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Electrochemical strain microscopy: Probing ionic and electrochemical phenomena in solids at the nanometer level

Published online by Cambridge University Press:  12 July 2012

Stephen Jesse
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, TN; sjesse@ornl.gov
Amit Kumar
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, TN; ka7@ornl.gov
Thomas M. Arruda
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, TN; arrudatm@ornl.gov
Yunseok Kim
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, TN; kimy4@ornl.gov
Sergei V. Kalinin
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, TN; sergei2@ornl.gov
Francesco Ciucci
Affiliation:
Hong Kong University of Science and Technology; mefrank@ust.hk

Abstract

Atomistic and nanometer scale mechanisms of electrochemical reactions and ionic flows in solids in the nanometer–micron range persist as terra incognito in modern science. While structural and electronic phenomena are now accessible to electron and scanning probe microscopy (SPM) techniques, probing nanoscale electrochemistry requires the capability to probe local ionic currents. Here, we discuss principles and applications of electrochemical strain microscopy (ESM), a technique based on probing minute deformations induced by electric bias applied to an SPM tip. ESM imaging and spectroscopy are illustrated for several energy storage and conversion materials. We further argue that down-scaling of physical device structures based on oxides necessitates ionic and electrochemical effects to be taken into account. Future pathways for ESM development are discussed.

Information

Type
Research Article
Copyright
Copyright © Materials Research Society 2012
Figure 0

Figure 1. In electrochemical strain microscopy (ESM), a biased atomic force microscopy tip is brought into contact with an ionically conductive material. The concentrated field at the tip induces ion redistribution, which in turn results in material strain and surface deformation. The latter is detected as vertical tip displacement. Shown schematically is (a) an accumulation of negative species and (b) positive species during application of positive and negative tip bias, respectively. (c) The spectrum of possible electrochemical and ionic phenomena as a function of bias (V) and temperature (T) that can be explored by ESM.

Figure 1

Figure 2. Electrochemical strain microscopy (ESM) study of an LiCoO2 thin film. (a) Topography of the LiCoO2 thin-film surface (deflection signal). (b) Variation of contact resonance peaks across a single line scan on the sample. (c) Extracted resonance peak amplitude and resonance frequency as a function of position from (b). (d) Map of ESM signal (amplitude of contact resonance peak) for the area shown in (a). (e) Map of contact resonance frequency for the area shown in (a). Adapted with permission from Reference 72. ©2011, Elsevier.

Figure 2

Figure 3. Electrochemical strain microscopy (ESM) study of a Si anode of a thin-film Li-ion battery. (a) Topography of the Si anode (deflection signal). (b) Extracted ESM voltage spectroscopy loops as functions of envelope voltage Vf measured at the grain boundary-like feature. (c) Loop opening as a function of envelope voltage Vf with linear fit from four different locations, labeled a–d, in (d). (d) Slope and (e) intercept parameter maps for the area shown in (a). Note that a hysteresis loop family similar to that in (b) is obtained at each point of the 100 × 100 pixel grid in (a), giving rise to a 30 Gb data set. This data set, however, can be reduced to two 2D maps indicating the rate (d) and onset bias (e) for ion motion. Adapted with permission from Reference 54. ©2010, American Chemical Society.

Figure 3

Figure 4. Electrochemical strain microscopy (ESM) mapping of Pt nanoparticles on YSZ. (a) Topography (300 × 300 nm) of Pt nanoparticles deposited on YSZ with a map of the measured area within ESM hysteresis loops overlaid on the 3D surface morphology. (b) Average hysteresis loops from selected regions of the map. Local enhancement of electrochemical activity and the triple phase boundary (TPB) between the substrate, Pt, and air is clearly seen. Adapted with permission from Reference 51. ©2011, Nature Publishing Group.

Figure 4

Figure 5. (a) Schematic illustration of Li particle growth below the tip. (b) Evolution of the electrochemical strain microscopy signal during bias sweep. The jump in resonance frequency corresponds to the nucleation event. (c) Plot of bias applied to the tip versus time. (d) Surface topography (25 × 25 μm) of Li-nanoparticles deposited on the Li-conducting glass ceramic surface as a function of bias amplitude. (e) Correlation between particle volume and amount of transferred charge, corresponding to the near-unity transference number. (f) Current–voltage and (g) height–voltage curves measured during single particle growth. Note the presence of an anodic peak, indicative of partial reversibility of the process. The presence of an anodic peak in the I–V curve is always associated with a reduction in the height of the particle, in agreement with partial reversibility of the process. Note: N, number of Li atoms extracted. Adapted with permission from Reference 62. ©2011, American Chemical Society.

Figure 5

Figure 6. Ionic motion can lead to new functionality and couplings in multiferroics. (a) Fiebig-Spaldin diagram showing the inter-relationship of the electric field E, magnetic field H, and stress σ controlling the electric polarization P, magnetization M, and strain ε, in multiferroics. (b) The physics of multiferroics can change dramatically when mobile ionic species are considered, which adds a new dimension to the physics. μ is chemical potential, and c is concentration. The base of the tetrahedron in (b) is equivalent to (a). Adapted with permission from Reference 70. ©2005, American Association for the Advancement of Science.