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X-ray diffraction characterization of a distorted Debye–Scherrer film strip – the effect of deacetylation on cellulose triacetate and an improved structural model for cellulose II

Published online by Cambridge University Press:  09 April 2014

T. N. Blanton*
Affiliation:
International Centre for Diffraction Data, Newtown Square, Pennsylvania 19073
J. A. Kaduk
Affiliation:
Illinois Institute of Technology, Chicago, Illinois 60616
Q. Johnson
Affiliation:
Materials Data Incorporated, Livermore, California 94550
*
a)Author to whom correspondence should be addressed. Electronic mail: tblanton@icdd.com

Abstract

A Debye–Scherrer film that had been stored for several years in an office environment file cabinet was observed to be shriveled and distorted in appearance. An investigation using X-ray diffraction was carried out to determine the cause of the physical change in the film strip. As expected, silver phases were detected, due to the photographic capture layer coated on the surface of all traditional X-ray films. An unexpected result was the presence of cellulose II, an indication that a chemical change had occurred in the original cellulose triacetate (CTA) polymer film base. Laboratory experiments used to demonstrate an accelerated method of deacetylation of CTA were carried out, resulting in phase pure cellulose II. A density functional geometry optimization allowed for the generation of an improved structural model for cellulose II. Calculated and experimental powder patterns for cellulose II have been submitted to the International Centre for Diffraction Data for inclusion in future releases of the Powder Diffraction File.

Information

Type
Technical Articles
Copyright
Copyright © International Centre for Diffraction Data 2014 
Figure 0

Figure 1. Base molecular structure for cellulosic materials. Cellulose when R = H, cellulose acetate when R = CH3CO (monoacetate DS = 1, diacetate DS = 2, and triacetate DS = 3).

Figure 1

Figure 2. (a) Processed Debye–Scherrer X-ray film strip (PET base) – normal. (b) Processed Debye–Scherrer film strip analyzed in this study – distorted. (Color online)

Figure 2

Figure 3. XRD pattern for the specimen collected from the distorted processed Debye–Scherrer film and analyzed in this study. (Color online)

Figure 3

Figure 4. XRD patterns for powder samples of (a) neat CTA (semicrystalline Type II) and (b) cellulose II after NH4OH treatment. The inset in Figure 4(b) is a scanning electron micrograph (SEM) of the cellulose II powder. (Color online)

Figure 4

Figure 5. Observed (red+), calculated (green−), and difference (purple−) patterns from the Rietveld refinement used to determine the lattice parameters of cellulose II. The inset shows the crystal structure of cellulose II, viewed down the c-axis. (Color online)

Figure 5

Figure 6. ICDD PDF4+ Release 2013 cellulose II diffraction data for phase identification and display options available, allowing for detailed materials characterization. (Color online)