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Investigation of the crystal structure, lattice vibration and dielectric property of SrZrO3 ceramic

Published online by Cambridge University Press:  03 October 2016

Feng Shi*
Affiliation:
School of Material Science & Engineering, Shandong University of Science and Technology, Qingdao 266590, People's Republic of China
Kuo Liang
Affiliation:
School of Material Science & Engineering, Shandong University of Science and Technology, Qingdao 266590, People's Republic of China
Ze-Ming Qi
Affiliation:
National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029, People's Republic of China
*
a) Address all correspondence to this author. e-mail: sf751106@sina.com.cn

Abstract

SrZrO3 ceramic with perovskite-type structure was synthesized by a conventional solid-state reaction method at 1500 °C for 3 h. The crystal structures were studied by x-ray diffraction (XRD), and lattice vibrational modes were obtained by Raman and Fourier transform far-infrared (FTIR) reflection spectroscopy. The dielectric properties of the samples were also measured. According to XRD data, the SrZrO3 ceramic displayed the orthorhombic structure Pbnm (62). The Raman spectrum with ten active vibrators can be fitted by the Lorentzian function, and the vibrators were assigned. Far-infrared spectrum with six infrared active modes was fitted by the four-parameter semiquantum models. Consequently, the modes were assigned as F1u (1) (102 cm−1), F2u (2) (120 cm−1), F1u (3) (140 cm−1), F3u (4)′ (228 cm−1), F3u (4)″ (287 cm−1), F1u (5) (326 cm−1), and F1u (6) (527 cm−1). The infrared mode F1u (1), that can be represented as the Sr–ZrO6 inverted translational vibration, has the highest contribution to the dielectric properties (permittivity and dielectric loss). The calculated data agree well with the measured values.

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Copyright © Materials Research Society 2016 
Figure 0

FIG. 1. XRD pattern for the SZ ceramic sintered at 1500 °C for 3 h and the unit cell of SZ.

Figure 1

FIG. 2. Observed (cycles) and calculated (line) XRD patterns as well as the difference profile (line below the pattern) for the Rietveld structure analysis of the SZ sample.

Figure 2

TABLE I. Crystallographic data of SrZrO3 derived from the Rietveld refinement of XRD data.

Figure 3

FIG. 3. Raman spectrum of the SZ samples in the range of 100–600 cm−1.

Figure 4

TABLE II. Phonon mode parameters from Raman data of SrZrO3.

Figure 5

FIG. 4. Fourier transform far-infrared reflectivity between 30 and 700 cm−1 for the SZ ceramic and fitting results for the FTIR reflection spectrum of SZ by using the four-parameter model.

Figure 6

TABLE III. Parameters of the IR-active modes based on the four-parameter model.

Figure 7

FIG. 5. Imaginary part of dielectric constants ε″(ω) calculated from K–K analysis for the SZ ceramic in the far-IR region (30–700 cm−1).

Figure 8

FIG. 6. Real part of dielectric constants ε′(ω) calculated from K–K analysis for the SZ ceramic in the far-IR region (30–700 cm−1).