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Beyond bulk single crystals: A data format for all materials structure–property–processing relationships

Published online by Cambridge University Press:  02 August 2016

Kyle Michel
Affiliation:
Citrine Informatics, USA; kyle@citrine.io
Bryce Meredig
Affiliation:
Citrine Informatics, USA; bryce@citrine.io

Abstract

Methods used in informatics require input data that are in a machine-readable, structured format. Materials data, in particular, can be exceedingly complex, so defining data formats to store any and all materials-related information is a daunting task. In this article, we discuss a hierarchical data structure used for storing materials data called the physical information file (PIF). The PIF is a flexible schema for storing the structure, processing history, and properties of materials, devices, and physical systems. In addition to a general discussion of the schema, we give examples of its use in representing complex materials systems. We also describe open-source tools that have been developed for building and reading files using the PIF schema.

Information

Type
Research Article
Copyright
Copyright © Materials Research Society 2016 
Figure 0

Figure 1. Representation of properties relevant to thermoelectric performance for Li0.0024Ni0.9976O in the physical information file schema. This example shows the resistivity and power factor of the material, both as a function of temperature. In addition, a simple description of the synthesis route is supplied.21

Figure 1

Figure 2. Data about an ionic liquid22 represented in the physical information file schema. This record gives the molar mass of the two constituent molecules as well as the glass-transition temperature, melting temperature, and viscosity of the ionic liquid.

Figure 2

Figure 3. Schematic illustration of hierarchical microstructural data for a material found in a physical part. In this code, blue bolded text labels the systems to improve readability. Blue italicized text holds the place of data shown in the images that surround the figure.29–34 Micrograph [3] is at 400×. Note: S, stress; N, number of cycles.