseudo-random noise sequence system. System-level simulations and laboratory-based measurements are carried out in the study. Results show that the effect of timing jitter is more significant on the measurement accuracy of the pseudo-random noise sequence system than that of the pulsed system. Although the signal power density of the pseudo-random sequence system is tens of dBs higher than that of the pulsed system over the frequency band of interest, the signal-to-noise ratio difference between these two systems can be just a few dBs or even smaller depending on the jitter level.

Information

Type
Research Papers
Copyright
Copyright © Cambridge University Press and the European Microwave Association 2016 
Figure 0

Fig. 1. The waveforms and frequency spectra of the stimulus signals in the pulsed system (left) and the PN sequence system (right).

Figure 1

Table 1. List of simulation parameters.

Figure 2

Fig. 2. SNRs due to timing jitter obtained in (a) the PN sequence system and (b) the pulsed system when voltage noise was not considered.

Figure 3

Fig. 3. SNRs of the PN sequence system due to different levels of timing jitter when the voltage noise is (a) 0.5 mV rms and (b) 2 mV rms.

Figure 4

Fig. 4. SNRs of the pulsed system due to different levels of timing jitter when the voltage noise is (a) 0.5 mV rms and (b) 2 mV rms.

Figure 5

Fig. 5. SNRs of the −20 dBFS signals in (a) the PN sequence system and (b) the pulsed system when the voltage noise is 0.5 mV rms.

Figure 6

Fig. 6. The measurement setup of (a) the PN sequence system and (b) the pulsed system.

Figure 7

Fig. 7. The systems’ (a) signal and noise spectra and (b) SNRs when the test signal is 600 mV peak-to-peak.

Figure 8

Fig. 8. The systems’ (a) signal and noise spectra and (b) SNRs when the test signal is 100 mV peak-to-peak.