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Migration of point defects and a defect pair in zinc oxide using the dimer method

Published online by Cambridge University Press:  25 May 2012

Dong Chen
Affiliation:
Department of Physics and Electronics, Institute of Photo-biophysics, Henan University, Kaifeng 475004, China
Fei Gao*
Affiliation:
Pacific Northwest National Laboratory, Richland, Washington 99352
Mingdong Dong
Affiliation:
Interdisciplinary Nanoscience Center (iNANO), University of Aarhus, Ny Munkegade, DK-8000, Aarhus C, Denmark
Bo Liu*
Affiliation:
Department of Physics and Electronics, Institute of Photo-biophysics, Henan University, Kaifeng 475004, China
*
a)Address all correspondence to these author. e-mail: fei.gao@pnl.gov,

Abstract

The migration mechanism and the minimum energy path of vacancies, interstitials, and an interstitial–vacancy pair in zinc oxide have been studied by the dimer method. The in-plane and out-of-plane migrations of zinc and oxygen vacancies are anisotropic. The kick-out mechanism is energetically preferred to zinc and oxygen interstitials that can easily migrate through the ZnO crystal lattice. In addition, the migration process of an interstitial–vacancy pair as a complex of an octahedral oxygen interstitial and a zinc vacancy is dominated by an oxygen interstitial/zinc vacancy successive migration. The energy barriers indicate that the existence of oxygen interstitial in the defect pair can promote the mobility of zinc vacancy, whereas the migration of oxygen interstitial is slowed down due to the presence of zinc vacancy. In the end, we show a possible migration path of the interstitial–vacancy pair that can be dissociated through a set of displacement movements.

Information

Type
Articles
Copyright
Copyright © Materials Research Society 2012
Figure 0

FIG. 1.Migration paths and calculated energy paths that correspond to this migration process of a zinc vacancy. (a) Starting configuration, (b) and (b′) two possible final configurations, and (c) calculated energy barriers corresponding to path 1 (a→b) and path 2 (a→b′). The red and light purple spheres represent the O atoms and Zn atoms, respectively. Also the dotted light purple circle indicates the zinc vacancy. Upper panels show top views, while lower panels show side views. Side views are perpendicular to the $ \lt 0001 \!\!> $ direction and top views are along the $ \lt 000\bar1 \!\!> $ direction. In the first frame, the respective paths are labeled. The arrow indicates the vacancy movement at the next step.

Figure 1

FIG. 2.Migration paths and calculated energy paths of an oxygen vacancy. (a) Starting configuration, (b) and (b′) two possible final configurations, and (c) calculated energy barriers corresponding to path 1 (a→b) and path 2 (a→b′). The dotted red circle indicates the oxygen vacancy.

Figure 2

FIG. 3.The kick-out migration mechanism and the MEP of a zinc interstitial. (a) Starting configuration, (b) saddle point, (c) final configuration where a new zinc interstitial is formed in an adjacent basal plane, and (d) the calculated energy barrier. To easily follow the interstitial movements, we use the blue sphere to represent the initial zinc interstitial.

Figure 3

FIG. 4.Migration paths and the corresponding energy paths of an oxygen interstitial. (a) Starting configuration, (b′) and (b′′) saddle points, (c), (c′), and (c′′) final configurations, and (d) the calculated energy barriers along path 1 (a→c), path 2 (a→b′→c′), and path 3(a→b′′→c′′). The transition to the nonsymmetric configuration requires the lowest energy barrier. The green sphere represents the initial oxygen interstitial.

Figure 4

FIG. 5.The first step of four possible migration processes and the MEPs for an IO–VZn pair consisting of an O interstitial (green atom) and a Zn vacancy (the dotted light purple circle). Path 1 (a→b→c) and path 3 (a→b′′→c′′) show the migrations of the VZn in the IO–VZn pair. Path 2 (a→b′→c′) and path 4 (a→b′′′→c′′′) illustrate the migrations of the IO in the IO–VZn pair. (d) The calculated energy paths along path 1, path 2, path 3, path 4, and path 5. Also, path 5 in (d) corresponds to the energy barrier for the first step of the multistep migration process in Fig. 6. Upper panels show top views, while lower panels show side views. In the first frame, the respective paths are labeled.

Figure 5

FIG. 6.The multistep migration process of an IO–VZn pair. Lower right panel shows the migration energy path of the IO–VZn pair, where the migration process from c→e leads to the highest energy barrier. The black arrows in (a) and (c) indicate the defect movements in the next frame.