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Analysis of the electromagnetic wave illumination on the transmission lines with nonlinear terminations

Published online by Cambridge University Press:  08 March 2021

Z. Seifi
Affiliation:
Department of Electrical Engineering, Amirkabir University of Technology, Hafez Ave., Tehran, Iran
A. Ghorbani*
Affiliation:
Department of Electrical Engineering, Amirkabir University of Technology, Hafez Ave., Tehran, Iran
A. Abdipour
Affiliation:
Department of Electrical Engineering, Amirkabir University of Technology, Hafez Ave., Tehran, Iran
*
Author for correspondence: A. Ghorbani, E-mail: ghorbani@aut.ac.ir
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Abstract

In this paper, an unconditionally stable time-domain method is proposed to investigate the external electromagnetic (EM) field illumination on the nonlinearly loaded transmission lines. In the proposed algorithm, the field to line coupling equations and linear/nonlinear boundary conditions are incorporated and expressed in a matrix form. The derived differential matrix equations are then discretized and solved using the proposed finite difference time domain (FDTD) method approach. The discretized nonlinear matrix equations are also solved by applying a globally convergent iterative method to ensure the stability of the method. Moreover, the experimental investigations are conducted using a transverse EM (TEM) cell for a single microstrip line and a power detector circuit as a nonlinearly loaded transmission line to confirm the accuracy and stability of the proposed method. With the merit of satisfactory accuracy and unconditional stability for the entire range of time steps, the presented approach would be applicable for analyzing the microwave linear/nonlinear circuits subjected to the external incident EM wave.

Information

Type
Electromagnetic Compatibility
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press in association with the European Microwave Association
Figure 0

Fig. 1. Modeling of a TL with a conductor at height d placed above a ground plane, which is illuminated by the external incident uniform EM wave with the propagation vector of $\vec{k}$, incidence angles of θE and φE, and the polarization angle of ϕ. The per-unit-length inductance, resistance, capacitance, and conductance of the line are denoted by l, r, c, and g, respectively. Also, VE and IE are the per-unit-length induced sources due to the EM excitation field, and V(x, t) and I(x, t) denote the line voltage and current, respectively, as a function of position (x) and time (t).

Figure 1

Fig. 2. Illumination of the incident EM wave to a TL terminated with the linear load.

Figure 2

Fig. 3. (a) Illumination of the incident EM wave to a TL terminated with a diode. (b) The schematic diagram of the large-signal circuit model of the Schottky diode.

Figure 3

Table 1. Model parameters of the diode SMS7621-001LF.

Figure 4

Fig. 4. The real photo of (a) the single microstrip line and (b) the power detector circuit implemented on the RO4003 substrate.

Figure 5

Fig. 5. (a) Photograph of the fabricated TEM cell. (b) Radiated susceptibility measurement setup.

Figure 6

Fig. 6. The spectral radius of the amplification matrix of the proposed FDTD method for different values of α.

Figure 7

Fig. 7. The maximum percentage error between the proposed method results and the exact solution for the linearly loaded line versus the time step for different values of α.

Figure 8

Table 2. Comparison of the spectral radius of the square matrix $\bar{{\bf \Phi }}$ and computational time of the conventional explicit FDTD approach and the proposed algorithm.

Figure 9

Fig. 8. The magnitude of the induced (a) voltage and (b) current distributions on the single microstrip line for endfire illumination at 1.3 GHz and electric-field amplitude 100 V/m.

Figure 10

Fig. 9. Measured and simulated results for the induced output terminal voltage of a single microstrip line versus the incident electric field amplitude for broadside illumination at 1.3 GHz.

Figure 11

Fig. 10. (a) The schematic diagram and (b) the PCB layout of the fabricated power detector circuit.

Figure 12

Table 3. Parameters of the fabricated power detector circuit.

Figure 13

Fig. 11. Time-domain waveforms of (a) the output voltage, (b) diode current, and (c) diode internal junction voltage of the power detector circuit, which is excited by −1 dBm CW source at 1 GHz as well as the incident plane wave illumination at 1.1 GHz.

Figure 14

Fig. 12. The measured and proposed method results for the detected DC output voltage versus the input power of the detector circuit, which is excited by the CW source at 1 GHz and the incident plane wave illumination at 1.1 GHz.

Figure 15

Fig. 13. The simulation time and error of the proposed FDTD method for analyzing the diode detector circuit versus the parameter α.