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Study of the noise processes in microwave oscillators based on passive optical resonators

Published online by Cambridge University Press:  23 April 2013

Khaldoun Saleh*
Affiliation:
CNRS, LAAS, Université de Toulouse, 7 Avenue du Colonel Roche, F-31077, France. Phone: +33 5 6133 6879 CNES, 18 Avenue Edouard Belin, Toulouse F-31401, France
Pierre-Henri Merrer
Affiliation:
CNRS, LAAS, Université de Toulouse, 7 Avenue du Colonel Roche, F-31077, France. Phone: +33 5 6133 6879
Amel Ali-Slimane
Affiliation:
CNRS, LAAS, Université de Toulouse, 7 Avenue du Colonel Roche, F-31077, France. Phone: +33 5 6133 6879
Olivier Llopis
Affiliation:
CNRS, LAAS, Université de Toulouse, 7 Avenue du Colonel Roche, F-31077, France. Phone: +33 5 6133 6879
Gilles Cibiel
Affiliation:
CNES, 18 Avenue Edouard Belin, Toulouse F-31401, France
*
Corresponding author: K. Saleh Email: ksaleh@laas.fr
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Abstract

Two types of optoelectronic oscillators delivering high spectral purity microwave signals are presented in this paper. These oscillators use the Pound–Drever–Hall laser stabilization technique to lock the laser carrier onto two different types of passive optical resonators featuring high-quality factors: a fiber ring resonator (FRR) and a whispering gallery mode monocrystalline disk-shaped micro-resonator. The different noise processes occurring inside these oscillators are discussed. Particular attention is given to the conversion of the laser's amplitude and frequency noise into RF phase noise via the laser stabilization loop and the resonator, and via the photodetector nonlinearity as well. A modeling approach using CAD software is also proposed to qualitatively evaluate laser noise conversion through the optical resonator. Moreover, different contributions of nonlinear optical scattering noise are discussed, mainly in the case of the FRR-based oscillator. When controlling these nonlinear optical effects in the case of the FRR, low-phase noise operation of the oscillator has been achieved, with a −40 dBc/Hz noise level at 10 Hz offset frequency from a 10.2 GHz RF carrier.

Information

Type
Research Papers
Copyright
Copyright © Cambridge University Press and the European Microwave Association 2013 
Figure 0

Fig. 1. Illustration of microwave filtering using an optical frequency comb generated by an optical resonator.

Figure 1

Fig. 2. OEO setup based on a low-frequency (LF) PDH loop to stabilize the laser onto the resonator and a high-frequency (HF) loop to maintain the microwave oscillation; PDH: Pound–Drever–Hall, MZM: Mach–Zehnder modulator.

Figure 2

Fig. 3. (a) A 5.5 mm-diameter WGM CaF2 disk-shaped micro-resonator fixed on a metallic rod; (b) illustration; and (c) experimental setup of symmetrical dual-coupling using two tapered optical fibers coupled to the CaF2 disk.

Figure 3

Fig. 4. Fiber ring resonator.

Figure 4

Fig. 5. FRR model created using ADS.

Figure 5

Fig. 6. Transmission amplitude response of a 20 m-long FRR: (in dashed red) simulated using the ADS open-loop model and (in green) measured using the microwave characterization bench detailed in [12].

Figure 6

Fig. 7. ADS model and transmission response simulation results of a high rejection optical filter based on three compound FRRs with a total length of <1 m.

Figure 7

Fig. 8. Experimental and ADS simulation results of RF amplitude and phase responses of the OEO optical link in an open-loop configuration (laser + modulator + optical resonator + photodiode). Both results fit quantitatively well as they show that the resonance RF amplitude and phase responses are deformed when the laser frequency is stabilized onto one of the edges of the optical resonance.

Figure 8

Fig. 9. Multiple SBS lines generated inside a 20 m-long FRR featuring a QOpt factor of 3.5 × 109.

Figure 9

Fig. 10. Optical power measurements of the laser carrier and of both first and second SBS Stokes waves, at the second and third outputs of the 20 m-long FRR, versus the laser input power.

Figure 10

Fig. 11. Phase noise of OEOs based on a 20 m-long FRR (10.2 GHz) and a CaF2 micro-resonator (12.5 GHz). Measurements were performed using an Agilent E5052 B signal source analyzer.