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Synthesis and microstructure of electrodeposited and sputtered nanotwinned face-centered-cubic metals

Published online by Cambridge University Press:  06 April 2016

Daniel C. Bufford
Affiliation:
Radiation-Solid Interactions Department, Sandia National Laboratories, USA; dcbuffo@sandia.gov
Y. Morris Wang
Affiliation:
Lawrence Livermore National Laboratory, USA; wang35@llnl.gov
Yue Liu
Affiliation:
Materials Science and Technology Division, Los Alamos National Laboratory, USA; yueliu@lanl.gov
Lei Lu
Affiliation:
Institute of Metal Research, Chinese Academy of Sciences, China; llu@imr.ac.cn

Abstract

The remarkable properties of nanotwinned (NT) face-centered-cubic (fcc) metals arise directly from twin boundaries, the structures of which can be initially determined by growth twinning during the deposition process. Understanding the synthesis process and its relation to the resulting microstructure, and ultimately to material properties, is key to understanding and utilizing these materials. This article presents recent studies on electrodeposition and sputtering methods that produce a high density of nanoscale growth twins in fcc metals. Nanoscale growth twins tend to form spontaneously in monolithic and alloyed fcc metals with lower stacking-fault energies, while engineered approaches are necessary for fcc metals with higher stacking-fault energies. Growth defects and other microstructural features that influence nanotwin behavior and stability are introduced here, and future challenges in fabricating NT materials are highlighted.

Information

Type
Research Article
Copyright
Copyright © Materials Research Society 2016 
Figure 0

Table I. Summary of nanotwinned face-centered-cubic (fcc) metal parameters (ordered by increasing stacking-fault energy, γsf).

Figure 1

Figure 1. Transmission electron microscope micrographs (TEM) of nanotwinned (NT) microstructures resulting from different deposition methods and parameters. Note: GD, growth direction. (a) Columnar-grained polycrystalline NT Cu formed by direct-current electrodeposition.14 (b) Equiaxed-polycrystalline NT Cu formed by pulsed electrodeposition.3 (c) Sputtered columnar-grained polycrystalline NT Ag.24 (d) Sputtered columnar-grained 330 stainless steel. Reproduced with permission from Reference 31. © 2005 American Institute of Physics. (e) Coherent-twin boundary (CTB) propagation across fully coherent interfaces in Ag/Al multilayer films.32 (f) Inclined misfit stacking faults in Cu/Co multilayer films.

Figure 2

Figure 2. Example of twin- and grain-boundary (GB) structures in Cu. (a) Coherent twin boundary (CTB) and incoherent twin boundary (ITB) structures revealed by inverse pole figure orientation mapping in the transmission electron microscope (TEM). Color scheme: Σ3 boundaries in red; high-angle GBs in black; low-angle GBs in yellow. Image credit: T. LaGrange (Lawrence Livermore National Laboratory). (b) TEM micrograph of CTB-ITB junctions in nanotwinned (NT) Cu. Reproduced with permission from Reference 50. © 2009 American Institute of Physics. (c) Defect structures (i.e., kinks) observed on CTBs. White arrows indicate several kinks.52 (d) High-resolution TEM image showing faceted GBs in an equiaxed–polycrystalline NT Cu sample. (Courtesy of N. Lu.)