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Characterization of instability mechanisms on sharp and blunt slender cones at Mach 6

Published online by Cambridge University Press:  17 February 2022

Richard E. Kennedy*
Affiliation:
BAE Systems Inc., Durham, NC 27703, USA
Joseph S. Jewell
Affiliation:
School of Aeronautics and Astronautics, Purdue University, West Lafayette, IN 47907, USA
Pedro Paredes
Affiliation:
National Institute of Aerospace, Hampton, VA 23666, USA
Stuart J. Laurence
Affiliation:
Department of Aerospace Engineering, University of Maryland, College Park, MD 20742, USA
*
†Email address for correspondence: rkenn@umd.edu

Abstract

Experiments are performed to investigate the effect of nose-tip bluntness on the instability mechanisms leading to boundary-layer transition on a $7^{\circ }$ half-angle cone in a Mach-6 free stream. The development of disturbances is characterized using a combination of high-speed calibrated schlieren images and pressure measurements, and the data are compared with results computed using the parabolized stability equations. The approximately 414 mm long cone model is equipped with an interchangeable nose tip ranging from sharp to 5.08 mm in radius. For nose tips with a radius $R_{N}<2.54\ {\rm mm}$, second-mode instability waves are the dominant mechanism leading to transition. Time-averaged frequency spectra computed from the calibrated schlieren visualizations and pressure measurements are used to compute the second-mode most-amplified frequencies and integrated amplification rates ($N$ factors). Good agreement is observed between the measurements and computations in the linear-growth regime for the sharp-nose configuration at each free-stream condition. Additionally, a bispectral analysis identifies quadratic phase locking of frequency content responsible for the growth of higher harmonics. For nose tips of $R_{N}\geqslant 2.54\ {\rm mm}$, the schlieren visualization region is upstream of the entropy-layer swallowing length, and second-mode waves are no longer visible within the boundary layer; instead, elongated, steeply inclined features believed to be associated with non-modal instability mechanisms develop between the entropy-layer and boundary-layer edges. Simultaneously acquired surface pressure measurements reveal high-frequency pressure oscillations similar to second-mode instability waves associated with the trailing edge of these non-modal features.

Information

Type
JFM Papers
Copyright
© The Author(s), 2022. Published by Cambridge University Press
Figure 0

Table 1.Tunnel free-stream conditions.

Figure 1

Figure 1.Schematic showing instrumentation layout on cone model with sharp-nose configuration. The red dots indicate the PCB sensor locations.

Figure 2

Table 2.Cone model and camera parameters used for each experiment. The entropy-layer swallowing distance, $X_{SW}$, and edge Mach number, $M_{e}$, are computed as described in § 2.4; the latter is calculated at the centre of the visualization region.

Figure 3

Figure 2.Enhanced schlieren visualization generated by subtracting a mean flow-on image from the image of interest for the sharp nose-tip-radius configuration experiment S1.

Figure 4

Figure 3.Spectra computed using reconstructed time signals from schlieren visualizations from experiment S3 at three different streamwise locations.

Figure 5

Figure 4.Most-amplified second-mode frequencies. (a) Experimental results for S1, S2, S3 shown with LPSE results. (b) Experimental results for S3 shown with LPSE results and NPSE results computed for disturbances with different streamwise velocity initial amplitudes. The data correspond to: (-$\bigcirc$-), S1; (-$\Diamond$-), S2; (-$\Box$-), S3; (–), LPSE; (- $\cdot$), NPSE, $\tilde {u}_{0}=5\times 10^{-4}$; (- -), NPSE, $\tilde {u}_{0}=1\times 10^{-3}$. Filled symbols are schlieren measurements, while open symbols are PCB measurements.

Figure 6

Figure 5.Integrated amplification rates. (a) Experimental results for S1, S2, S3 shown with LPSE results. (b) Experimental results for S3 shown with LPSE results and NPSE results computed for disturbances with different streamwise velocity initial amplitudes. The data correspond to: (-$\bigcirc$-), S1; (-$\Diamond$-), S2; (-$\Box$-), S3; (–), LPSE; (- $\cdot$), NPSE, $\tilde {u}_{0}=5\times 10^{-4}$; (- -), NPSE, $\tilde {u}_{0}=1\times 10^{-3}$. Filled symbols are schlieren measurements, while open symbols are PCB measurements.

Figure 7

Figure 6.Plots of $N$ factors computed as a function of frequency and stability Reynolds number: (a) experiment S2, (b) experiment S3. The black diamonds and the dashed lines represent PCB-derived and LPSE-derived most-amplified second-mode frequencies, respectively.

Figure 8

Figure 7.Bicoherence values computed from the schlieren time-reconstructed signals from experiment S3: (a) $R=1484$, (b) $R=1550$.

Figure 9

Figure 8.Enhanced schlieren visualizations showing the evolution of a single second-mode wavepacket from experiment S3. The first image is recorded at time $t_{0}$, with subsequent images at $t_{0}+21.3\ \mathrm {\mu }{\rm s}$, $t_{0}+42.6\ \mathrm {\mu } {\rm s}$ and $t_{0}+115.0\ \mathrm {\mu } {\rm s}$. The markers show the approximate extent of the wavepacket in the first image and have been translated downstream in the subsequent images according to the mean propagation speed.

Figure 10

Figure 9.Synthetic schlieren image computed using NPSE at the same free-stream conditions as experiment S3.

Figure 11

Figure 10.Wall-normal power spectral densities at times: (a) $t_{0}$, $R=1484$; (b) $t_{0}+21.3\ \mathrm {\mu } {\rm s}$, $R=1532$; (c) $t_{0}+42.6\ \mathrm {\mu } {\rm s}$, $R=1578$. (d) Structure angles of the wave fundamental frequency content at different points of development: (-$\Box$-) $t_{0}$; (-$\bigcirc$-) $t_{0}+21.3\ \mathrm {\mu } {\rm s}$; (-$\Diamond$-) $t_{0}+42.6\ \mathrm {\mu } {\rm s}$.

Figure 12

Figure 11.Enhanced schlieren visualizations generated by subtracting a mean flow-on image from the image of interest. Images correspond to nose-tip-radius configurations of (a) 0.508 mm, (b) 1.524 mm.

Figure 13

Figure 12.(a,c) Experiment B1. (b,d) Experiment B2. (a,b) Most-amplified second-mode frequencies. (c,d) Plots of $N$ factors. Filled symbols are schlieren measurements; open symbols are PCB measurements; lines are LPSE results.

Figure 14

Figure 13.Enhanced schlieren visualization generated by subtracting a mean flow-on image from the image of interest for the 2.540 mm nose-tip-radius configuration.

Figure 15

Figure 14.Short-time Fourier transforms computed from PCB signals at (a) $s=241\ {\rm mm}$, (b) $s=341\ {\rm mm}$ for experiment B4.

Figure 16

Figure 15.Mean spectra computed from PCB signals for (a) experiment B4, (b) experiment B5.

Figure 17

Figure 16.Enhanced visualization sequence from experiment B4 ($R_{N}=5.08\ {\rm mm}$). The top image corresponds to time $t_{0}$ with subsequent images separated by $21.3\ \mathrm {\mu } {\rm s}$ (i.e.  every fifth image shown). Black arrows indicate the streamwise locations of the three most downstream PCB sensors ($s=291$mm, $s=316\ {\rm mm}$ and $s=341\ {\rm mm}$). The black horizontal line in the final image indicates the computed boundary-layer thickness.

Figure 18

Figure 17.Enhanced visualization sequence from experiment B5 ($R_{N}=5.08\ {\rm mm}$). The top image corresponds to time $t_{0}$ with subsequent images separated by $21.3\ \mathrm {\mu } {\rm s}$ (i.e.  every fifth image shown). Black arrows indicate the streamwise locations of the three most downstream PCB sensors ($s=291$, $s=316$ and $s=341\ {\rm mm}$). The black horizontal line in the final image indicates the computed boundary-layer thickness.

Figure 19

Figure 18.Profile of maximum pixel intensity extracted for the feature shown in images (i)–(l) of figure 16.

Figure 20

Figure 19.Characteristics of the optimal perturbation used as the inflow condition for the NPSE calculations. (a) Outflow location ($s_1$) for maximum energy gain disturbance frequency; (b) $N$ factor computed using the Mack energy norm versus disturbance frequency. The circle indicates the maximum $N_{E}$.

Figure 21

Figure 20.Synthetic schlieren computed for the same free-stream conditions as experiment B5. The white horizontal line indicates the computed boundary-layer thickness.

Figure 22

Figure 21.Plots of PCB pressure traces at different streamwise locations: (a) experiment B4, (b) experiment B5. The traces are vertically offset according to the measurement coordinate.

Figure 23

Figure 22.Plots of PCB pressure traces at different spanwise locations: (a) experiment B4, (b) experiment B5. The traces are vertically offset according to the measurement coordinate.