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Composition-dependent hardness and Young’s modulus in fcc Ni–X (X = Rh, Ta, W, Re, Os, and Ir) alloys: Experimental measurements and CALPHAD modeling

Published online by Cambridge University Press:  16 July 2019

Juan Chen*
Affiliation:
Testing Center, Yangzhou University, Yangzhou 225009, People’s Republic of China; and School of Chemistry and Chemical Engineering, Yangzhou University, Yangzhou 225009, China
Lijun Zhang*
Affiliation:
State Key Laboratory of Powder Metallurgy, Central South University, Changsha, Hunan 410083, People’s Republic of China
*
a)Address all correspondence to these authors. e-mail: jchenyzu@yzu.edu.cn

Abstract

In this paper, the hardness and Young’s moduli along the diffusion paths in fcc Ni–X (X = Rh, Ta, W, Re, Os, and Ir) binary diffusion couples were measured by using the nanoindentation technique. Hardness increases gradually from the pure Ni to the fcc Ni–X alloys, except for the Ni–Os system. While the Young’ moduli in fcc Ni–X alloys scatter much larger and do not show noticeable variation with the addition of element X. After that, the CALPHAD models for description of the composition-dependent hardness and Young’s modulus were proposed, and an in-house code was developed. Based on the present experimental data, the CALPHAD-type descriptions for hardness and Young’s modulus in fcc Ni–X (X = Rh, Ta, W, Re, Os, and Ir) systems were obtained. The model-predicted hardness and Young’s moduli of composition dependence agree with the experimental data in general. It is anticipated that the presently obtained CALPHAD-type hardness and Young’s modulus descriptions, together with the previous thermodynamic and atomic mobility databases, can be used for the future alloy design of novel Ni-based superalloys.

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Article
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Copyright © Materials Research Society 2019 
Figure 0

Figure 1: (a–f) Calculated phase diagrams of binary Ni–X (X = Rh, Ta, W, Re, Os, and Ir) systems according to the thermodynamic descriptions by Refs. 10, 23–26.

Figure 1

Figure 2: Backscattered electronic image of indentation along the diffusion path of Ni/Ni–25.0 wt% W diffusion couple annealed at 1523 K.

Figure 2

Figure 3: Concentration profiles and hardness along the diffusion paths of (a) Ni/Ni–Rh, (b) Ni/Ni–Ta, (c) Ni/Ni–W, (d) Ni/Ni–Re, (e) Ni/Ni–Os, and (f) Ni/Ni–Ir diffusion couples annealed at 1473–1623 K.

Figure 3

Figure 4: Concentration profiles and Young’s moduli along the diffusion paths of (a) Ni/Ni–Rh, (b) Ni/Ni–Ta, (c) Ni/Ni–W, (d) Ni/Ni–Re, (e) Ni/Ni–Os, and (f) Ni/Ni–Ir diffusion couples annealed at 1473–1623 K.

Figure 4

Figure 5: Model-predicted composition-dependent hardness of (a) Ni/Ni–Rh, (b) Ni/Ni–Ta, (c) Ni/Ni–W, (d) Ni/Ni–Re, (e) Ni/Ni–Os, and (f) Ni/Ni–Ir diffusion couples, compared with the experimental data in the present work.

Figure 5

Figure 6: Model-predicted composition-dependent Young’s modulus of (a) Ni/Ni–Rh, (b) Ni/Ni–Ta, (c) Ni/Ni–W, (d) Ni/Ni–Re, (e) Ni/Ni–Os, and (f) Ni/Ni–Ir diffusion couples, compared with the experimental data in the present work and Ref. 54.

Figure 6

TABLE I: Summary of hardness and Young’s moduli of stable fcc pure elements (i.e., Ni, Rh, and Ir) available in the literature and those measured in the present work.

Figure 7

TABLE II: Summary of the finally obtained end members and interaction parameters to describe the hardness of fcc Ni–X (X = Rh, Ta, W, Re, Os, and Ir) alloys.

Figure 8

TABLE III: Summary of the finally obtained end members and interaction parameters to describe the Young’s modulus of fcc Ni–X (X = Rh, Ta, W, Re, Os, and Ir) alloys.

Figure 9

TABLE IV: List of terminal compositions of the diffusion couples in the present work.