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Study of activation energy and humidity sensing application of nanostructured Cu-doped ZnO thin films

Published online by Cambridge University Press:  19 September 2016

Suneet Kumar Misra*
Affiliation:
Sensors and Materials Research Laboratory, Department of Physics, University of Lucknow, Lucknow-226007, India
Narendra Kumar Pandey
Affiliation:
Sensors and Materials Research Laboratory, Department of Physics, University of Lucknow, Lucknow-226007, India
*
a) Address all correspondence to this author. e-mail: suneetm31@gmail.com

Abstract

In this paper we have reported analysis on activation energy and humidity sensing studies of Cu-doped ZnO thin films. Thin Films of undoped and Cu-doped ZnO nanomaterials were prepared. Undoped and Cu-doped ZnO thin films annealed at 600 °C showed the best results with sensitivity of 20.63 MΩ/%RH and 39.14 MΩ/%RH respectively in the 15–95% RH range. Low value of activation energy indicated that this sensing element had low operating temperature and could be used at room temperature. Other parameters like response time, recovery time, hysteresis, and aging effects were also studied. The crystallite size for the sensing element of pure ZnO annealed at 600 °C calculated from Scherrer's formula is in the 24–38 nm range. For the sensing element of 7% Cu doped ZnO the range of crystallite size is 25–41 nm. The average grain size as measured from SEM micrograph for 7% Cu doped ZnO and pure ZnO sensing elements were 36 and 42 nm, respectively.

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Articles
Copyright
Copyright © Materials Research Society 2016 
Figure 0

FIG. 1. Arrhenius graph for activation energy for sample CZ-7.

Figure 1

FIG. 2. SEM of sample CZ-0 annealed at 600 °C.

Figure 2

FIG. 3. SEM of sample CZ-7 annealed at 600 °C.

Figure 3

TABLE I. Grain size by SEM (nm).

Figure 4

FIG. 4. XRD of sample CZ-0 annealed at 600 °C.

Figure 5

FIG. 5. XRD of sample CZ-7 annealed at 600 °C.

Figure 6

FIG. 6. Variation of resistance with change in %RH for the sensing elements CZ-1, CZ-3, CZ-5, CZ-7, and CZ-8 annealed at 600 °C for humidification process.

Figure 7

FIG. 7. Variation of resistance with change in %RH for the sensing elements CZ-0 annealed at different temperatures for humidification process.

Figure 8

TABLE II. Sensitivity of samples (MΩ/%RH).

Figure 9

TABLE III. Sensitivity of samples of undoped ZnO.

Figure 10

FIG. 8. Variation of sensitivity with temperature for the sensing elements CZ-7 annealed at different temperatures for humidification process.

Figure 11

FIG. 9. Variation of sensitivity with temperature for the sensing elements CZ-0 annealed at different temperatures for humidification process.

Figure 12

FIG. 10. Variation of sensitivity with %doping for the Cu-doped ZnO sensing elements annealed at 600 °C for humidification process.

Figure 13

FIG. 11. Time response graph for response time.

Figure 14

FIG. 12. Time response graph for recovery time.